EP1933293A4

Tft substrate and method for manufacturing tft substrate

Abstract

This record has no abstract on file.

EP1933293A4, drawing sheet 1 — Sheet 1 of 69

Term

Projected expiry 2 October 2026.

69 sheets

Every citation, both ways

Citations
Document	Relation	Office	Cited during
US2004197964A1	Cites	United States of America	Search report
US2005173734A1	Cites	United States of America	Search report
WAGER J F ET AL: "Transparent electronics and prospects for transparent displays", PROCEEDINGS OF THE SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, SPIE, US, vol. 5080, no. 1, 1 January 2004 (2004-01-01), pages 330 - 339, XP002377408, ISSN: 0277-786X	Non-patent	–	Search report
NOMURA K ET AL: "Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors", NATURE, NATURE PUBLISHING GROUP, LONDON, UK, vol. 432, no. 25, 25 November 2004 (2004-11-25), pages 488 - 492, XP002410190, ISSN: 0028-0836	Non-patent	–	Search report
ZHANG S B ET AL: "INTRINS N-TYPE VERSUS P-TYPE DOPING ASYMMETRY AND THE DEFECT PHYSICS OF ZNO", PHYSICAL REVIEW, B. CONDENSED MATTER, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, vol. 63, no. 7, 15 February 2001 (2001-02-15), pages 75205 - 01, XP001015737, ISSN: 0163-1829	Non-patent	–	Examiner
See also references of WO 2007040194A1	Non-patent	–	Examiner

15 members in 7 offices; this record represents the family

This recordMember, by publication datePriority claim

Priority claims13

Priority claims
Document	Office	Kind	Date
2005292823	Japan	–	2005-10-05
2005292823	Japan	A	2005-10-05
2005349826	Japan	–	2005-12-02
2005349826	Japan	A	2005-12-02
2005356563	Japan	–	2005-12-09
2005357034	Japan	–	2005-12-09
2005356563	Japan	A	2005-12-09
2005357034	Japan	A	2005-12-09
2005363150	Japan	–	2005-12-16
2005363150	Japan	A	2005-12-16
2006022849	Japan	–	2006-01-31
2006022849	Japan	A	2006-01-31
2006319673	Japan	W	2006-10-02

Members15

Family members, oldest first
Document	Office	Kind
WO2007040194A1	World Intellectual Property Organization (WIPO)	A1	2007-04-12
TW200730985A	Taiwan Province of China	A	2007-08-16
KR20080053489A	Republic of Korea	A	2008-06-13
EP1933293A1	European Patent Office (EPO)	A1	2008-06-18
CN101283388A	China	A	2008-10-08
JPWO2007040194A1	Japan	A1	2009-04-16
EP1933293A4This record	European Patent Office (EPO)	A4	2009-12-23
US2010127253A1	United States of America	A1	2010-05-27
US2010285632A1	United States of America	A1	2010-11-11
CN101283388B	China	B	2011-04-13
US7982215B2	United States of America	B2	2011-07-19
US8030195B2	United States of America	B2	2011-10-04
JP5198066B2	Japan	B2	2013-05-15
KR101268670B1	Republic of Korea	B1	2013-05-29
TWI424239B	Taiwan Province of China	B	2014-01-21

9 legal events, as the office reported them to INPADOC

Over the term

Point at a mark for the event

Events

Legal events, newest first
	Event	Code
2016-10-05	Application deemed to be withdrawnWithdrawn18D	18D
2016-09-02	Information on the status of an ep patent application or granted ep patentGrantedSTATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWNSTAA	STAA
2010-05-26	First examination report despatched17Q	17Q
2009-12-23	Supplementary search report drawn up and despatchedA4	A4
2008-11-19	Request for extension of the european patent (deleted)DAX	DAX
2008-11-19	Designated contracting states (corrected)RBV	RBV
2008-06-18	Request for examination filed17P	17P
2008-06-18	Designated contracting statesAK	AK
2008-05-16	Public reference made under article 153(3) epc to a published international application that has entered the european phaseORIGINAL CODE: 0009012PUAI	PUAI