EP2245740A2

Layout method for soft-error hard electronics, and radiation hardened logic cell

Abstract

This record has no abstract on file.

EP2245740A2, drawing sheet 1
Sheet 1 of 1

Term

2.3 yearsto projected expiry

Projected expiry 15 January 2029, counted from filing; an application has no term until it is granted.

  1. Priority
  2. Filed
  3. Published
  4. Today
  5. Projected expiry

1 sheet

  1. Sheet 1