Nova Patents
IL201475A0

Probe for testing semiconductor devices

Abstract

This record has no abstract on file.

Term

No projected expiry on record.

  1. Priority
  2. Filed
  3. Published
  4. Today

26 members in 7 offices

This recordMember, by publication datePriority claim

Priority claims2

Priority claims
DocumentOfficeKindDate
73443407United States of AmericaA
2008055835United States of AmericaW

Members26

Family members, oldest first
DocumentOfficeKind
US2007024298A1United States of AmericaA1
WO2007015713A1World Intellectual Property Organization (WIPO)A1
TW200707461ATaiwan Province of ChinaA
EP1910849A1European Patent Office (EPO)A1
KR20080034977ARepublic of KoreaA
US7362119B2United States of AmericaB2
US2008106289A1United States of AmericaA1
US2008252310A1United States of AmericaA1
US2008252328A1United States of AmericaA1
WO2008127801A2World Intellectual Property Organization (WIPO)A2
TW200844451ATaiwan Province of ChinaA
WO2008127801A3World Intellectual Property Organization (WIPO)A3
JP2009503540AJapanA
US7589542B2United States of AmericaB2
KR20090121410ARepublic of KoreaA
US7724010B2United States of AmericaB2
IL201475A0This recordIsraelA0
JP2010524000AJapanA
US7772859B2United States of AmericaB2
KR100975143B1Republic of KoreaB1
US2012032697A1United States of AmericaA1
KR101161551B1Republic of KoreaB1
US8344748B2United States of AmericaB2
IL201475AIsraelA
TWI417553BTaiwan Province of ChinaB
TWI426272BTaiwan Province of ChinaB