EP1562172A3
Methods and systems for adaptive dither structures
Abstract
In a digital image, there is a problem that there remains a segment of the grayscale where it is difficult to remove contour artifacts without increasing the amplitude of the dither pattern (e.g. noise) so much that it becomes visible. To resolve this problem, a dither array in which both the spatial dimensions and the temporal dimensions have high-pass characteristic is combined with a color image.

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1 sheet
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Every citation, both waysCites: the store holds 3 of 4
| Document | Relation | Office | Category | Cited during | Relevant claims |
|---|---|---|---|---|---|
| US2003164961A1 | Cites | United States of America | Y | Search report | 1-9 |
| US4758893A | Cites | United States of America | A | Search report | 1-9 |
| US5701366A | Cites | United States of America | A | Search report | 1-9 |
48 members in 6 offices
Priority claims4
| Document | Office | Kind | Date |
|---|---|---|---|
| 775012 | United States of America | – | |
| 77501204 | United States of America | A | |
| 775012 | – | – | – |
| US20040775012 | – | – | – |
Members48
| Document | Office | Kind | |
|---|---|---|---|
| EP1094420A2 | European Patent Office (EPO) | A2 | |
| JP2001175236A | Japan | A | |
| KR20010070159A | Republic of Korea | A | |
| EP1094420A3 | European Patent Office (EPO) | A3 | |
| US6441867B1 | United States of America | B1 | |
| TW508539B | Taiwan Province of China | B | |
| KR20030026262A | Republic of Korea | A | |
| EP1322113A1 | European Patent Office (EPO) | A1 | |
| US2003164961A1 | United States of America | A1 | |
| JP2003263143A | Japan | A | |
| KR100402666B1 | Republic of Korea | B1 | |
| JP2003316337A | Japan | A | |
| EP1094420B1 | European Patent Office (EPO) | B1 | |
| KR20040074034A | Republic of Korea | A | |
| US2004165115A9 | United States of America | A9 | |
| DE60012653D1 | Germany | D1 | |
| JP2004348149A | Japan | A | |
| JP3642777B2 | Japan | B2 | |
| JP3642783B2 | Japan | B2 | |
| DE60012653T2 | Germany | T2 | |
| EP1562172A2 | European Patent Office (EPO) | A2 | |
| US2005174360A1 | United States of America | A1 | |
| JP2005222071A | Japan | A | |
| JP2005234587A | Japan | A | |
| EP1583358A2 | European Patent Office (EPO) | A2 | |
| EP1583359A2 | European Patent Office (EPO) | A2 | |
| EP1583360A2 | European Patent Office (EPO) | A2 | |
| KR100528938B1 | Republic of Korea | B1 | |
| KR100548841B1 | Republic of Korea | B1 | |
| KR100571084B1 | Republic of Korea | B1 | |
| KR20060045319A | Republic of Korea | A | |
| KR100586335B1 | Republic of Korea | B1 | |
| US7098927B2 | United States of America | B2 | |
| JP2006229264A | Japan | A | |
| US2006221366A1 | United States of America | A1 | |
| US2006221401A1 | United States of America | A1 | |
| JP3933669B2 | Japan | B2 | |
| EP1583358A3 | European Patent Office (EPO) | A3 | |
| EP1583359A3 | European Patent Office (EPO) | A3 | |
| EP1583360A3 | European Patent Office (EPO) | A3 | |
| JP2008158538A | Japan | A | |
| EP1562172A3This record | European Patent Office (EPO) | A3 | |
| US7450181B2 | United States of America | B2 | |
| US7554555B2 | United States of America | B2 | |
| JP4420607B2 | Japan | B2 | |
| US7692665B2 | United States of America | B2 | |
| JP4587838B2 | Japan | B2 | |
| JP4589412B2 | Japan | B2 |
11 legal events, as the office reported them to INPADOC
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| Application deemed to be withdrawnWithdrawn18D | 18D | |
| Information on the status of an ep patent application or granted ep patentGrantedSTATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWNSTAA | STAA | |
| Designation fees paidAKX | AKX | |
| First examination report despatched17Q | 17Q | |
| Request for examination filed17P | 17P | |
| Designated contracting statesAK | AK | |
| Request for extension of the european patentAX | AX | |
| Search report despatchedORIGINAL CODE: 0009013PUAL | PUAL | |
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| Request for extension of the european patentAX | AX | |
| Public reference made under article 153(3) epc to a published international application that has entered the european phaseORIGINAL CODE: 0009012PUAI | PUAI |
Numbers
- Publication
- 1562172
- Publication, DOCDB
- 1562172
- Publication, EPODOC
- EP1562172
- Application
- 5002371
- Application, DOCDB
- 05002371
- Application, EPODOC
- EP20050002371
Titles3
- German
- Verfahren und Systeme für adaptive Zitterstrukturen
- English
- Methods and systems for adaptive dither structures
- French
- Méthodes et systèmes pour structures adaptives de tramage
Classification
- CPC, 4
- G09G3/2055
- G09G3/2003
- G09G3/3611
- G09G2360/16
- IPC, 3
- G09G3 36
- G09G3 20
- G09G5 02
Designated states36
- Contracting states, 30
- Austria
- Belgium
- Bulgaria
- Switzerland
- Cyprus
- Czechia
- Germany
- Denmark
- Estonia
- Spain
- Finland
- France
- United Kingdom
- Greece
- Hungary
- Ireland
- Iceland
- Italy
- Liechtenstein
- Lithuania
- Luxembourg
- Monaco
- Netherlands (Kingdom of the)
- Poland
and 6 moreShow fewer
- Portugal
- Romania
- Sweden
- Slovenia
- Slovakia
- Türkiye
- Extension states, 6
- Albania
- Bosnia and Herzegovina
- Croatia
- Latvia
- North Macedonia
- Yugoslavia, later Serbia and Montenegro (until 2006)