EP2736211A2

Measurement of IQ imbalance in a vector modulator

Abstract

Described are methods of determining imbalance in an IQ modulator. Example methods include applying a set of at least three test signals to the I channel and Q channel to generate an output, then receiving output from a frequency measuring device coupled to the IQ modulator. Some of the set of test signals may be substantially different than other test signals in the set. After the frequency specific output is received, the method measures one or more values and derives the imbalance in the IQ modulator from the measured values. Embodiments also include adjusting parameters of the test signals until a minimum distance is measured. A device is also described, which includes a test signal generator, an output analyzer, and a minimizer structured to cause the test signal generator to generate a set of test signals that cause a distance measured in the output to be a minimum distance.

EP2736211A2, drawing sheet 1
Sheet 1 of 54

Term

7.2 yearsto projected expiry

Projected expiry 21 November 2033, counted from filing; an application has no term until it is granted.

  1. Priority
  2. Filed
  3. Published
  4. Today
  5. Projected expiry

12 claims: 2 independent, 10 dependent

  1. 1
    A method of determining imbalance in an IQ modulator having an I channel and a Q channel, the method comprising:applying a set of at least three test signals to the I channel and Q channel of the IQ modulator to generate an output of the IQ modulator, wherein at least one of the set of test signals is substantially different than other test signals in the set;receiving frequency specific output from a frequency measuring device coupled to the output of the IQ modulator;measuring one or more values of the frequency specific output;and deriving the imbalance in the IQ modulator from the measured values.
  2. 9
    A device structured to determine imbalance of an IQ modulator having an I channel and a Q channel, the device comprising:a test signal generator structured to generate a set of test signals for the IQ modulator;an output analyzer structured to receive a frequency specific output of the test signals from a measurement device coupled to an output of the IQ modulator;and a minimizer structured to cause the test signal generator to generate a set of test signals that cause a distance measured from the frequency specific output to be a minimum distance.