Nova Patents
EP2575012A2

Predictive touch surface scanning

Abstract

A method for locating a conductive object at a touch-sensing surface may include detecting a first resolved location for the conductive object at the touch-sensing surface based on a first scan of the touch-sensing surface, predicting a location for the conductive object, and determining a second resolved location for the conductive object by performing a second scan of a subset of sensor elements of the touch-sensing surface, wherein the subset of sensor elements is selected based on the predicted location of the conductive object.

EP2575012A2, drawing sheet 1
Sheet 1 of 9

Term

Projected expiry 28 September 2032.

  1. Priority
  2. Filed
  3. Published
  4. Today
  5. Projected expiry

15 claims: 3 independent, 12 dependent

  1. 1
    A method, comprising:based on a first scan of a touch-sensing surface, determining a first resolved location for a conductive object proximate to the touch-sensing surface;predicting a location for the conductive object;and determining a second resolved location for the conductive object by performing a second scan of a subset of sensor elements of the touch-sensing surface, wherein the subset of sensor elements is selected based on the predicted location of the conductive object.
  2. 6
    A method, comprising:determining a location of a conductive object proximate to a touch-sensing surface based on a first scan of the touch-sensing surface;calculating a search window of predicted locations of the conductive object based on a time duration between the first scan and a second scan;and performing the second scan, wherein the second scan includes intersections of sensor elements, wherein the intersections are within the search window.
  3. 13
    A touch-sensing system comprising:a capacitive sensor array comprising a plurality of sensor elements;a capacitance sensor configured to measure capacitance for each of a plurality of intersections between individual sensor elements of the plurality of sensor elements;and processing logic configured to determine a resolved location of a conductive object based on scanning a subset of intersections within a search window, wherein the search window defines an area around a predicted location of the conductive object.