Microscope with improved resolution
2 claims: 2 independent, 0 dependent
- 1Microscope with increased resolution through partial spatial superposition in the illumination through an excitation beam and a de-excitation beam and/or a switching beam in a fluorescent sample, with a laser for producing an excitation beam path (AN) for illuminating a sample (PR) and with a laser for producing a de-excitation beam path (AB) or a switching beam path for illuminating the sample (PR), with a scanner (SC) and with an objective (0), and also with a detector (DE) for detecting the sample light, with the excitation beam path (AN) and the de-excitation beam path (AB) or switching beam path running via the scanner (SC) and via the objective (O) for scanning sampling of the sample (PR), and a beamsplitter (ST) for splitting the de-excitation beam path (AB) or switching beam path into two partial beam paths and a beam unifier (SV) for superposing the split partial beam paths being arranged in the de-excitation beam path (AB) or switching beam path, characterized in that an extension (DL) of the light path for incoherent superposition of the partial beam paths is arranged in one of the partial beam paths of the de-excitation beam path (AB) or switching beam path and a spiral phase mask (SM) is situated in this partial beam path and a phase mask with a radial phase jump (RM), or a combination (SM/RM) of a phase mask with a radial phase jump and a spiral phase mask, is arranged in the other partial beam path of the de-excitation beam path (AB) or switching beam path and the masks are situated in or in the vicinity of the pupil plane of the objective (O) or there is a pupil optical system (PO) for imaging into the pupil plane of the objective. Microscope à résolution accrue par superposition spatiale partielle dans l'éclairage par un rayon excitant et un rayon désexcitant et/ou par un rayon de commutation dans un échantillon fluorescent, comportant un laser pour générer une trajectoire de rayon excitant (AN) pour l'éclairage de l'échantillon (PR) et un laser pour générer une trajectoire de rayon désexcitant (AB) ou une trajectoire de rayon de commutation pour éclairer l'échantillon (PR), comprenant un scanner (SC) et un objectif (O), ainsi qu'un détecteur (DE) pour la détection de la lumière de l'échantillon, la trajectoire de rayon excitant (AN) et la trajectoire de rayon désexcitant (AB) ou la trajectoire de rayon de commutation passant par le scanner (SC) et l'objectif (O) pour balayer l'échantillon (PR) en le scannant, et un diviseur de rayon (ST) permettant de scinder la trajectoire de rayon désexcitant (AB) ou la trajectoire de rayon de commutation en deux sous-trajectoires de rayon et un réunisseur de rayon (SV) permettant de superposer les sous-trajectoires de rayon scindées étant disposés dans la trajectoire de rayon désexcitant (AB) ou la trajectoire de rayon de commutation, caractérisé en ce que, dans une des sous-trajectoires de rayon de la trajectoire de rayon désexcitant (AB) ou de la trajectoire de rayon de commutation, est disposé un prolongement (DL) de la voie lumineuse permettant la superposition incohérente des sous-trajectoires de rayon et un masque de phase spiralé (SM) se trouve dans cette sous-trajectoire de rayon et, dans l'autre sous-trajectoire de rayon de la trajectoire de rayon désexcitant (AB) ou de la trajectoire de rayon de commutation, est disposé un masque de phase à saut de phase radial (RM) ou une combinaison (SM/RM) d'un masque de phase à saut de phase radial et d'un masque de phase spiralé, et les masques se trouvent dans ou à proximité du plan de la pupille de l'objectif (O) ou une optique de pupille (PO) destinée à la reproduction dans le plan de la pupille de l'objectif est disponible. Mikroskop mit erhöhter Auflösung durch teilweise räumliche Überlagerung in der Beleuchtung durch einen Anregungsstrahl und einen Abregungsstrahl und/oder einen Umschaltstrahl in einer fluoreszierenden Probe, mit einem Laser zur Erzeugung eines Anregungsstrahlengangs (AN) zur Beleuchtung der Probe (PR) und mit einem Laser zur Erzeugung eines Abregungsstrahlengangs (AB) bzw. eines Umschaltstrahlengangs zur Beleuchtung der Probe (PR), mit einem Scanner (SC) und mit einem Objektiv (O), sowie mit einem Detektor (DE) zur Detektion des Probenlichtes, wobei der Anregungsstrahlengang (AN) und der Abregungsstrahlengang (AB) bzw. Umschaltstrahlengang über den Scanner (SC) und über das Objektiv (O) zur scannenden Abtastung der Probe (PR) verläuft, und im Abregungsstrahlengang (AB) bzw. Umschaltstrahlengang ein Strahlteiler (ST) zur Aufspaltung des Abregungsstrahlenganges (AB) bzw. Umschaltstrahlengangs in zwei Teilstrahlengänge und ein Strahlvereiniger (SV) zur Überlagerung der aufgespalteten Teilstrahlengänge angeordnet ist, dadurch gekennzeichnet, dass in einem der Teilstrahlengänge des Abregungsstrahlengang (AB) bzw. Umschaltstrahlengangs zur inkohärenten Überlagerung der Teilstrahlengänge eine Verlängerung (DL) des Lichtwegs angeordnet ist und sich in diesem Teilstrahlengang eine Spiralphasenmaske (SM) befindet und im anderen Teilstrahlengang des Abregungsstrahlengang (AB) bzw. Umschaltstrahlengangs eine Phasenmaske mit radialem Phasensprung (RM), oder eine Kombination (SM/RM) aus einer Phasenmaske mit radialem Phasensprung und einer Spiralphasenmaske angeordnet ist und die Masken in oder in der Nähe der Pupillenebene des Objektivs (O) liegen oder eine Pupillenoptik (PO) zur Abbildung in die Pupillenebene des Objektivs vorhanden ist.
- 2Microscopic method with an improved resolution, using a microscope according to Claim 1, wherein a fluorescent sample is, in chronological succession, illuminated by the excitation beam and the de-excitation beam or switching beam. Mikroskopisches Verfahren mit erhöhter Auflösung unter Verwendung eines Mikroskops nach Anspruch 1, wobei eine fluoreszierende Probe zeitlich nacheinander mit dem Anregungsstrahl und dem Abregungsstrahl oder Umschaltstrahl beleuchtet wird. Procédé microscopique à définition accrue en utilisant un microscope selon la revendication 1, un échantillon fluorescent étant exposé successivement dans le temps au rayon excitant et au rayon désexcitant ou au rayon ultrasonore.
Independent claims2
27 paragraphs, as filed
Methods for increasing the optical resolution in the far field via the diffraction-limited resolution are known, which are based on a nonlinear interaction of light with the sample. This includes microscopy using stimulated emission depletion (STED,<patcit id="pcit0001" dnum="US5731588A"><text>US 5,731,588</text></patcit>), by means of ground state depopulation (<nplcit id="ncit0001" npl-type="s"><text>Ground State Depletion - GSD, Hell and Kroug, Appl. Phys. B 60 (1995), 495-497</text></nplcit>) and the optical modification (switching) of fluorescent substances (<patcit id="pcit0002" dnum="US20040212799A1"><text>US 2004/0212799 A1</text></patcit>).
In both cases, a diffraction-limited excitation distribution is modified by means of a diffraction-limited optical light distribution (de-excitation light) through a nonlinear interaction in such a way that light emission can only take place from a subregion. This sub-region (effective point spread function: PSF) can be restricted in all three spatial directions or only in the lateral direction. Useful restrictions of the PSF are:<ol id="ol0001" compact="compact" ol-style=""><li>1. 3D limitation of the excitation volume</li><li>Second Lateral limitation of the excitation volume with extended depth of field</li></ol>
The state of the art, which is not very efficient with regard to the steepness of the gradients, is due to the use of phase masks in the pupil of the de-excitation light with a radial phase jump (literature: / 1 / <nplcit id="ncit0002" npl-type="s"><text>TA Klar, S. Jakobs, M. Dyba, A. Egner, and SW Hell, Proc. Natl. Acad. Sci. USA 97, 8206 (2000</text></nplcit>)) or by phase masks with quadrant-wise phase jump (literature: / 2 / <nplcit id="ncit0003" npl-type="s"><text>E. Engel et al. Appl. Phys. B 77, 11-17 (2003</text></nplcit>)) given.
The use of spiral masks for STED microscopy was described in Ref. / 3 / <nplcit id="ncit0004" npl-type="s"><text>P. Török and PRT Munro. Opt.Expr. 12 (2004), 3605</text></nplcit> proposed. However, the use of a spiral mask as described in the above literature does not produce an excitation distribution that is restricted in all spatial directions, nor one with an expanded depth of field as described below.
The incoherent superposition of two partial beam paths of the de-excitation light is from the document <nplcit id="ncit0005" npl-type="s"><text>TA Klar et al., Physical Review E, Volume 64, 066613, 2001</text></nplcit> known.
It is an object of the invention to implement methods which allow corresponding distributions to be generated comparatively easily and with high efficiency (given by the steepness of the gradients of the distributions).
This object is solved by the features of the independent claims.
Compared to the generation of distributions through the superposition of many point sources (literature: <patcit id="pcit0003" dnum="US5866911A1"><text>US 5,866,911 A1</text></patcit>) the following solutions are much easier. It also enables a much more efficient 3D constraint.
The following realizations take place according to the invention:
<ol id="ol0002" compact="compact" ol-style=""><li>1. Excitation: conventional PSF de-excitation: incoherent superposition of a distribution with a spiral phase in the pupil with one with a radial phase in the pupil</li><li>Second Suggestion: incoherent overlay of conventional PSF with a radial phase in pupil de-excitation: incoherent overlay of a distribution with spiral phase in pupil and one with spiral phase + radial phase</li></ol>
<figref idref="f0001">Figure 3</figref> shows a radial mask (a), a spiral mask (b) and a combination of radial and spiral mask (c), the combination being conceivable as a series of a) and b) or as a finished gray value design. Here phase values are gray-value coded (white = 0, black = 2π):<maths id="math0001" num=""><math display="block"><mi>R</mi><mfenced><mi>r</mi></mfenced><mo>=</mo><mi>exp</mi><mfenced separators=""><mo>−</mo><mi mathvariant="italic">jπ</mi></mfenced><mspace width="1ex" /><mi>for</mi><mspace width="1ex" /><mi>r</mi><mo><</mo><mi>a</mi><mo>/</mo><msqrt><mn>2</mn></msqrt></math><img file="EP1862839B2_D0001.tif" /></maths><maths id="math0002" num=""><math display="block"><mi>S</mi><mfenced><mi>φ</mi></mfenced><mo>=</mo><mi>exp</mi><mfenced separators=""><mo>−</mo><mi mathvariant="italic">jφ</mi></mfenced></math><img file="EP1862839B2_D0002.tif" /></maths><maths id="math0003" num=""><math display="block"><mi mathvariant="italic">SR</mi><mfenced><mi>r</mi><mi>φ</mi></mfenced><mo>=</mo><mi>R</mi><mfenced><mi>r</mi></mfenced><mo>+</mo><mi>S</mi><mfenced><mi>φ</mi></mfenced></math><img file="EP1862839B2_D0003.tif" /></maths>With <i>r</i>, Radial coordinate and φ: angular coordinate in the pupil (α: pupil radius)
The following arrangements distinguish between excitation and de-excitation beams and refer to STED using short pulses as an example. In this case, the excitation takes place first and then with a time delay the de-excitation by stimulated emission, as is known from the prior art. The remaining excited molecules relax with the emission of fluorescence, which is detected.
These arrangements can also be used for other high-resolution processes such as a) ground-state depletion (lit .: <nplcit id="ncit0006" npl-type="s"><text>SW Hell and M. Kroug, Appl. Phys. B 60 (1995) 495</text></nplcit>) or b) the switching of dyes (<patcit id="pcit0004" dnum="US20040212799A1"><text>US2004 / 0212799 A1</text></patcit>) use. In a), dye is first brought into the triplet state by repeated excitation, for which purpose the de-excitation beam is used. The portion of the dye remaining in the basic state is then excited by the excitation beam and the fluorescence is detected. In b) molecules are switched by the de-excitation beam and thereby put into a non-fluorescent state. The molecules are then excited with the excitation beam, the molecules remaining in the fluorescent state being able to emit fluorescence which is detected. In both cases, the use of pulsed light (as with STED) for the excitation and de-excitation beam is not necessary.
Description of Figures 1 and 2:
The reference symbols mean for both figures:<dl id="dl0001" compact="compact"><dt>ON:</dt><dd>Excitation beam path</dd><dt>FROM:</dt><dd>de-excitation beam</dd><dt>DE</dt><dd>detector</dd><dt>SC:</dt><dd>scanner</dd><dt>O:</dt><dd>lens</dd><dt>ST:</dt><dd>beamsplitter</dd><dt>SV:</dt><dd>beam combiner</dd><dt>PO:</dt><dd>pupil optics</dd><dt>DL:</dt><dd>Delay to extend the light path</dd><dt>SM:</dt><dd>spiral mask</dd><dt>RM:</dt><dd>radial mask</dd><dt>PR:</dt><dd>sample</dd></dl>
In <figref idref="f0004">Fig. 1</figref> there is an excitation AN by means of a conventional PSF, for example a point scanner, via the PO, SC and O in the direction PR. The de-excitation beam path AB is split into two beams by means of a beam splitter ST. One beam path with delay DL (where the length of the extension, possibly over optical fibers, is above the coherence length of the lasers used) contains SM, the other contains RM, the delay ensuring an incoherent superposition of both partial beams behind SV. The masks are imaged in or near a lens pupil via the optics PO.
In <figref idref="f0004">Fig. 2</figref> there is a similar de-excitation beam path AB as in <figref idref="f0004">Fig. 1</figref> before, where RM is replaced by the combination mask RM / SM. The excitation beam path AN is also divided into two beam paths by means of ST2. In the partial beam path with DL there is a radial mask RM, which is imaged in or near the objective pupil. The Delay DL ensures the incoherent superposition of the partial beams behind SV2.
The delay must be greater than the coherence length of the source, which is only sensible to solve with fibers in the case of highly coherent lasers. Another possibility of incoherent superposition is the use of light of slightly different wavelengths (within the excitation spectrum for fluorescence (GSD) / for switching or the emission spectrum (STED)). This is the preferred version especially for cw lasers. For example, Both light at 488 nm and at 477 nm can be used for switching and excitation of the Dronpa protein. Thus, in the de-excitation beam path in arrangement 1, light at 488 nm from the spiral mask and that at 477 nm from the radial mask can be formed and combined using suitable dichroic beam splitters. The same applies to excitation and de-excitation beam paths in arrangement 2. The pupil image must produce a stationary phase distribution in the pupil plane of the lens. Regardless of the type of sample interaction, excitation and de-excitation beams will usually hit the sample one after the other. Either the sample is "prepared" with the excitation beam and then the prepared state is "queried" with the excitation beam (GSD and switching), or the excitation is modified by a delayed de-excitation beam (STED).
This ensures an incoherent superposition of the excitation and detection beam.
Also shown below are sections along the lateral coordinate (horizontal) and the axial coordinate (vertical), the distributions being rotationally symmetrical with respect to the axial (optical) axis
<figref idref="f0001">Fig. 4</figref> shows the resulting distributions in the de-excitation and the implementation according to the first embodiment in <figref idref="f0004">Fig.1</figref>, It can be seen that a three-dimensional limitation of the area in focus (object level PR in <figref idref="f0004">Fig.1</figref>) (in the middle of <figref idref="f0001">4 c)</figref>occurs in which there is no de-excitation radiation.
<figref idref="f0002">Figure 5</figref> shows the resulting distribution during de-excitation according to <figref idref="f0004">Fig.2</figref>It can be seen that in the object plane PR (5c) there occurs an area which is extended in the axial direction and is laterally restricted and in which no de-excitation radiation is present.
<figref idref="f0003">Figure 6</figref> shows the distribution of the excitation in <figref idref="f0004">Fig.2</figref>You can see that in <figref idref="f0003">Fig. 6c</figref>) in the object level PR compared to the normal PSF (<figref idref="f0003">Fig. 6b</figref>) elongated excitation light distribution arises.
simulation results
The one used for switching off <i>PSF<sub>s</sub></i> (in Eq. (1) assumed to be normalized to 1) leads to a reduction in the excitability (or excitation) of the dye accordingly <maths id="math0004" num="(1)"><math display="block"><mi>A</mi><mfenced><mi>x</mi><mi>y</mi><mi>z</mi></mfenced><mo>=</mo><mi>exp</mi><mfenced open="{" close="}" separators=""><mo>−</mo><mi>σ</mi><mo>⋅</mo><mi>D</mi><mo>⋅</mo><msub><mi mathvariant="italic">PSF</mi><mi>s</mi></msub><mfenced><mi>x</mi><mi>y</mi><mi>z</mi></mfenced></mfenced></math><img file="EP1862839B2_D0004.tif" /></maths>where σ is the cross section of switching (or de-excitation) and D is the radiation energy per surface. The result of the suggestion with a<i>PSF<sub>a</sub></i> the resulting total PSF is then <maths id="math0005" num="(2)"><math display="block"><mi mathvariant="italic">PSF</mi><mfenced><mi>x</mi><mi>y</mi><mi>z</mi></mfenced><mo>=</mo><mi>A</mi><mfenced><mi>x</mi><mi>y</mi><mi>z</mi></mfenced><mo>⋅</mo><msub><mi mathvariant="italic">PSF</mi><mi>a</mi></msub><mfenced><mi>x</mi><mi>y</mi><mi>z</mi></mfenced></math><img file="EP1862839B2_D0005.tif" /></maths>
Below are xz sections through the PSF for the case of the switchable protein Dronpa (lateral = horizontal, axial = vertical). Switching off with an effective cross-section of 0.07 cm<sup>2</sup>/ mW / s assumed (literature: <nplcit id="ncit0007" npl-type="s"><text>S. Habuchi et al. Proc. Natl. Acad. Sci. USA 102, 9511 (2005</text></nplcit>)). For an irradiation energy of 3 W / cm<sup>2</sup> s (ie 3 mW in 10 µs to 1 µm<sup>2</sup> focused) then result for realization 2 (with the de-excitation accordingly <figref idref="f0002">Fig. 5c</figref>) and the suggestion <figref idref="f0003">Fig. 6c</figref>)) the distribution <figref idref="f0005">Fig. 7a</figref>) and for realization 1 (with the de-excitation accordingly <figref idref="f0001">Fig. 4c</figref>) and the suggestion <figref idref="f0003">Fig. 6b</figref>)) the distribution <figref idref="f0005">Fig. 7b</figref>) compared to conventional PSF (<figref idref="f0005">Fig. 7c</figref>)).
For comparison, the distribution obtained under the same circumstances according to the prior art, namely with a mask with a radial phase shift (<figref idref="f0005">Fig. 8a</figref>)) or with a spiral mask (<figref idref="f0005">Fig. 8b</figref>)) in the de-excitation beam path. It can clearly be seen that in case 8a) an axial, but not an acceptable, lateral limitation of the PSF is obtained. As a result, the resolution is only significantly improved in the axial direction. In case 8b) the same applies with regard to an exclusively lateral improvement of the resolution. In contrast to<figref idref="f0005">Fig. 7a</figref>) there is no application-relevant extension of the depth of field here.
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5 priority claims, no other members on record
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| Request for examination filed17P | 17P | EP | |
| Designated contracting statesAK | AK | EP | |
| Request for extension of the european patentAX | AX | EP | |
| Public reference made under article 153(3) epc to a published international application that has entered the european phaseORIGINAL CODE: 0009012PUAI | PUAI | EP |
Numbers
- Publication
- 1862839
- Publication, DOCDB
- 1862839
- Publication, EPODOC
- EP1862839
- Application
- 70104310
- Application, DOCDB
- 07010431
- Application, EPODOC
- EP20070010431
Titles3
- German
- Mikroskop mit erhöhter Auflösung
- English
- Microscope with improved resolution
- French
- Microscope à résolution améliorée
Classification
- CPC, 2
- G02B21/0056
- G02B21/0076
- IPC, 2
- G02B21 16
- G02B21 00
Designated states32
- Contracting states, 32
- Austria
- Belgium
- Bulgaria
- Switzerland
- Cyprus
- Czechia
- Germany
- Denmark
- Estonia
- Spain
- Finland
- France
- United Kingdom
- Greece
- Hungary
- Ireland
- Iceland
- Italy
- Liechtenstein
- Lithuania
- Luxembourg
- Latvia
- Monaco
- Malta
and 8 moreShow fewer
- Netherlands (Kingdom of the)
- Poland
- Portugal
- Romania
- Sweden
- Slovenia
- Slovakia
- Türkiye
