Method for ion implantation
Abstract
A method for ion implanting a species into a workpiece, said method comprising placing said workpiece (121) in a processing zone of a chamber (105) having a pair of ports (155,160) near generally opposite sides of said processing zone and connected together by a conduit (150) external of said chamber, introducing into said chamber a process gas (125) comprising a first species to be implanted, generating from said process gas a plasma current and causing said plasma current to oscillate in a circulatory reentrant path comprising said conduit and said processing zone, and coupling a bias to said workpiece, and setting said bias to a level corresponding to a desired depth distribution below a surface of the workpiece at which said species is to be implanted.

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1 sheet
Sheet 1
Every citation, both ways
| Document | Relation | Office | Category | Cited during | Relevant claims |
|---|---|---|---|---|---|
| EP1054433A1 | Cites | European Patent Office (EPO) | X | Search report | 20 |
| EP1158071A2 | Cites | European Patent Office (EPO) | Y | Search report | 18,19,46 |
| US2003013260A1 | Cites | United States of America | Y | Search report | 3 |
| US2003085205A1 | Cites | United States of America | XY | Search report | 1,2,20,25,27-29 |
| US2003181068A1 | Cites | United States of America | Y | Search report | 21,22,25 |
| US2003226641A1 | Cites | United States of America | A | Search report | 1-19,47 |
| US2004036038A1 | Cites | United States of America | XY | Search report | 20,24,27,33 |
| US2004166612A1 | Cites | United States of America | PX | Search report | 1-19,47 |
| US6121161A | Cites | United States of America | Y | Search report | 34-41 |
| US6395150B1 | Cites | United States of America | Y | Search report | 4-7,15,42-45 |
| US6413321B1 | Cites | United States of America | Y | Search report | 11-13 |
| US6492612B1 | Cites | United States of America | Y | Search report | 32 |
| PATENT ABSTRACTS OF JAPAN vol. 2000, no. 08 6 October 2000 (2000-10-06) | Non-patent | – | – | Search report | – |
| HU C-K ET AL: "A PROCESS FOR IMPROVED AL(CU) REACTIVE ION ETCHING", JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY: PART A, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, vol. 7, no. 3, PART 1, 1 May 1989 (1989-05-01), pages 682 - 685, XP000126080, ISSN: 0734-2101 | Non-patent | – | – | Search report | – |
| PATENT ABSTRACTS OF JAPAN vol. 1995, no. 05 30 June 1995 (1995-06-30) | Non-patent | – | – | Search report | – |
| PATENT ABSTRACTS OF JAPAN vol. 1997, no. 11 28 November 1997 (1997-11-28) | Non-patent | – | – | Search report | – |
| PATENT ABSTRACTS OF JAPAN vol. 017, no. 154 (C - 1040) 26 March 1993 (1993-03-26) | Non-patent | – | – | Search report | – |
| PATENT ABSTRACTS OF JAPAN vol. 1995, no. 08 29 September 1995 (1995-09-29) | Non-patent | – | – | Search report | – |
89 members in 8 offices
Priority claims2
| Document | Office | Kind | Date |
|---|---|---|---|
| 838052 | United States of America | – | |
| 83805204 | United States of America | A |
Members89
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| WO0215650A2 | World Intellectual Property Organization (WIPO) | A2 | |
| WO0215650A3 | World Intellectual Property Organization (WIPO) | A3 | |
| US6410449B1 | United States of America | B1 | |
| US6453842B1 | United States of America | B1 | |
| US6468388B1 | United States of America | B1 | |
| US6494986B1 | United States of America | B1 | |
| US2003047449A1 | United States of America | A1 | |
| KR20030029130A | Republic of Korea | A | |
| US6551446B1 | United States of America | B1 | |
| TW530322B | Taiwan Province of China | B | |
| EP1307896A2 | European Patent Office (EPO) | A2 | |
| US2003226641A1 | United States of America | A1 | |
| WO03105182A2 | World Intellectual Property Organization (WIPO) | A2 | |
| JP2004506339A | Japan | A | |
| WO03105182A3 | World Intellectual Property Organization (WIPO) | A3 | |
| TW200405769A | Taiwan Province of China | A | |
| WO2004042773A2 | World Intellectual Property Organization (WIPO) | A2 | |
| US2004107906A1 | United States of America | A1 | |
| US2004107907A1 | United States of America | A1 | |
| US2004107908A1 | United States of America | A1 | |
| US2004107909A1 | United States of America | A1 | |
| US2004112542A1 | United States of America | A1 | |
| WO2004042773A3 | World Intellectual Property Organization (WIPO) | A3 | |
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| US2004149218A1 | United States of America | A1 | |
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| US2005136604A1 | United States of America | A1 | |
| EP1561234A2 | European Patent Office (EPO) | A2 | |
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| US2005230047A1 | United States of America | A1 | |
| CN1693536A | China | A | |
| CN1693537A | China | A | |
| EP1593753A2 | European Patent Office (EPO) | A2 | |
| EP1593756A1 | European Patent Office (EPO) | A1 | |
| CN1723529A | China | A | |
| EP1593753A3This record | European Patent Office (EPO) | A3 | |
| US2006043065A1 | United States of America | A1 | |
| TW200609373A | Taiwan Province of China | A | |
| TW200610033A | Taiwan Province of China | A | |
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| US7430984B2 | United States of America | B2 | |
| EP1561234B1 | European Patent Office (EPO) | B1 | |
| US7465478B2 | United States of America | B2 | |
| DE60324958D1 | Germany | D1 | |
| US7479456B2 | United States of America | B2 | |
| CN100466155C | China | C | |
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| KR101011580B1 | Republic of Korea | B1 | |
| TWI338537B | Taiwan Province of China | B | |
| KR101038165B1 | Republic of Korea | B1 | |
| KR101155139B1 | Republic of Korea | B1 | |
| KR101162775B1 | Republic of Korea | B1 | |
| JP5204941B2 | Japan | B2 | |
| TWI398907B | Taiwan Province of China | B |
12 legal events, as 2 offices reported them to INPADOC
Over the term
Point at a mark for the eventEvents
| Event | Code | Office | |
|---|---|---|---|
| Application deemed to be withdrawnWithdrawn18D | 18D | EP | |
| Information on the status of an ep patent application or granted ep patentGrantedSTATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWNSTAA | STAA | EP | |
| First examination report despatched17Q | 17Q | EP | |
| Designated country de not longer valid8566 | 8566 | DE | |
| Designation fees paidAKX | AKX | EP | |
| Request for examination filed17P | 17P | EP | |
| Designated contracting statesAK | AK | EP | |
| Request for extension of the european patentAX | AX | EP | |
| Search report despatchedORIGINAL CODE: 0009013PUAL | PUAL | EP | |
| Designated contracting statesAK | AK | EP | |
| Request for extension of the european patentAX | AX | EP | |
| Public reference made under article 153(3) epc to a published international application that has entered the european phaseORIGINAL CODE: 0009012PUAI | PUAI | EP |
Numbers
- Publication
- 1593753
- Application
- 50096858
Titles3
- German
- Verfahren zur Ionenimplantation
- English
- Method for ion implantation
- French
- Procédé de implantation ionique
Classification
- CPC, 21
- C23C14/48
- H10P14/6922
- H10P14/6336
- C23C16/507
- H01J37/321
- H01J37/32174
- H01J37/32357
- H01J37/32412
- H01J2237/2001
- Y10T29/5313
- H10D84/017
- H10D84/038
- H10D84/0167
- H10D84/0177
- H10D30/0227
- H10P14/69433
- H10P32/1204
- H10P30/204
- H10P30/21
- H10P30/225
- H10P30/28
- IPC, 10
- C23C14 48
- C23C16 507
- H10D48 07
- H01J37 32
- H01L21 223
- H01L21 265
- H01L21 316
- H01L21 318
- H10D30 01
- H10D84 03
Designated states2
- Contracting states, 1
- Türkiye
- Extension states, 1
- Yugoslavia, later Serbia and Montenegro (until 2006)