IL214938A0

Wavefront analysis inspection apparatus and method

Abstract

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9 members in 4 offices

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Priority claims
DocumentOfficeKindDate
20249609United States of AmericaP
29216810United States of AmericaP
2010000177IsraelW

Members9

Family members, oldest first
DocumentOfficeKind
WO2010100644A1World Intellectual Property Organization (WIPO)A1
IL214938A0This recordIsraelA0
US2011311132A1United States of AmericaA1
EP2403396A1European Patent Office (EPO)A1
EP2403396A4European Patent Office (EPO)A4
US8928892B2United States of AmericaB2
US2015177071A1United States of AmericaA1
IL214938AIsraelA
EP2403396B1European Patent Office (EPO)B1