Nova Patents
EP2268587A2

Method for thin layer deposition

Abstract

The invention relates to a method for obtaining a material including a substrate and at least one thin layer that contains an at least partially crystallised titanium oxide and is deposited on a first surface of said substrate, wherein said method comprises the following steps: depositing said at least one thin layer containing titanium oxide; subjecting said at least one thin layer containing titanium oxide to a crystallisation process by supplying a power capable of heating each point of said at least one thin layer containing titanium oxide to a temperature of at least 300°C while maintaining a temperature lower than or equal to 150°C at any point of the surface of said substrate opposite said first surface, wherein said crystallisation process is preceded by the step of depositing, on and/or under said thin layer containing titanium oxide, a power-providing layer capable of absorbing the energy supplied during said crystallisation process more efficiently than said at least one thin layer containing titanium oxide, and/or capable of generating an additional power during said crystallisation process and of transmitting at least a portion of said energy to said at least one thin layer containing titanium oxide during said crystallisation process.

EP2268587A2, drawing sheet 1
Sheet 1 of 1

Term

2.5 yearsto projected expiry

Projected expiry 10 April 2029, counted from filing; an application has no term until it is granted.

  1. Priority
  2. Filed
  3. Published
  4. Today
  5. Projected expiry

23 claims: 17 independent, 6 dependent

  1. 1
    Claims of equivalent WO 2009136110 A2 CLAIMS 1. A process for obtaining a material comprising a substrate and at least one thin layer based on titanium oxide at least partially crystallized and deposited on a first face of said substrate, said process comprising the following steps:depositing said at least one thin layer based on titanium oxide, said at least one titanium oxide-based thin film is subjected to a crystallization treatment by providing an energy capable of carrying each point of said at least one titanium oxide-based thin film at a temperature of from less than 300 0 C while maintaining a temperature less than or equal to 150 0 C at any point on the face of said substrate opposite to said first face, said crystallization treatment being preceded by a deposition step, above and / or below said titanium oxide thin film, a layer of energy supply, capable of absorbing the energy provided during said crystallization treatment more efficiently than said at least one layer of titanium oxide and / or of creating additional energy during said crystallization treatment, and transmitting at least a portion of said energy to said at least one titanium oxide thin film during said crystallization process.
  2. 3
    Method according to one of the preceding claims, wherein the energy-providing layer is deposited on top of the titanium oxide thin film.
  3. 4
    Process according to one of the preceding claims, such that a temperature of less than or equal to 100 ° C is maintained, in particular 50 0 C, at any point on the face of the substrate opposite to the face on which the thin layer is deposited.
  4. 5
    Method according to one of the preceding claims, such that each point of the thin layer is heated to a temperature greater than or equal to 300 0 C for a duration less than or equal to 1 second, or even 0.5 seconds.
  5. 6
    Process according to one of the preceding claims, such that the crystallization rate obtained is greater than or equal to 10% or even 20%, and especially 50%.
  6. 7
    Method according to one of the preceding claims, such that the substrate has at least one dimension greater than or equal to 1 m, or even 2 m.
  7. 8
    Method according to one of the preceding claims, such that the titanium oxide thin film is made of titanium oxide, optionally doped with a metal ion.
  8. 9
    Method according to one of the preceding claims, such that the titanium oxide thin film and the energy-providing layer are deposited by sputtering.
  9. 10
    Method according to one of the preceding claims, wherein the energy-providing layer is deposited in direct contact with the titanium oxide-based layer.
  10. 11
    Method according to one of the preceding claims, wherein the energy-providing layer has an absorption in a wavelength range between 800 and 1100 nm.
  11. 12
    Method according to one of the preceding claims, such that the energy-providing layer is capable of emitting energy by exothermic reaction, in particular combustion or oxidation, during the crystallization treatment.
  12. 13
    Method according to one of the preceding claims, such that the energy-providing layer is capable of evaporating at least partially, or totally, during the crystallization treatment.
  13. 14
    Method according to one of the preceding claims, such that the energy-providing layer is able to oxidize at least partially, or totally, during the crystallization treatment, and to become at least partially transparent in the visible range.
  14. 15
    Method according to one of the preceding claims, such that the energy-providing layer is made of titanium metal.
  15. 16
    Process according to one of Claims 1 to 12, such that the energy-providing layer is made of carbon, in particular of the graphite or diamond type.
  16. 17
    Method according to one of claims 1 to 14, such that the energy-providing layer is made of silicon, optionally alloyed with aluminum.
  17. 18
    Method according to one of claims 1 to 14, such that the energy-providing layer is made of titanium carbide or silicon carbide.
  18. 19
    Process according to one of the preceding claims, such that the crystallization treatment is carried out using infrared radiation.
  19. 20
    Method according to the preceding claim, such that at least a portion of the infrared radiation is in the wavelength range of 900 to 1100 nm.
  20. 21
    Process according to one of Claims 1 to 18, such that the crystallization treatment is carried out by thermal spraying techniques, in particular by a plasma torch projection technique.
  21. 22
    Method according to one of claims 1 to 18, such that the crystallization treatment is carried out by subjecting said thin layer to the action of at least one flame.
  22. 23
    Process according to one of the preceding claims, in which a thin layer based on titanium oxide at least partially crystallized in anatase form is obtained.
Independent claims22