Nova Patents
EP1631222B1

Thermal stimulation probe and method

Abstract

A physiological thermal stimulation probe, comprising: (a) an electrically controlled heat control element with a relatively low thermal capacity and adapted for contact with tissue on one side thereof; (b) a thermal sink/source with a relatively high effective thermal capacity and a relatively low thermal impedance, such that said thermal sink/source sink can rapidly change a temperature of said heat control element, at a rate above 10 degrees Celsius per second, from a temperature of below 100 degrees Celsius; and (c) circuitry which activates said heat control element to achieve a desired temperature stimulation profile of said tissue.

EP1631222B1, drawing sheet 1
Sheet 1 of 7

Term

Term ended

Expired 20 May 2024, 2.3 years ago.

  1. Priority
  2. Filed
  3. Granted
  4. Expired
  5. Today

44 claims: 27 independent, 17 dependent

  1. 1
    A physiological thermal stimulation probe (100), comprising:(a) an electrically controlled heat control element (102) including a part having a relatively low thermal capacity and adapted for contact with tissue on one side thereof and;(b) circuitry (202, 204) which activates said heat control element to achieve a desired temperature stimulation profile of said tissue, and (c) a thermal sink/source (104) with a relatively high effective thermal capacity and a relatively low thermal impedance, characterized in that said thermal sink/source is thermally coupled to said side adapted for contact with tissue and said thermal sink/source having a thermal capacity of at least four times a thermal capacity of said part of said electrically controlled heat control element;and said coupling of said thermal sink/source to said side adapted for contact with tissue is sufficient so that heat flow between the control element and the sink/source can change a temperature of said side adapted for contact with tissue at a rate above 10 degrees Celsius per second.
  2. 11
    A probe (100) according to any of claims 3-10, comprising at least one heating element temperature sensor (112) in association with said heating element (102), wherein said circuitry (202, 204) applies closed loop feedback to control a temperature of said heating element using said heating element temperature sensor to control an activation of said heating element.
  3. 14
    A probe (100) according to any of claims 3-13, wherein said circuitry (202, 204) controls said probe to provide a pulse of heat.
  4. 15
    A probe (100) according to any of claims 3-14, wherein said circuitry (202, 204) controls said probe to provide a pulse of cold.
  5. 16
    A probe (100) according to any of claims 3-15, wherein said circuitry (202, 204) controls said probe to selectively stimulate A-delta fibers.
  6. 17
    A probe (100) according to any of claims 3-16, wherein said circuitry controls said probe to selectively stimulate a subgroup of A-delta fibers.
  7. 20
    A probe (100) according to any of claims 3-19, wherein said circuitry (202, 204) controls said probe to selectively stimulate C fibers.
  8. 21
    A probe (100) according to any of claims 3-19, wherein said circuitry (202, 204) controls said probe to generate a windup effect.
  9. 22
    A probe (100) according to any of claims 3-19, wherein said circuitry (202, 204) controls said probe to provide a second pain effect.
  10. 23
    A probe (100) according to any of claims 3-22, wherein said circuitry (202, 204) controls said probe to have a temperate raise rate of over 30 degrees Celsius per second.
  11. 24
    A probe (100) according to any of claims 3-23, wherein said circuitry (202, 204) controls said probe to have a temperate decrease rate of over 30 degrees Celsius per second.
  12. 25
    A probe (100) according to any of claims 3-24, wherein said heating element (102) comprises an array of individually controllable heating elements.
  13. 26
    A probe (100) according to any of claims 3-24, wherein said heating element (102) comprises a foil heater.
  14. 27
    A probe (100) according to any of claims 3-26, wherein said circuitry (202, 204) includes a trigger input for triggering stimulation.
  15. 28
    A probe (100) according to any of claims 3-27, wherein said circuitry (202, 204) includes a trigger output for generating an external trigger.
  16. 29
    A probe (100) according to any of claims 3-28, wherein said circuitry (202, 204) maintains said probe at a neutral temperature by providing an activation of said heating element (102) to offset the effect of said heat sink (104).
  17. 30
    A probe (100) according to any of claims 3-29, wherein said circuitry (202, 204) precools said heat sink (104).
  18. 31
    A probe (100) according to any of claims 1-30, including means for sensing brain activity.
  19. 34
    A method of controlling the application temperature of a probe, comprising:providing a relatively large thermal mass at a first temperature;providing a relatively small thermal mass at a second temperature, which small thermal mass includes an active electrically controlled temperature control element and which relatively small thermal mass is in thermal contact with said large thermal mass and which small thermal mass is adapted to apply an application temperature to a body part in contact therewith, said small thermal mass having a thermal mass less than one quarter the thermal mass of said large thermal mass;and controlling the application temperature by controlling the active element in a manner which generates an application temperature of said small thermal mass other than said first temperature, said controlling the application temperature comprising offsetting a thermal effect of the large thermal mass on said application temperature by said controlling said active element of said small thermal mass.
  20. 37
    A method according to any of claims 34-36, wherein said first and second temperatures are different.
  21. 38
    A method according to any of claims 34-37, wherein said thermal masses have a ratio of over 1:50.
  22. 39
    A method according to any of claims 34-37, wherein said thermal masses have a ratio of over 1:100.
  23. 40
    A method according to any of claims 34-37, wherein said thermal masses have a ratio of over 1:1000.
  24. 41
    A probe (100) according to any of claims 1-33, wherein said circuitry (202, 204) is configured to control said heat control elements (102) to produce sharp temperature spikes including a sharp leading edge, a short duration and a sharp trailing edge such that a spike of at least 10 C is shorter than 2 seconds.
  25. 42
    A method according to any of claims 34-40, wherein controlling comprises generating at least one sharp temperature spike of at least 10°C including a sharp leading edge, a duration of less than 2 seconds and a sharp trailing edge.
  26. 43
    A probe (100) according to any of claims 1-33 or 41, wherein said profile comprises at least one spike with substantially linear-rate temperature changes.
  27. 44
    A method according to any of claims 34-40 or 42, wherein controlling comprises controlling in a manner which generates a temperature spike with substantially linear-rate temperature changes.
Independent claims27