Nova Patents
IL190826A0

A probe for testing electrical properties of a test sample

Abstract

This record has no abstract on file.

Term

No projected expiry on record.

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16 members in 7 offices

This recordMember, by publication datePriority claim

Priority claims2

Priority claims
DocumentOfficeKindDate
05388093European Patent Office (EPO)A
2006000603DenmarkW

Members16

Family members, oldest first
DocumentOfficeKind
EP1780550A1European Patent Office (EPO)A1
WO2007051471A1World Intellectual Property Organization (WIPO)A1
KR20080065630ARepublic of KoreaA
EP1946124A1European Patent Office (EPO)A1
CN101300496AChinaA
IL190826A0This recordIsraelA0
JP2009513986AJapanA
US2009219047A1United States of AmericaA1
EP2293086A1European Patent Office (EPO)A1
EP2293086A8European Patent Office (EPO)A8
CN101300496BChinaB
US8310258B2United States of AmericaB2
KR101291401B1Republic of KoreaB1
JP5249769B2JapanB2
IL190826AIsraelA
EP2293086B1European Patent Office (EPO)B1