IL249468B

Inspection apparatus, inspection method and device manufacturing method

Abstract

This record has no abstract on file.

Term

No projected expiry on record.

  1. Priority
  2. Filed
  3. Published
  4. Today

14 members in 7 offices

This recordMember, by publication datePriority claim

Priority claims9

Priority claims
DocumentOfficeKindDate
14176391European Patent Office (EPO)A
14176391European Patent Office (EPO)A
141763912European Patent Office (EPO)–
2015063828European Patent Office (EPO)W
2015063828European Patent Office (EPO)W
141763912–––
EP20140176391–––
PCTEP2015063828–––
WO2015EP63828–––

Members14

Family members, oldest first
DocumentOfficeKind
US2016011523A1United States of AmericaA1
WO2016005167A1World Intellectual Property Organization (WIPO)A1
TW201606450ATaiwan Province of ChinaA
NL2014994ANetherlands (Kingdom of the)A
KR20170016006ARepublic of KoreaA
IL249468A0IsraelA0
IL249468D0IsraelD0
TWI572992BTaiwan Province of ChinaB
CN106662824AChinaA
US9753379B2United States of AmericaB2
CN106662824BChinaB
KR101948912B1Republic of KoreaB1
IL249468AIsraelA
IL249468BThis recordIsraelB