Apparatus and method for identifying a faulted phase in a shunt capacitor bank

Apparatus and method for identifying the location of a fault in a bank of shunt capacitors. An apparatus and method for identifying the location of a fault in a bank of shunt capacitors is disclosed. The apparatus includes a sampling circuit for sampling current or voltage signals associated with the shunt capacitor bank. A microcontroller is coupled to the sampling circuit and programmed to measure an offset neutral point phase angle of the sampled signal, and compare the offset neutral point phase angle to a fixed reference phase angle. The procedure includes sampling a current or voltage signal associated with the shunt capacitor bank, determining a compensated neutral point phase angle, and comparing the compensated neutral point phase angle with a phase angle of fixed reference.