EP1593163A2

A thin film semiconductor device and method of manufacturing a thin film semiconductor device

Abstract

This record has no abstract on file.

Term

Term ended

Projected expiry passed 30 January 2024, 2.7 years ago.

  1. Priority
  2. Filed
  3. Published
  4. Projected expiry
  5. Today

16 claims: 11 independent, 5 dependent

  1. 1
    Claims of equivalent WO 2004068536 A2 CLAIMS:1. A thin film semiconductor device including a substrate;and a number of thin film active layers of inorganic material that are deposited in layers on the substrate and wherein at least one active layer is printed onto one of the substrate and an underlying active layer.
  2. 2
    A semiconductor device as claimed in any one of the preceding claims, wherein the active layer is printed using a transfer printing process selected from a group consisting of offset lithography printing, block printing, stamp printing, relief printing, gravure printing, letterpress printing and screenprinting using colloidal inks.
  3. 5
    A semiconductor device as claimed in any one of the preceding claims, wherein each of the active layers is printed onto one of an underlying active layer and the substrate.
  4. 6
    A semiconductor device as claimed in any one of the preceding claims, which is in the form of a photovoltaic cell.
  5. 7
    A semiconductor device as claimed in any one of the preceding claims, which is in the form of a field effect transistor.
  6. 8
    A semiconductor device as claimed in any one of the preceding claims, which includes an active layer comprising a colloidal ink including an inorganic semiconductor material powder suspended in a solvent/binder carrier composition.
  7. 9
    A method of manufacturing a thin film semiconductor device, which includes depositing a number of thin film active layers of inorganic material onto a substrate, wherein at least one of the active layers is printed onto one of the substrate and an underlying active layer.
  8. 13
    A new thin film semiconductor device substantially as described in the specification.
  9. 14
    A thin film semiconductor device substantially as described in the specification with reference to and as illustrated in the accompanying diagrammatic drawings.
  10. 15
    A new method substantially as described in the specification.
  11. 16
    A method substantially as described in the specification with reference to and as illustrated in the accompanying diagrammatic drawings.