Antistatic film, spacer using it and picture display unit

BACKGROUND OF THE INVENTION

Field of the Invention

0001The present invention relates to an antistatic film installed in an airtight vessel containing an electron source of an electron-generating device such as a picture display unit, to a spacer using it, and to the picture display unit.

Related Background Art

0002A flat display unit using an electron-emitting device has, as shown in Japanese Patent Application Laid-Open No. H10-284286, a spacer called as the spacer or a rib installed therein, which is a structural support resistant to ambient pressure for keeping the inside of the unit into a high vacuum.

0003FIG. 7 is a cross-sectional schematic view of an image-forming apparatus using many electron-emitting devices. Reference numeral 101 denotes a rear plate, reference numeral 102 a sidewall and reference numeral 103 a faceplate, and an airtight vessel is formed by the rear plate 101, the side wall 102 and the face plate 103. A spacer 107b that is a structural support resistant to ambient pressure in the airtight vessel has a low-resistivity film 110 thereon, and is connected to wiring 109 through an electroconductive frit 108.

0004An electron-emitting device 104 is formed on a rear plate 101, and a phosphor 105 and a metal back 106 are formed on a face plate. Objects of providing a metal back 106 are to improve a utilization factor of light by mirror-reflecting a light emitted from a phosphor 105; to protect the phosphor 105 from the collision of negative ions; to work as an electrode for applying an electron beam-accelerating voltage; and to work as a conducting path for electrons after having excited the phosphor 105.

0005A spacer 107a shows the electrostatically charged state of the spacer, and shows a state in which electrostatic charge (positive electrostatic charge in the drawing) is caused by collision of one part of electrons emitted from an electron source around it. Here, the spacer 107a shows the electrostatically charged state of the spacer when having no antistatic film 112 installed thereon, and thus, the thickness of a low-resistivity film is drawn more thickly than the low-resistivity film 110 contacting with the antistatic film 112 of the spacer 107b, for convenience in illustration.

0006When a spacer 107a is positively charged with electricity as described above, electrons emitted from an electron-emitting device 104 that is an electron source are drawn to a spacer side, for example, like an electron trajectory 111a, and consequently impair the quality of a displayed image.

0007In order to solve the problem, there is a proposition of arranging an antistatic film 112 on a spacer 107b, eliminating the charge by passing a micro electrical current through the surface, and thereby making electrons draw a predetermined trajectory such as an electron trajectory 111b, without being drawn to the spacer. There is also a proposition, as shown in Japanese Patent Application Laid-Open No. 2001-143620, of providing unevenness on the surface of a spacer glass substrate to make an effective secondary emission coefficient less than that with a flat spacer surface, and to effectively inhibit the electrostatic charge of the spacer surface.

0008Furthermore, Japanese Patent Application Laid-Open No. H10-284283 proposes a spacer coated with an electrostatic charge-mitigating film containing aluminum nitride or aluminum oxide, and noble metals such as gold, palladium and platinum, by binary simultaneous sputtering with the use of an aluminum target and a noble metal target, and of a mixed gas of argon and nitrogen or oxygen as a gas for forming a film.

0009However, it has become clear that the spacers shown in the above described conventional examples cause variation in the performance of the function for eliminating electrostatic charge.

0010In particular, when a temperature distribution is formed in the spacer, the distribution of resistivity is also formed due to the temperature characteristic of the resistivity of the antistatic film. The variation of resistivity leads to the variation in the diselectrification function.

0011Specifically, in a flat display panel, the instability of a display image results from temperature distribution in a panel plane, which is caused by a temperature difference between a face plate and a rear plate.

0012In addition, a conventional method of forming an antistatic film containing a plurality of elements by sputtering simultaneously a plurality of different material targets (for example, binary sputtering with the use of two materials) might cause variation in the resistivity of an antistatic film depending on each film-forming batch even when film-forming conditions (background, sputtering pressure, gas flow rate and target electrification power) are uniformized.

0013In order to uniformize resistivity, target electrification powers supplied to different material targets are required to be adjusted to each, which is complicated, and the operation is not always highly reproducible. In particular, in binary sputtering, when there is a large difference between target electrification powers, so-called cross contamination can not be avoided, which is a phenomenon that a more powerfully electrified target material deposits on the surface of a less powerfully electrified target material.

SUMMARY OF THE INVENTION

0014An object of the present invention is to provide an antistatic film having superior controllability for a resistivity value, stability and reproducibility, and the adequate temperature characteristics of resistance.

0015The present invention provides an antistatic film having a structure comprising a plurality of conductor particles with particle diameters of 0.5 to 10 nm dispersed in a medium containing a nitride.

0016In addition, the present invention provides an antistatic film having a structure comprising a plurality of conductor particles with particle diameters of 0.5 to 10 nm dispersed in a medium containing an oxide.

0017In addition, the present invention provides an antistatic film having a structure comprising a plurality of conductor particles with particle diameters of 0.5 to 10 nm dispersed in a medium containing a nitride and an oxide.

0018In addition, the present invention provides an antistatic film having a structure comprising a plurality of semiconductor particles with particle diameters of 0.5 to 10 nm dispersed in a medium containing a nitride.

0019In addition, the present invention provides an antistatic film having a structure comprising a plurality of semiconductor particles with particle diameters of 0.5 to 10 nm dispersed in a medium containing an oxide.

0020In addition, the present invention provides an antistatic film having a structure of dispersing a plurality of semiconductive particles with particle diameters of 0.5 to 10 nm in a medium containing a nitride and an oxide. As for media,which it was described above, it points at the part except for the particles which have the particle diameters of 0.5 to 10nm dispersed in a film and which exists.

0021In addition, the present invention provides an electron-generating device with an electron source in an airtight vessel, comprising any of the above described antistatic films in the airtight vessel.

0022In addition, the present invention provides a picture display unit provided with an airtight vessel having a first substrate with an electron source arranged thereon, and a second substrate with an image display member arranged thereon so as to face the electron source, and a spacer arranged between the first and second substrates in the above described airtight vessel, wherein the spacer has any of the above described antistatic films arranged on the surface.

0023In addition, the present invention provides a spacer arranged between a first substrate and a second substrate in a picture display unit provided with an airtight vessel having the first substrate with an electron source arranged thereon and the second substrate having an image display member arranged thereon so as to face the electron source, wherein the spacer has any of the above described antistatic films on the surface.

BRIEF DESCRIPTION OF THE DRAWINGS

0024<ul id="ul0001" list-style="none" compact="compact"><li>FIG. 1 is a schematic view showing the cross-sectional shape of an antistatic film according to the present invention, observed with a TEM (a transmission electron microscope);</li><li>FIG. 2 is a perspective view showing a picture display unit according to the present invention, of which one part of the display panel is cut;</li><li>FIG. 3 is a block diagram of a high-frequency sputtering apparatus arranging a target according to the present invention therein, which is used for imparting an antistatic film to a spacer substrate;</li><li>FIG. 4 is a figure showing a relation between the resistivity of a Pt-Al mixture-nitride film according to the present invention and the total pressure of a sputtering gas;</li><li>FIG. 5 is a figure showing a relation between the resistivity of a Pt-AlN mixture-nitride film according to the present invention and the total pressure of a sputtering gas;</li><li>FIG. 6 is a figure showing the variation of the resistivity of a Pt-Al mixture-nitride film according to the present invention;</li><li>FIG. 7 is a cross-sectional schematic view of an image-forming apparatus using an electron-emitting device, for describing the mechanism of an electrostatic charge in a spacer according to the present invention; and</li><li>FIG. 8 is a view explaining the deviation of an electron beam ΔL which appears as the disarray of a display image due to the influence of a spacer according to the present invention.</li></ul>

DESCRIPTION OF THE PREFERRED EMBODIMENTS

0025The present invention provides an antistatic film having a structure comprising a plurality of conductor particles with particle diameters of 0.5 to 10 nm dispersed in a medium containing a nitride.

0026In addition, the present invention provides an antistatic film having a structure comprising a plurality of conductor particles with particle diameters of 0.5 to 10 nm dispersed in a medium containing an oxide.

0027In addition, the present invention provides an antistatic film having a structure comprising a plurality of conductor particles with particle diameters of 0.5 to 10 nm dispersed in a medium containing a nitride and an oxide.

0028In addition, the conductor particle is preferably a noble metal particle.

0029In addition, the conductor particle is preferably a platinum particle, and the nitride is preferably aluminum nitride.

0030In addition, the conductor particle is preferably a platinum particle, and the oxide is preferably aluminum oxide.

0031In addition, the conductor particle is preferably a platinum particle, a nitride is preferably aluminum nitride, and the oxide is preferably aluminum oxide.

0032In addition, the conductor particle is preferably a gold particle, and the nitride is preferably aluminum nitride.

0033In addition, the conductive particle is preferably a gold particle, and the oxide is preferably aluminum oxide.

0034In addition, the conductor particle is preferably a gold particle, the nitride is preferably aluminum nitride, and the oxide is preferably aluminum oxide.

0035In addition, the conductor particle is preferably a silver particle, and the nitride is preferably aluminum nitride.

0036In addition, the conductor particle is preferably a silver particle, and the oxide is preferably aluminum oxide.

0037In addition, the conductor particle is preferably a silver particle, the nitride is preferably aluminum nitride, and the oxide is preferably aluminum oxide.

0038In addition, the content of the conductor is preferably 0.1 to 10 atomic%.

0039In addition, the present invention provides an antistatic film having a structure comprising a plurality of semiconductor particles with particle diameters of 0.5 to 10 nm dispersed in a medium containing a nitride.

0040In addition, the present invention provides an antistatic film having a structure comprising a plurality of semiconductor particles with particle diameters of 0.5 to 10 nm dispersed in a medium containing an oxide.

0041In addition, the present invention provides an antistatic film having a structure of dispersing a plurality of semiconductive particles with particle diameters of 0.5 to 10 nm in a medium containing a nitride and an oxide.

0042In addition, the semiconductor particle is preferably a germanium particle, and the nitride is preferably silicon nitride.

0043In addition, the semiconductor particle is preferably a germanium particle, and the oxide is preferably silicon oxide.

0044In addition, the conductor particle is preferably a germanium particle, the nitride is preferably silicon nitride, and the oxide is preferably silicon oxide.

0045In addition, the content of the semiconductor is preferably 0.1 to 10 atomic%.

0046In addition, any of the above described antistatic films includes the particle with a diameter of 1.0 to 9.0 nm, and has a resistivity of ρ = 1×10⁴ to 1×10¹¹ Ωcm.

0047In addition, the present invention provides an electron-generating device with an electron source in an airtight vessel, comprising any of the above described antistatic films in the airtight vessel.

0048In addition, the present invention provides a picture display unit provided with an airtight vessel having a first substrate with an electron source arranged thereon, and a second substrate with an image display member arranged thereon so as to face the electron source, and a spacer arranged between the first and second substrates in the above described airtight vessel, wherein the spacer has any of the above described antistatic films arranged on the surface.

0049In addition, the present invention provides a spacer arranged between a first substrate and a second substrate in a picture display unit provided with an airtight vessel having the first substrate with an electron source arranged thereon and the second substrate having an image display member arranged thereon so as to face the electron source, wherein the spacer has any of the above described antistatic films on the surface.

0050The above described antistatic film according to the present invention has little change of resistivity due to temperature, and when the antistatic film is provided particularly on the surface of the spacer of the picture display unit, it has the effect of reducing the instability of a display image, which originates from a temperature distribution in an airtight vessel caused by a temperature difference between the above described first and second substrates.

0051Furthermore, the present invention provides a mixture target of aluminum and platinum including 95 wt.% or more aluminum and platinum, which is used for forming an antistatic film containing aluminum and platinum by a sputtering technique.

0052In addition, the present invention provides a mixture target of aluminum nitride and platinum including 95 wt.% or more aluminum and platinum, which is used for forming an antistatic film containing aluminum and platinum by a sputtering technique.

0053Furthermore, the present invention provides a method for manufacturing an antistatic film containing aluminum and platinum, comprising sputtering the mixture target in an atmosphere containing only nitrogen.

0054In addition, the present invention provides a method for manufacturing an antistatic film containing aluminum and platinum, comprising sputtering the mixture target in an atmosphere containing only oxygen.

0055In addition, the present invention provides a method for manufacturing an antistatic film containing aluminum and platinum, comprising sputtering the mixture target in an atmosphere containing nitrogen and oxygen.

0056A target according to the present invention, as described above, can be preferably used as a target particularly of a PVD (Physical Vapor Deposition) apparatus such as an electron beam evaporation apparatus and a sputtering apparatus. When the PVD (Physical Vapor Deposition) apparatus employs a target according to the present invention as the target thereof, it can produce a resistive film having high reproducibility, superior controllability of a resistivity value, and temperature characteristics of the resistance.

0057In addition, a method for manufacturing an antistatic film according to the present invention has the effect comprising the variation of the resistivity less and the reproducibility of the film characteristic (resistivity) higher than those with binary simultaneous sputtering.

(Embodiments)

0058First of all, an antistatic film according to the present invention is a resistive film as shown in FIG. 1 that is a schematic view showing the cross-sectional shape observed with a TEM (a transmission electron microscope), having a structure comprising a plurality of particles 1 with an average particle diameter of 0.5 to 10 nm dispersed in a medium 2. Here, the average particle diameter is obtained by measuring the diameters of 20 particles in a cross-sectional shape as shown in FIG. 1 and calculating the average.

0059If the particles have an average particle diameter of 0.5 nm or larger, preferably 1 nm or larger, a resistive film including them can be judged to have adequate temperature characteristics of resistance. Specifically, the resistive film can be judged to have little variation of resistance due to a temperature change. Accordingly, when the spacer having the resistive film as an antistatic film is used in a picture display unit, the spacer can reduce the disarray of a display image caused by it. In addition, the above described average particle diameter is 10 nm or smaller, and preferably 9 nm or smaller from the viewpoint comprising a resistivity of the resistive film equal to or higher than 1×10⁶ Ωcm.

0060As described above, the above described resistive film contains an electron source, is arranged in an airtight vessel having temperature change, and is preferably applied to the resistive film for preventing electrostatic charge in the airtight vessel, namely, to an antistatic film.

0061Embodiments according to the present invention will be now described below.

0062At first, a first embodiment shows a resistive film having a structure comprising a plurality of conductor particles with particle diameters of 0.5 to 10 nm dispersed in a medium containing a nitride.

0063A second embodiment shows a resistive film having a structure comprising a plurality of conductor particles with particle diameters of 0.5 to 10 nm dispersed in a medium containing an oxide.

0064A third embodiment shows a resistive film having a structure comprising a plurality of conductor particles with particle diameters of 0.5 to 10 nm dispersed in a medium containing a nitride and an oxide.

0065In each embodiment described above, the conductor is preferably a metal such as platinum, gold, silver, and among the metals, particularly preferably is platinum or gold from the viewpoint of stability and controllability for a resistivity value. In addition, the above described nitride is preferably aluminum nitride, germanium nitride, silicon nitride and magnesium nitride, and among them, particularly preferably is aluminum nitride from the viewpoint of stability and controllability for a resistivity value. In addition, the above described oxide is preferably aluminum oxide, germanium oxide, silicon oxide and magnesium oxide, and among them, particularly preferably is aluminum oxide from the viewpoint of stability and controllability for a resistivity value. In addition, the above described medium containing a nitride and an oxide, particularly preferably is aluminum nitride/oxide from the viewpoint of stability and controllability for a resistivity value, and the adequate temperature characteristics of resistance.

0066Subsequently, a fourth embodiment shows a resistive film having a structure comprising a plurality of semiconductor particles with particle diameters of 0.5 to 10 nm dispersed in a medium containing a nitride.

0067A fifth embodiment shows a resistive film having a structure comprising a plurality of semiconductor particles with particle diameters of 0.5 to 10 nm dispersed in a medium containing an oxide.

0068The sixth embodiment shows a resistive film having a structure comprising a plurality of semiconductive particles with particle diameters of 0.5 to 10 nm dispersed in a medium containing a nitride and an oxide.

0069In the fourth, fifth and sixth embodiments described above, the above semiconductor is preferably germanium, silicon and the like, and among the semiconductors, is particularly preferably germanium from the viewpoint of stability and controllability for a resistivity value. In addition, the above described nitride is preferably aluminum nitride, germanium nitride, silicon nitride and magnesium nitride, and among them, particularly preferably is silicon nitride from the viewpoint of stability and controllability for a resistivity value. In addition, the above described oxide is preferably aluminum oxide, germanium oxide, silicon oxide and magnesium oxide, and among them, particularly preferably is silicon oxide from the viewpoint of stability and controllability for a resistivity value. In addition, the above described medium containing a nitride and an oxide, particularly preferably is silicon nitride/oxide from the viewpoint of stability and controllability for a resistivity value, and the adequate temperature characteristics of resistance.

0070In addition, when the resistive film of each of above described first to sixth embodiments is applied to an antistatic film on the surface of a spacer arranged between first and second substrates particularly of a picture display unit provided with an airtight vessel having the first substrate with an electron source arranged thereon and the second substrate with an image display member arranged so as to face the above described electron source, among electron-generating devices, the above each resistive film has the resistivity preferably of ρ = 1×10⁴ to 1×10¹¹ Ωcm, and has a conductor or semiconductor content preferably of 0.1 to 10 atomic%.

0071Subsequently, a method for obtaining the above described resistive film will be described.

0072The above described resistive film is preferably formed (1) with a sputtering technique by using a mixture target containing at least a component composing a conductor particle or a semiconductor particle and a component to be nitrided or oxidized for composing a nitride or an oxide, and (2) in a sputtering atmosphere containing nitrogen gas with a nitrogen partial pressure of 70% or higher, or oxygen gas with an oxygen partial pressure of 70% or higher. As a matter of course, the atmosphere may be a mixed gas atmosphere if the partial pressure is in the above described range. In addition, the mixed gas atmosphere is particularly preferably the atmosphere of the gas of nitrogen mixed with oxygen, and in this case, the partial pressure of nitrogen and oxygen is preferably controlled to 70% or more in total.

0073The particle diameter can be appropriately varied in the range of 0.5 to 10 nm by changing the component and the ratio in the composition of a mixing target, and a gas sort, a sputtering pressure and an electrification power during film formation by sputtering, in the above described conditions (1) and (2), so that a resistive film can be obtained so as to acquire the resistance controlled to a preferable range for an electron generating device to which the resistive film is applied.

0074Subsequently, a sputtering apparatus used for forming the resistive film according to the above described embodiments will be described.

(Sputtering apparatus)

0075FIG. 3 shows the configuration of a high-frequency sputtering apparatus used in the present embodiment.

0076The summary of the process of forming the above described resistive film by using it will be now described. At first, a substrate 201 is put on a film-forming tray 202, and is charged into a preliminary exhaust hood 203. The preliminary exhaust hood is exhausted to a vacuum degree of 5×10^-4 [Pa] or lower with a vacuum pump 204, and then the film-forming tray 202 is moved to a film-forming chamber 206 by a conveyance roller 205. Then, the film-forming chamber 206 is evacuated to a vacuum of 2×10^-5 [Pa] or less. After the vacuum has been confirmed to have reached the above described value, the specified quantity of a nitrogen gas, an oxygen gas, the mixed gas of argon and nitrogen, the mixed gas of argon and oxygen, or the mixed gas of nitrogen and oxygen is passed into the film-forming chamber through a gas introduction pipe 207. An orifice (not shown) is adjusted so that the total pressure of a sputtering gas becomes a predetermined pressure. After an atmosphere (the total pressure of a sputtering gas, a gas flow rate) has become stable, a predetermined power is applied to a high-frequency power source 208. In order to form a resistive film all over the surface of a substrate 201, a film-forming tray 202 is transported by a transporting roller 205 at the rate of 5 mm/min in the direction of an arrow in the drawing so as to cross directly under.a mixture target 209, after sputtering discharge has started. The distance between the substrate and the mixture target is set to 200 mm.

0077Here, the high voltage of direct current applied to the mixture target 209 is adjusted by a high-frequency power source 208 so that the variation originating from the transportation of the substrate can be reduced.

0078The direction of transporting the substrate is not limited to one direction, but one-return transportation or a plurality of return transportation is acceptable. In addition, in some configurations of the apparatus, a film may be formed on the whole surface by rotating the substrate directly under the target.

0079Through the above described steps, a resistive film can be formed on a substrate.

0080In addition, when a resistive film is to be formed on both sides of a substrate, the film is formed on a surface (a first surface), then a film-forming tray 202 is returned to a preliminary exhaust hood 203, and the substrate 201 is taken out. Subsequently, the substrate 201 is reversed, and the above described resistive film is formed on a back surface (a second surface) similarly to the top surface (the first surface).

0081The resistive film to be formed on each surface of the top surface (a first surface) and the back surface (a second surface) may be a single-layered film with a desired film thickness, or a multilayer film consisting of a plurality of layers, which is produced by using a plurality of targets each having a different composition concentration ratio of the mixture from others.

0082Subsequently, a mixture target used in the above described sputtering apparatus will be described.

(Method for producing mixture target)

0083Here, a method for producing the above described mixture-sintered target will be described.

1) Mixing

0084At first, the weight of each powder of the above described components is measured in accordance with various composition concentration ratios, and the powders are mixed. For instance, the powders of Pt and Al, or Pt and AlN are mixed. A mixing device is not limited in particular, but a ball mill may be used. The powders are mixed in a non-oxidative atmosphere of nitrogen gas, Ar gas or the like. After the powders have been mixed, they may be classified by a sieve or the like as needed.

2) Calcination

0085The mixed powder is calcined in an inert atmosphere of nitrogen gas, Ar gas or the like, or in a vacuum. Alternatively, it may be calcined in a reducing atmosphere of hydrogen or the like. The mixed powder is preferably heated to 800 to 1,500°C, for calcination.

3) Pulverization

0086Thus formed solid material is pulverized. A pulverizing device is not limited in particular, but a ball mill may be used. The solid material is pulverized in a non-oxidative atmosphere of nitrogen gas, Ar gas or the like. After the solid material has been pulverized, the product may be classified with a sieve or the like as needed.

4) Baking

0087The mixed powder obtained through pulverization is pressure-baked in an inert atmosphere of nitrogen gas, Ar gas or the like, or in a vacuum, and a sintered compact is thereby obtained. The mixed powder may be pressure-baked in a reducing gas atmosphere of hydrogen or the like. Hot pressing is preferably used for pressure baking. The sintered compact is formed so as to have a predetermined plate thickness and shape for being sputtered, then is preferably heated to 800 to 1,500°C under the pressure of 1 to 2 MPa, which is a baking step, and becomes a mixture-sintered target.

(Method for producing mixture-melted alloy target)

0088Here, a method for producing a mixture-melted alloy target will be described.

1) Melting

0089At first, the weight of each raw material of the above described components is measured in accordance with various composition concentration ratios, and the raw materials are mixed. For instance, the raw materials of Pt and Al, or Pt and AlN are mixed, and melt in a melting furnace. A melting method for the raw materials is not limited in particular, but in order to prevent the contamination of atmospheric impurities, the raw materials are desirably melt in a vacuum.

2) Cooling

0090The above described melted mixture is cooled while the condition is adjusted not so as to cause the segregation of components.

3) Forge-rolling

0091Thus produced solid material is forge-rolled while being heated. A void (a cavity) produced during cooling is filled, and melting irregularity and density irregularity are uniformized.

4) Baking

0092The solid material obtained through the above described steps is pressure-baked in an inert atmosphere of Ar gas or the like, or in a vacuum, and a Pt-Al or Pt-AlN mixture-melting alloy is thereby obtained. The solid material may be pressure-baked in a reducing gas atmosphere of hydrogen or the like. Hot pressing is preferably used for pressure baking. The mixture-melting alloy is formed so as to have a predetermined plate thickness and shape for being, sputtered, and becomes a mixture-melted alloy target.

0093In the same way as described above, an aluminum-platinum mixture target containing 95 wt.% or more aluminum and platinum, or an aluminum nitride -platinum mixture target containing 95 wt.% or more aluminum and platinum can be formed.

0094In the next place, the whole configuration of a picture display unit will be described, in which a substrate having the above described resistive film formed thereon as a spacer, and the spacer is inserted into the picture display unit.

(Panel configuration)

0095FIG. 2 is a perspective view of a display panel in a picture display unit according to the present embodiment, in which one part of the panel is cut in order to show an inner structure.

0096In the figure, reference numeral 915 denotes a rear plate, reference numeral 916 a side wall, and reference numeral 917 a face plate. The rear plate 915, the side wall 916 and the face plate 917 forms an airtight vessel for keeping the inside of the display panel into a vacuum. When the airtight vessel is assembled, joining areas between members need to be sealed in order to make the joining areas retain adequate strength and airtightness. The sealing is achieved, for example, by applying frit glass to the joining areas and baking it at 400 to 500°C for 10 minutes or longer in atmospheric air or a nitrogenous atmosphere. A method for evacuating the inside of an airtight vessel to a vacuum will be described later.

0097In addition, the inside of the above described airtight vessel is kept in a vacuum of about 10^-4 [Pa], so that for the purpose of preventing the destruction of the airtight vessel due to an ambient pressure or unexpected shock, a spacer 920 is provided so as to make the airtight vessel an ambient-pressure resistant structure. As the spacer, a substrate having an antistatic film is used, which is produced by using the above described mixture targets having various composition concentration ratios in forming films.

0098A substrate 911 is fixed on a rear plate 915, while having N×M pieces of surface conduction electron-emitting devices 912 formed thereon. Here, N and M are positive integers of 2 or more and are appropriately set in accordance with an objective display pixel number. For instance, in a display device for displaying a high definition picture, those numbers are preferably N = 3,000 and M = 1,000 or more. In the present embodiment, the numbers are set to N = 3,072 and M = 1,024.

0099The above described N×M pieces of surface conduction electron-emitting devices are simple-matrix-wired by M lines of row-directional wiring 913 and N lines of column-directional wiring 914. The part composed by the substrate 911, the surface conduction electron-emitting devices 912, the row-directional wiring 913 and the column-directional wiring 914 is called an electron source substrate.

0100In addition, a fluorescent screen 918 is formed on the undersurface of a faceplate 917. In addition, a metal back 919, which is well known in the field of CRT, is arranged on the surface of the rear plate side of the fluorescent screen 918.

0101Dx1 to Dxm, Dy1 to Dyn and Hv are terminals for electric connection having an airtight structure, which is arranged for electrically connecting the display panel to a not-shown electric circuit.

0102Terminals D×1 to Dxm are electrically connected to the row-directional wiring 913 of the surface conduction electron-emitting devices, terminals Dy1 to Dyn to the column-directional wiring 914 of the surface conduction electron-emitting devices, and Hv to a metal back (a metallic membrane) of a face plate 919.

0103In order to evacuate the inside of an airtight vessel to a vacuum, the airtight vessel is assembled, a not-shown exhaust pipe is connected with a vacuum pump, and the inside of the airtight vessel is evacuated to a vacuum of 10^-5 [Pa] or lower. Afterwards, the exhaust pipe is sealed. Then, in order to keep the vacuum in the airtight vessel, a getter film (not shown) is formed just before or after sealing, on a predetermined position in the airtight vessel. The getter film is formed by heating and evaporating a getter material containing, for instance, Ba as a main component with a heater or high-frequency heating, and by the adsorption effect of the getter film, the inside of the airtight vessel is kept to a vacuum of 1×10^-3 to 1×10^-5 [Pa].

0104In the above described picture display unit using a display panel, when electric voltage is applied to each surface conduction electron-emitting device 912 through terminals outside a vessel, Dx1 to Dxm and Dy1 to Dyn, electrons are emitted from each surface conduction electron-emitting device 912. Concurrently with it, a high pressure of several hundreds [V] to several thousands [V] is applied to a metal back (metal membrane) 919 through the terminals outside the vessel Hv to accelerate the above described emitted electrons and make them collide with the inner surface of a face plate 917. Thereby, each phosphor of each color composing a phosphor layer 918 is activated to emit light, and images are displayed.

0105Normally, voltage applied to the surface conduction electron-emitting device 912 according to the present invention is around 12 to 16 [V], a distance d between a metal back (a metal membrane) 919 and the surface conduction electron-emitting device 912 is around 0.1 to 8 [mm], and voltage between the metal back (the metal membrane) 919 and the surface conduction electron-emitting device 912 is about 0.1 [kV] to 12 [kV].

0106A picture display unit and a spacer having a resistance film (an antistatic film) formed on the surface, which is used as a support structure therein, have been described above. However, according to the concept of the present invention, the spacer can be used not only for the picture display unit, but also as a light-emitting source substituted for a light-emitting diode of an optical printer constituted by a photosensitive drum and a light-emitting diode. In addition, if, at this time, the above described m lines of row-directional wiring and the n lines of column-directional wiring are appropriately selected, the spacer can be applied to not only a line-shaped light-emitting source but also a two-dimensional light-emitting source. In the above case, a usable body to be irradiated with electron can be not only a material directly emitting light such as a phosphor, but also a member on which a latent image is formed by the electrostatic charge of electrons. In addition, according to the concept of the present invention, the present invention can be applied to an electron-generating device, even when a material other than an image-forming member such as a phosphor is used as a body to be irradiated with the electrons emitted from an electron source, like in an electron microscope.

(Evaluation method for image)

0107A spacer substrate was prepared by forming a resistive film according to the present invention as an antistatic film on a glass substrate, and was used as a spacer in a picture display unit using the surface conduction electron-emitting device, which is the present embodiment.

0108When the diselectrification capability of the spacer 801 is insufficient, as shown in FIG. 8, the trajectory of a beam is disturbed and the position of the lighting pixel which should be displayed at regular intervals moves. When a distance L between the original positions 802 of beams is defined as 1L, the deviation of a difference between the original position and the position 803 of a beam moved by a spacer is shown in ΔL.

0109The evaluation was carried out by placing a display device in an adequately bright room, and making the 50 subjects of adult men and women visually observe a display image at a place 1m apart from the panel face.

0110The observation result for the disarray of a display image due to the deviation of an electron beam was divided into 3 evaluation stages of "invisible" "visible but not annoying" and "visible and annoying", and a relationship between the stage and the deviation of the beam ΔL was determined. When the majority of the subjects answered "invisible", the deviation ΔL was 0 - 0.01L; when they answered "visible but not annoying", the deviation ΔL was 0.01 - 0.03L; and when they answered "visible", the deviation ΔL was 0.01L or more. The result is shown in Table 1.

0111The performance of a resistive film according to the present invention was evaluated by installing a spacer provided with the resistive film in a display device, and measuring the deviation of an electron beam ΔL in an image affected by the spacer. <tables id="tabl0001" num="0001"><table frame="all"><title>Table 1</title><tgroup cols="4" colsep="1" rowsep="1"><colspec colnum="1" colname="col1" colwidth="39.37mm" /><colspec colnum="2" colname="col2" colwidth="39.37mm" /><colspec colnum="3" colname="col3" colwidth="39.37mm" /><colspec colnum="4" colname="col4" colwidth="39.37mm" /><thead valign="top"><row><entry namest="col1" nameend="col1" align="center">Visual evaluation</entry><entry namest="col2" nameend="col2" align="center">Deviation of electron beam ΔL</entry><entry namest="col3" nameend="col3" align="center">Deviation of electron beam [%]</entry><entry namest="col4" nameend="col4" align="center">Evaluation</entry></row></thead><tbody valign="top"><row><entry namest="col1" nameend="col1" align="center">Invisible</entry><entry namest="col2" nameend="col2" align="center">0 - 0.01 L</entry><entry namest="col3" nameend="col3" align="center">0-1%</entry><entry namest="col4" nameend="col4" align="center">ⓞ</entry></row><row><entry namest="col1" nameend="col1" align="center">Visible but not annoying</entry><entry namest="col2" nameend="col2" align="center">0.01 - 0.03 L</entry><entry namest="col3" nameend="col3" align="center">1-3%</entry><entry namest="col4" nameend="col4" align="center">○</entry></row><row rowsep="1"><entry namest="col1" nameend="col1" align="center">Visible and annoying</entry><entry namest="col2" nameend="col2" align="center">0.03L or more</entry><entry namest="col3" nameend="col3" align="center">3% or more</entry><entry namest="col4" nameend="col4" align="center">×</entry></row></tbody></tgroup></table></tables>

Examples

0112Specific examples according to the present invention will be described below. Here, atomic% indicates the proportion of the number of atoms of monoatoms, and a Pt/Al weight ratio is calculated by<maths id="math0001" num=""><math display="block"><mrow><mtext>(atomic% of Pt × atomic weight of Pt)/(atomic% of Al</mtext><mspace linebreak="newline" /><mtext>× atomic weight of Al).</mtext></mrow></math><img file="EP1557863A2_D0001.tif" /></maths>

(Example 1)

Pt = 5 atomic% Pt-Al-melted alloy

0113The raw materials of Pt and Al were weighed out so as to have the composition ratio of 5 atomic% Pt to 95 atomic% Al, and then were mixed. The mixed materials were melted in a vacuum melting furnace to produce an alloy. The alloy was cooled, and then was forge-rolled to further uniformize the component distribution. The melted alloy was pressure-baked in a vacuum, and was molded so as to acquire a predetermined plate thickness and shape suitable for a sputtering target, and the product became a Pt-Al-melted alloy mixture target. The density of the Pt-Al-melted alloy was 3.6 g/cm³.

0114A Pt-Al-melted alloy was installed as the target of a high-frequency sputtering apparatus shown in FIG. 3, the flow rate of N₂ was set to 100 sccm, and a Pt-Al mixture-nitrided film was formed with varied total pressures. The obtained Pt-Al mixture-nitrided film had the resistivity shown in FIG. 4.

0115Thus produced Pt-Al mixture-nitrided film was analyzed with the use of an RBS (Rutherford backscattering Spectrometory) method, and had the composition shown in Table 2. In addition, the density of the Pt-Al mixture-nitrided film was 3.5 g/cm³. <tables id="tabl0002" num="0002"><table frame="all"><title>Table 2</title><tgroup cols="7" colsep="1" rowsep="1"><colspec colnum="1" colname="col1" colwidth="22.50mm" /><colspec colnum="2" colname="col2" colwidth="22.50mm" /><colspec colnum="3" colname="col3" colwidth="22.50mm" /><colspec colnum="4" colname="col4" colwidth="22.50mm" /><colspec colnum="5" colname="col5" colwidth="22.50mm" /><colspec colnum="6" colname="col6" colwidth="22.50mm" /><colspec colnum="7" colname="col7" colwidth="22.50mm" /><thead valign="top"><row><entry namest="col1" nameend="col1" rowsep="0" align="center">Film type</entry><entry namest="col2" nameend="col2" rowsep="0" align="center">Pt content (atomic%)</entry><entry namest="col3" nameend="col6" align="center">Concentration measured with RBS analysis (atomic%)</entry><entry namest="col7" nameend="col7" rowsep="0" align="center">Film density (g/cm³)</entry></row><row><entry namest="col1" nameend="col1" /><entry namest="col2" nameend="col2" /><entry namest="col3" nameend="col3" align="center">N</entry><entry namest="col4" nameend="col4" align="center">O</entry><entry namest="col5" nameend="col5" align="center">Al</entry><entry namest="col6" nameend="col6" align="center">Pt</entry><entry namest="col7" nameend="col7" /></row></thead><tbody valign="top"><row rowsep="0"><entry namest="col1" nameend="col1" align="center">Pt-Al-N</entry><entry namest="col2" nameend="col2" align="center">Pt = 3</entry><entry namest="col3" nameend="col3" align="char" char=".">49.8</entry><entry namest="col4" nameend="col4" align="char" char=".">0.3</entry><entry namest="col5" nameend="col5" align="char" char=".">49.1</entry><entry namest="col6" nameend="col6" align="char" char=".">0.8</entry><entry namest="col7" nameend="col7" align="char" char=".">3.0</entry></row><row rowsep="1"><entry namest="col1" nameend="col1" /><entry namest="col2" nameend="col2" align="center">Pt = 5</entry><entry namest="col3" nameend="col3" align="char" char=".">50.0</entry><entry namest="col4" nameend="col4" align="char" char=".">0.4</entry><entry namest="col5" nameend="col5" align="char" char=".">47.1</entry><entry namest="col6" nameend="col6" align="char" char=".">2.5</entry><entry namest="col7" nameend="col7" align="char" char=".">3.5</entry></row></tbody></tgroup></table></tables>

(Example 2)

Pt = 3 atomic% Pt-Al-melted alloy

0116Similarly to the Example 1, raw materials were weighed out so as to have the composition ratio of 3 atomic% Pt to 97 atomic% Al, then, were mixed, melted, cooled, forge-rolled and pressure-baked. Thus, a Pt-Al-melted alloy mixture target was obtained. The density of the Pt-Al-melted alloy was 3.2 g/cm³.

0117Similarly to the Example 1, a Pt-Al mixture-nitrided film was formed, and had resistivity shown in FIG. 4.

0118Thus produced Pt-Al mixture-nitrided film was analyzed with the use of an RBS (Rutherford backscattering Spectrometory) method, and had a composition shown in Table 1. In addition, the density of the Pt-Al mixture-nitrided film was 3.0 g/cm³.

(Example 3)

Pt = 5 atomic% Pt-AlN sintered compact

0119Instead of metallic aluminum, aluminum nitride was used as a raw material.

0120The powders of Pt and AlN were weighed out so as to have the composition ratio of 5 atomic% Pt to 95 atomic% AlN, and then were mixed. The powders were mixed with a ball mill in a non-oxidization atmosphere of nitrogen gas. After having been mixed, the powders were classified with a sieve to acquire a further uniformized granular form. Thus mixed powder was calcined in a vacuum.

0121Thus formed solid material was pulverized with the use of a ball mill in the non-oxidation atmosphere of nitrogen gas. After having been pulverized, the powders were classified with a sieve to acquire a further uniformized granular form.

0122The mixed powder obtained through pulverization was pressure-baked in a vacuum to provide a sintered compact. For the pressure-baking, a hot pressing process of heating the mixed powder to 1,500°C at the pressure of 2 MPa was employed. The sintered compact was formed so as to acquire a predetermined plate thickness and shape suitable for a sputtering target, and thus a Pt-AlN mixture sintered target was obtained. The Pt-AlN sintered compact had the density of 2.4 g/cm³.

0123Similarly to the Example 1, the N₂ flow rate was set to 100 sccm, and a Pt-AlN mixture-nitrided film was formed with varied total pressures. Then, the obtained film had resistivity shown in FIG. 5.

0124Thus produced Pt-AlN mixture-nitrided film was analyzed with the use of an RBS (Rutherford backscattering Spectrometory) method, and was proved to have the composition shown in Table 3. In addition, the Pt-AlN mixture-nitrided film had the density of 3.2 g/cm³. <tables id="tabl0003" num="0003"><table frame="all"><title>Table 3</title><tgroup cols="7" colsep="1" rowsep="1"><colspec colnum="1" colname="col1" colwidth="22.50mm" /><colspec colnum="2" colname="col2" colwidth="22.50mm" /><colspec colnum="3" colname="col3" colwidth="22.50mm" /><colspec colnum="4" colname="col4" colwidth="22.50mm" /><colspec colnum="5" colname="col5" colwidth="22.50mm" /><colspec colnum="6" colname="col6" colwidth="22.50mm" /><colspec colnum="7" colname="col7" colwidth="22.50mm" /><thead valign="top"><row><entry namest="col1" nameend="col1" rowsep="0" align="center">Film type</entry><entry namest="col2" nameend="col2" rowsep="0" align="center">Pt content (atomic%)</entry><entry namest="col3" nameend="col6" align="center">Concentration measured with RBS analysis (atomic%)</entry><entry namest="col7" nameend="col7" rowsep="0" align="center">Film density (g/cm³)</entry></row><row><entry namest="col1" nameend="col1" /><entry namest="col2" nameend="col2" /><entry namest="col3" nameend="col3" align="center">N</entry><entry namest="col4" nameend="col4" align="center">O</entry><entry namest="col5" nameend="col5" align="center">Al</entry><entry namest="col6" nameend="col6" align="center">Pt</entry><entry namest="col7" nameend="col7" /></row></thead><tbody valign="top"><row rowsep="0"><entry namest="col1" nameend="col1" align="center">Pt-Al-N</entry><entry namest="col2" nameend="col2" align="center">Pt = 3</entry><entry namest="col3" nameend="col3" align="char" char=".">45.6</entry><entry namest="col4" nameend="col4" align="char" char=".">8.5</entry><entry namest="col5" nameend="col5" align="char" char=".">45.0</entry><entry namest="col6" nameend="col6" align="char" char=".">0.9</entry><entry namest="col7" nameend="col7" align="char" char=".">2.8</entry></row><row rowsep="1"><entry namest="col1" nameend="col1" /><entry namest="col2" nameend="col2" align="center">Pt = 5</entry><entry namest="col3" nameend="col3" align="char" char=".">45.7</entry><entry namest="col4" nameend="col4" align="char" char=".">9.0</entry><entry namest="col5" nameend="col5" align="char" char=".">43.0</entry><entry namest="col6" nameend="col6" align="char" char=".">2.3</entry><entry namest="col7" nameend="col7" align="char" char=".">3.2</entry></row></tbody></tgroup></table></tables>

(Example 4)

Pt = 3 atomic% Pt-AlN sintered compact

0125Similarly to the Example 3, instead of metallic aluminum, aluminum nitride was used as a raw material, and the raw materials were weighed out so as to have the composition ratio of 3 atomic% Pt to 97 atomic% AlN, then, were mixed, calcinated, pulverized, and pressure-baked. Thus, a Pt-AlN mixture sintered target was obtained. The Pt-AlN sintered compact had the density of 2.0 g/cm³.

0126Similarly to the Example 1, a N₂ flow rate was set to 100 sccm, and a Pt-AlN mixture-nitrided film was formed with varied total pressures. Then, the obtained film had resistivity shown in FIG. 5.

0127Thus produced Pt-AlN mixture-nitrided film was analyzed with the use of an RBS (Rutherford backscattering) method, and was proved to have the composition shown in Table 3. In addition, the Pt-AlN mixture-nitrided film had the density of 2.8 g/cm³.

(Comparative Example 1)

Comparison with binary target: Pt = 5 atomic% nitrided film

0128The targets made of elemental Pt and elemental Al were separately prepared. Similarly to the Example 1, a Pt target and an Al target were each installed as the target of a high-frequency sputtering apparatus. Under the conditions of the total pressure of 0.2 Pa and the N₂ flow rate of 100 sccm, the power for electrifying each target was adjusted. The film was formed so as to acquire the same Pt content (Pt = 2.5 atomic%) as the formed film with the use of the Pt = 5 atomic% Pt-Al target.

0129The films were repeatedly formed under thus adjusted equal conditions, but the produced Pt-Al mixture-nitrided film had varied resistivities as are shown in FIG. 6.

(Comparative Example 2)

Comparison with binary target: Pt = 3 atomic% nitrided film

0130The targets made of elemental Pt and elemental Al were separately prepared. Similarly to the Example 1, a Pt target and an Al target were each installed as the target of a high-frequency sputtering apparatus. Under the conditions of the total pressure of 0.2 Pa and the N₂ flow rate of 100 sccm, the power for electrifying each target was adjusted. The conditions were adjusted so that the film could acquire the same Pt content (Pt = 0.8 atomic%) as the formed film with the use of a Pt = 3 atomic% Pt-Al target.

0131The films were repeatedly formed under thus adjusted equal conditions, but the produced Pt-Al mixture-nitrided film had the variation of resistivities as shown in FIG. 6.

(Example 5)

0132As a target used for a high-frequency sputtering apparatus shown in FIG. 2, a Pt-Al mixture target having the composition ratio of 2 atomic% Pt to 98 atomic% Al and the diameter of 8 inches produced in the manner of Example 1 was installed. Under the nitrogen/argon mixed gas flow rate of N₂ = 70 sccm and Ar = 30 sccm and the sputtering pressure of 1.0 Pa, the above described Pt-Al mixture target was sputtered with the high-frequency electrification power of 2,400 W.

0133A glass substrate was introduced into a film-forming chamber, and a film was formed on it. Sputtering time was 30 minutes. Thus obtained resistive film had the film thickness of 200 nm, and the resistivity of 2×10⁹ Ωcm.

0134Thus produced Pt-Al mixture-nitrided film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum nitride through a TEM (transmission electron microscope), and showed the diameter of 0.4 nm.

(Example 6)

0135A Pt-Al mixture target was set which had the composition ratio of 2 atomic% Pt to 98 atomic% Al, and the diameter of 8 inches. Under the nitrogen/argon mixed gas flow rate of N₂=70 sccm and Ar=30 sccm and the sputtering pressure of 0.5 Pa, the above described Pt-Al mixture target was sputtered with the high-frequency electrification power of 2,400 W.

0136A glass substrate was introduced into a film-forming chamber, and the film was formed on it. After the sputtering time of 25 minutes, a resistive film having the thickness of 200 nm was obtained. The obtained resistive film had the resistivity of 1×10⁹ Ωcm.

0137Thus produced Pt-Al mixture-nitrided film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum nitride through a TEM (transmission electron microscope), and showed the average particle diameter of 0.5 nm.

(Example 7)

0138A Pt-Al mixture target was set which had the composition ratio of 2 atomic% Pt to 98 atomic% Al, and the diameter of 8 inches. Under the nitrogen/argon mixed gas flow rate of N₂=70 sccm and Ar=30 sccm and the sputtering pressure of 0.3 Pa, the above described Pt-Al mixture target was sputtered with the high-frequency electrification power of 2,400 W.

0139A glass substrate was introduced into a film-forming chamber, and the film was formed on it. After the sputtering time of 20 minutes, a resistive film having the thickness of 200 nm was obtained. The obtained resistive film had the resistivity of 8×10⁸ Ωcm.

0140Thus produced Pt-Al mixture-nitrided film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum nitride through a TEM (transmission electron microscope), and showed the average particle diameter of 0.6 nm.

(Example 8)

0141A Pt-Al mixture target was set which had the composition ratio of 30 atomic% Pt to 70 atomic% Al, and the diameter of 8 inches. Under the nitrogen/argon mixed gas flow rate of N₂=70 sccm and Ar=30 sccm and the sputtering pressure of 1.0 Pa, the above described Pt-Al mixture target was sputtered with the high-frequency electrification power of 2,400 W.

0142A glass substrate was introduced into a film-forming chamber, and the film was formed on it. After the sputtering time of 30 minutes, a resistive film having the thickness of 200 nm was obtained. The obtained resistive film had the resistivity of 1×10⁴ Ωcm.

0143Thus produced Pt-Al mixture-nitrided film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum nitride through a TEM (transmission electron microscope), and showed the average particle diameter of 9 nm.

(Example 9)

0144A Pt-Al mixture target was set which had the composition ratio of 30 atomic% Pt to 70 atomic% Al, and the diameter of 8 inches. Under the nitrogen/argon mixed gas flow rate of N₂=70 sccm and Ar=30 sccm and the sputtering pressure of 0.5 Pa, the above described Pt-Al mixture target was sputtered with the high-frequency electrification power of 2,400 W.

0145A glass substrate was introduced into a film-forming chamber, and the film was formed on it. After the sputtering time of 25 minutes, a resistive film having the thickness of 200 nm was obtained. The obtained resistive film had the resistivity of 1×10⁴ Ωcm.

0146Thus produced Pt-Al mixture-nitrided film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum nitride through a TEM (transmission electron microscope), and showed the average particle diameter of 10 nm.

(Example 10)

0147A Pt-Al mixture target was set which had the composition ratio of 30 atomic% Pt to 70 atomic% Al, and the diameter of 8 inches. Under the nitrogen/argon mixed gas flow rate of N₂=70 sccm and Ar=30 sccm and the sputtering pressure of 0.3 Pa, the above described Pt-Al mixture target was sputtered with the high-frequency electrification power of 2,400 W.

0148A glass substrate was introduced into a film-forming chamber, and the film was formed on it. After the sputtering time of 20 minutes, a resistive film having the thickness of 200 nm was obtained. The obtained resistive film had the resistivity of 1x10⁰ Ωcm.

0149Thus produced Pt-Al mixture-nitrided film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum nitride through a TEM (transmission electron microscope), and showed the average particle diameter of 11 nm.

(Example 11)

0150A film was formed with the use of a Pt-Al mixture target having the composition ratio of 2 atomic% Pt to 98 atomic% Al and the diameter of 8 inches, at the nitrogen-gas flow rate of N₂=100 sccm. A sputtering pressure was set to 1.0 Pa, and an electrification power to 2,400 W.

0151After the sputtering time of 70 minutes, a resistive film having the thickness of 200 nm was obtained. The resistive film had the resistivity of 1×10¹¹ Ωcm.

0152Thus produced Pt-Al mixture-nitrided film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum nitride through a TEM (transmission electron microscope), and showed the average particle diameter of 0.8 nm.

(Example 12)

0153A film was formed with the use of a Pt-Al mixture target having the composition ratio of 2 atomic% Pt to 98 atomic% Al and the diameter of 8 inches, at the nitrogen-gas flow rate of N₂=100 sccm. A sputtering pressure was set to 0.5 Pa, and an electrification power to 2,400 W.

0154After the sputtering time of 65 minutes, a resistive film having the film thickness of 200 nm was obtained. The resistive film had the resistivity of 1×10¹¹ Ωcm.

0155Thus produced Pt-Al mixture-nitrided film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum nitride through a TEM (transmission electron microscope), and showed the average particle diameter of 1 nm.

(Example 13)

0156A film was formed with the use of a Pt-Al mixture target having the composition ratio of 2 atomic% Pt to 98 atomic% Al and the diameter of 8 inches, at the nitrogen-gas flow rate of N₂=100 sccm. A sputtering pressure was set to 0.3 Pa, and an electrification power to 2,400 W.

0157After the sputtering time of 60 minutes, a resistive film having the film thickness of 200 nm was obtained. The resistive film had the resistivity of 8×10¹⁰ Ωcm.

0158Thus produced Pt-Al mixture-nitrided film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum nitride through a TEM (transmission electron microscope), and showed the diameter of 2 nm.

(Example 14)

0159A film was formed with the use of a Pt-Al mixture target having the composition ratio of 30 atomic% Pt to 70 atomic% Al and the diameter of 8 inches, at the nitrogen-gas flow rate of N₂=100 sccm. A sputtering pressure was set to 1.0 Pa, and an electrification power to 2,400 W.

0160After the sputtering time of 70 minutes, a resistive film having the thickness of 200 nm was obtained. The resistive film had the resistivity of 1×10⁴ Ωcm.

0161Thus produced Pt-Al mixture-nitrided film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum nitride through a TEM (transmission electron microscope), and showed the average particle diameter of 9 nm.

(Example 15)

0162A film was formed with the use of a Pt-Al mixture target having the composition ratio of 30 atomic% Pt to 70 atomic% Al and the diameter of 8 inches, at the nitrogen-gas flow rate of N₂=100 sccm. A sputtering pressure was set to 0.5 Pa, and an electrification power to 2,400 W.

0163After the sputtering time of 65 minutes, a resistive film having the film thickness of 200 nm was obtained. The resistive film had the resistivity of 1×10⁴ Ωcm.

0164Thus produced Pt-Al mixture-nitrided film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum nitride through a TEM (transmission electron microscope), and showed the average particle diameter of 10 nm.

(Example 16)

0165A film was formed with the use of a Pt-Al mixture target having the composition ratio of 30 atomic% Pt to 70 atomic% Al and the diameter of 8 inches, at the nitrogen-gas flow rate of N₂=100 sccm. A sputtering pressure was set to 0.3 Pa, and an electrification power to 2,400 W.

0166After the sputtering time of 60 minutes, a resistive film having the film thickness of 200 nm was obtained. The resistive film had the resistivity of 1×10² Ωcm.

0167Thus produced Pt-Al mixture-nitrided film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum nitride through a TEM (transmission electron microscope), and showed the average particle diameter of 11 nm.

(Example 17)

0168A Pt-Al mixture target was set which had the composition ratio of 2 atomic% Pt to 98 atomic% Al, and the diameter of 8 inches. Under the oxygen gas flow rate of O₂=100 sccm and the sputtering pressure of 1.0 Pa, the above described Pt-Al mixture target was sputtered with the high-frequency electrification power of 2,400 W.

0169A glass substrate was introduced into a film-forming chamber, and the film was formed on it. After the sputtering time of 70 minutes, a resistive film having the thickness of 200 nm was obtained. The obtained resistive film had the resistivity of 5×10¹¹ Ωcm.

0170Thus produced Pt-Al mixture-oxidized film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum oxide through a TEM (transmission electron microscope), and showed the average particle diameter of 0.4 nm.

(Example 18)

0171A Pt-Al mixture target was set which had the composition ratio of 2 atomic% Pt to 98 atomic% Al, and the diameter of 8 inches. Under the oxygen gas flow rate of O₂=100 sccm and the sputtering pressure of 0.5 Pa, the above described Pt-Al mixture target was sputtered with the high-frequency electrification power of 2,400 W.

0172A glass substrate was introduced into a film-forming chamber, and the film was formed on it. After the sputtering time of 65 minutes, a resistive film having the film thickness of 200 nm was obtained. The obtained resistive film had the resistivity of 1×10¹¹ Ωcm.

0173Thus produced Pt-Al mixture-oxidized film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum oxide through a TEM (transmission electron microscope), and showed the average particle diameter of 0.5 nm.

(Example 19)

0174A Pt-Al mixture target was set which had the composition ratio of 2 atomic% Pt to 98 atomic% Al, and the diameter of 8 inches. Under the oxygen gas flow rate of O₂=100 sccm and the sputtering pressure of 0.3 Pa, the above described Pt-Al mixture target was sputtered with the high-frequency electrification power of 2,400 W.

0175A glass substrate was introduced into a film-forming chamber, and the film was formed on it. After the sputtering time of 60 minutes, a resistive film having the film thickness of 200 nm was obtained. The obtained resistive film had the resistivity of 1×10¹¹ Ωcm.

0176Thus produced Pt-Al mixture-oxidized film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum oxide through a TEM (transmission electron microscope), and showed the average particle diameter of 0.6 nm.

(Example 20)

0177A Pt-Al mixture target was set which had the composition ratio of 30 atomic% Pt to 70 atomic% Al, and the diameter of 8 inches. Under the oxygen gas flow rate of O₂=100 sccm and the sputtering pressure of 1.0 Pa, the above described Pt-Al mixture target was sputtered with the high-frequency electrification power of 2,400 W.

0178A glass substrate was introduced into a film-forming chamber, and the film was formed on it. After the sputtering time of 70 minutes, a resistive film having the thickness of 200 nm was obtained. The obtained resistive film had the resistivity of 1×10⁸ Ωcm.

0179Thus produced Pt-Al mixture-oxidized film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum oxide through a TEM (transmission electron microscope), and showed the diameter of 8 nm.

(Example 21)

0180A Pt-Al mixture target was set which had the composition ratio of 30 atomic% Pt to 70 atomic% Al, and the diameter of 8 inches. Under the oxygen gas flow rate of O₂=100 sccm and the sputtering pressure of 0.5 Pa, the above described Pt-Al mixture target was sputtered with the high-frequency electrification power of 2,400 W.

0181A glass substrate was introduced into a film-forming chamber, and the film was formed on it. After the sputtering time of 65 minutes, a resistive film having the film thickness of 200 nm was obtained. The obtained resistive film had the resistivity of 1×10⁷ Ωcm.

0182Thus produced Pt-Al mixture-oxidized film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum oxide through a TEM (transmission electron microscope), and showed the average particle diameter of 9 nm.

(Example 22)

0183A Pt-Al mixture target was set which had the composition ratio of 30 atomic% Pt to 70 atomic% Al, and the diameter of 8 inches. Under the oxygen gas flow rate of O₂=100 sccm and the sputtering pressure of 0.3 Pa, the above described Pt-Al mixture target was sputtered with the high-frequency electrification power of 2,400 W.

0184A glass substrate was introduced into a film-forming chamber, and the film was formed on it. After the sputtering time of 60 minutes, a resistive film having the film thickness of 200 nm was obtained. The obtained resistive film had the resistivity of 1×10⁶ Ωcm.

0185Thus produced Pt-Al mixture-oxidized film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum oxide through a TEM (transmission electron microscope), and showed the average particle diameter of 10 nm.

(Example 23)

0186A film was formed with the use of a Pt-Al mixture target having the composition ratio of 2 atomic% Pt to 98 atomic% Al, and the diameter of 8 inches. The film was formed at the oxygen/nitrogen mixed gas flow rate of O₂=2 sccm and N₂=98 sccm. A sputtering pressure was set to 1.0 Pa, and an electrification power to 2,400 W.

0187After the sputtering time of 35 minutes, a resistive film having the film thickness of 200 nm was obtained. The obtained resistive film had the resistivity of 2×10¹² Ωcm.

0188Thus produced Pt-Al mixture-nitrided/oxidized film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum nitride and aluminum oxide through a TEM (transmission electron microscope), and showed the average particle diameter of 0.4 nm.

(Example 24)

0189A film was formed with the use of a Pt-Al mixture target having the composition ratio of 2 atomic% Pt to 98 atomic% Al, and the diameter of 8 inches. The film was formed at the oxygen/nitrogen mixed gas flow rate of O₂=2 sccm and N₂=98 sccm. A sputtering pressure was set to 0.5 Pa, and an electrification power to 2,400 W.

0190After the sputtering time of 30 minutes, a resistive film having the thickness of 200 nm was obtained. The obtained resistive film had the resistivity of 1×10¹¹ Ωcm.

0191Thus produced Pt-Al mixture-nitrided/oxidized film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum nitride and aluminum oxide through a TEM (transmission electron microscope), and showed the average particle diameter of 0.5 nm.

(Example 25)

0192A film was formed with the use of a Pt-Al mixture target having the composition ratio of 2 atomic% Pt to 98 atomic% Al, and the diameter of 8 inches. The film was formed at the oxygen/nitrogen mixed gas flow rate of O₂=2 sccm and N₂=98 sccm. A sputtering pressure was set to 0.3 Pa, and an electrification power to 2,400 W.

0193The sputtering time was 25 minutes. Then, a resistive film having the film thickness of 200 nm was obtained. The obtained resistive film had the resistivity of 1×10¹¹ Ωcm.

0194Thus produced Pt-Al mixture-nitrided/oxidized film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum nitride and aluminum oxide through a TEM (transmission electron microscope), and showed the average particle diameter of 0.6 nm.

(Example 26)

0195A film was formed with the use of a Pt-Al mixture target having the composition ratio of 30 atomic% Pt to 70 atomic% Al, and the diameter of 8 inches. The film was formed at the oxygen/nitrogen mixed gas flow rate of O₂=2 sccm and N₂=98 sccm. A sputtering pressure was set to 1.0 Pa, and an electrification power to 2,400 W.

0196After the sputtering time of 35 minutes, a resistive film having the film thickness of 200 nm was obtained. The obtained resistive film had the resistivity of 1×10⁵ Ωcm.

0197Thus produced Pt-Al mixture-nitrided/oxidized film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum nitride and aluminum oxide through a TEM (transmission electron microscope), and showed the average particle diameter of 9 nm.

(Example 27)

0198A film was formed with the use of a Pt-Al mixture target having the composition ratio of 30 atomic% Pt to 70 atomic% Al, and the diameter of 8 inches. The film was formed at the oxygen/nitrogen mixed gas flow rate of O₂=2 sccm and N₂=98 sccm. A sputtering pressure was set to 0.5 Pa, and an electrification power to 2,400 W.

0199After the sputtering time of 30 minutes, a resistive film having the thickness of 200 nm was obtained. The obtained resistive film had the resistivity of 1×10⁴ Ωcm.

0200Thus produced Pt-Al mixture-nitrided/oxidized film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum nitride and aluminum oxide through a TEM (transmission electron microscope), and showed the average particle diameter of 10 nm.

(Example 28)

0201A film was formed with the use of a Pt-Al mixture target having the composition ratio of 30 atomic% Pt to 70 atomic% Al, and the diameter of 8 inches. The film was formed at the oxygen/nitrogen mixed gas flow rate of O₂=2 sccm and N₂=98 sccm. A sputtering pressure was set to 0.3 Pa, and an electrification power to 2,400 W.

0202After the sputtering time of 25 minutes, a resistive film having the thickness of 200 nm was obtained. The obtained resistive film had the resistivity of 5×10³ Ωcm.

0203Thus produced Pt-Al mixture-nitrided/oxidized film was subjected to the measurement of the average particle diameter of platinum particles dispersed in the medium of aluminum nitride and aluminum oxide through a TEM (transmission electron microscope), and showed the average particle diameter of 11 nm.

0204A spacer substrate was prepared by forming each resistive film shown in the above described samples 5 to 28 as an antistatic film on a glass substrate, and was used as a spacer in a picture display unit using the surface conduction electron-emitting device, which is the present embodiment. The influence of the spacer on an image was evaluated by measuring the deviation of an electron beam ΔL.

0205A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing platinum particles with diameters in a range of 0.5 to 10 nm, showed the deviation of an electron beam ΔL of 3% or less (0.03L or less) and an adequate display image.

0206A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing platinum particles with diameters in a range of 1 to 9 nm, showed the deviation of an electron beam ΔL of 1% or less (0.01L or less) and a particularly adequate display image.

0207The results are shown in Table 4. <tables id="tabl0004" num="0004"><img file="EP1557863A2_D0002.tif" /></tables>

(Example 29)

0208A film was formed with the use of a Pt-Ge mixture target prepared so as to have an adjusted composition ratio and the diameter of 8 inches.

0209The following 4 kinds of gas types were used in order to form the film: a nitrogen/Ar mixed gas, nitrogen gas, oxygen gas and an oxygen/nitrogen mixed gas. A sputtering pressure was set to 0.3 Pa to 1.5 Pa, and an electrification power to 2,400 W.

0210A sputtering time of period was appropriately adjusted so that film thickness can be 200 nm.

0211The resistivities of these resistive films were measured. In addition, by using a TEM (transmission electron microscope), an average particle diameter of platinum particles in a medium was determined.

0212A spacer substrate was prepared by forming each resistive film on a glass substrate, and was used as a spacer in a picture display unit using a surface conduction electron-emitting device, which is the present embodiment. The influence of the spacer on an image was evaluated by measuring the deviation of an electron beam ΔL.

0213A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing platinum particles with diameters in a range of 0.5 to 10 nm, showed the deviation of an electron beam ΔL of 3% or less (0.03L or less) and an adequate display image.

0214A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing platinum particles with diameters in a range of 1 to 9 nm, showed the deviation of an electron beam ΔL of 1% or less (0.01L or less) and a particularly adequate display image.

0215The results are shown in Table 5. <tables id="tabl0005" num="0005"><table frame="all"><title>Table 5</title><tgroup cols="6" colsep="1" rowsep="1"><colspec colnum="1" colname="col1" colwidth="26.25mm" /><colspec colnum="2" colname="col2" colwidth="26.25mm" /><colspec colnum="3" colname="col3" colwidth="26.25mm" /><colspec colnum="4" colname="col4" colwidth="26.25mm" /><colspec colnum="5" colname="col5" colwidth="26.25mm" /><colspec colnum="6" colname="col6" colwidth="26.25mm" /><thead valign="top"><row><entry namest="col1" nameend="col1" /><entry namest="col2" nameend="col2" align="center">Film type</entry><entry namest="col3" nameend="col3" align="center">Gas type</entry><entry namest="col4" nameend="col4" align="center">Resistivity [Ωcm]</entry><entry namest="col5" nameend="col5" align="center">Average particle diameter [nm]</entry><entry namest="col6" nameend="col6" align="center">Image evaluation</entry></row></thead><tbody valign="top"><row><entry namest="col1" nameend="col1" morerows="11" align="center">Example 29</entry><entry namest="col2" nameend="col2" morerows="2" align="center">Pt-Ge-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/Ar</entry><entry namest="col4" nameend="col4" align="center">2.E+09</entry><entry namest="col5" nameend="col5" align="center">0.4</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+09</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">5.E+04</entry><entry namest="col5" nameend="col5" align="center">9</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Pt-Ge-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">8.E+10</entry><entry namest="col5" nameend="col5" align="center">1</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">8.E+04</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Pt-Ge-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+14</entry><entry namest="col5" nameend="col5" align="center">0.3</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+08</entry><entry namest="col5" nameend="col5" align="center">9</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+07</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Pt-Ge-N-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.6</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+04</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row rowsep="1"><entry namest="col4" nameend="col4" align="center">5.E+03</entry><entry namest="col5" nameend="col5" align="center">11</entry><entry namest="col6" nameend="col6" align="center">×</entry></row></tbody></tgroup></table></tables>

(Example 30)

0216A film was formed with the use of a Pt-Si mixture target prepared so as to have an adjusted composition ratio and the diameter of 8 inches.

0217The following 4 kinds of gas types were used in order to form the film: a nitrogen/Ar mixed gas, nitrogen gas, oxygen gas and an oxygen/nitrogen mixed gas. A sputtering pressure was set to 0.3 to 1.5 Pa, and an electrification power to 2,400 W.

0218A sputtering time of period was appropriately adjusted so that film thickness can be 200 nm.

0219The resistivities of these resistive films were measured. In addition, by using a TEM (transmission electron microscope), an average particle diameter of platinum particles in a medium was determined.

0220A spacer substrate was prepared by forming each resistive film on a glass substrate, and was used as a spacer in a picture display unit using the surface conduction electron-emitting device, which is the present embodiment.

0221The influence of the spacer on an image was evaluated by measuring the deviation of an electron beam ΔL.

0222A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing platinum particles with diameters in a range of 0.5 to 10 nm, showed the deviation of an electron beam ΔL of 3% or less (0.03L or less) and an adequate display image.

0223A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing platinum particles with diameters in a range of 1 to 9 nm, showed the deviation of an electron beam ΔL of 1% or less (0.01L or less) and a particularly adequate display image.

0224The results are shown in Table 6. <tables id="tabl0006" num="0006"><table frame="all"><title>Table 6</title><tgroup cols="6" colsep="1" rowsep="1"><colspec colnum="1" colname="col1" colwidth="26.25mm" /><colspec colnum="2" colname="col2" colwidth="26.25mm" /><colspec colnum="3" colname="col3" colwidth="26.25mm" /><colspec colnum="4" colname="col4" colwidth="26.25mm" /><colspec colnum="5" colname="col5" colwidth="26.25mm" /><colspec colnum="6" colname="col6" colwidth="26.25mm" /><thead valign="top"><row><entry namest="col1" nameend="col1" /><entry namest="col2" nameend="col2" align="center">Film type</entry><entry namest="col3" nameend="col3" align="center">Gas type</entry><entry namest="col4" nameend="col4" align="center">Resistivity [Ωcm]</entry><entry namest="col5" nameend="col5" align="center">Average particle diameter [nm]</entry><entry namest="col6" nameend="col6" align="center">Image evaluation</entry></row></thead><tbody valign="top"><row><entry namest="col1" nameend="col1" morerows="11" align="center">Example 30</entry><entry namest="col2" nameend="col2" morerows="2" align="center">Pt-Si-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/Ar</entry><entry namest="col4" nameend="col4" align="center">1.E+09</entry><entry namest="col5" nameend="col5" align="center">0.4</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">5.E+08</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">3.E+04</entry><entry namest="col5" nameend="col5" align="center">9</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Pt-Si-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">4.E+10</entry><entry namest="col5" nameend="col5" align="center">1</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">4.E+04</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Pt-Si-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+14</entry><entry namest="col5" nameend="col5" align="center">0.4</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+08</entry><entry namest="col5" nameend="col5" align="center">9</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+07</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Pt-Si-N-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/O₂</entry><entry namest="col4" nameend="col4" align="center">5.E+11</entry><entry namest="col5" nameend="col5" align="center">0.4</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+04</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row rowsep="1"><entry namest="col4" nameend="col4" align="center">3.E+03</entry><entry namest="col5" nameend="col5" align="center">11</entry><entry namest="col6" nameend="col6" align="center">×</entry></row></tbody></tgroup></table></tables>

(Example 31)

0225A film was formed with the use of a Pt-Mg mixture target prepared so as to have an adjusted composition ratio and the diameter of 8 inches.

0226The following 4 kinds of gas types were used in order to form the film: a nitrogen/Ar mixed gas, nitrogen gas, oxygen gas and an oxygen/nitrogen mixed gas. A sputtering pressure was set to 0.3 to 1.5 Pa, and an electrification power to 2,400 W.

0227A sputtering time of period was appropriately adjusted so that film thickness can be 200 nm.

0228The resistivities of these resistive films were measured. In addition, by using a TEM (transmission electron microscope), an average particle diameter of platinum particles in a medium was determined.

0229A spacer substrate was prepared by forming each resistive film on a glass substrate, and was used as a spacer in a picture display unit using the surface conduction electron-emitting device, which is the present embodiment.

0230The influence of the spacer on an image was evaluated by measuring the deviation of an electron beam ΔL.

0231A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing platinum particles with diameters in a range of 0.5 to 10 nm, showed the deviation of an electron beam ΔL of 3% or less (0.03L or less) and an adequate display image.

0232A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing platinum particles with diameters in a range of 1 to 9 nm, showed the deviation of an electron beam ΔL of 1% or less (0.01L or less) and a particularly adequate display image.

0233The results are shown in Table 7. <tables id="tabl0007" num="0007"><table frame="all"><title>Table 7</title><tgroup cols="6" colsep="1" rowsep="1"><colspec colnum="1" colname="col1" colwidth="26.25mm" /><colspec colnum="2" colname="col2" colwidth="26.25mm" /><colspec colnum="3" colname="col3" colwidth="26.25mm" /><colspec colnum="4" colname="col4" colwidth="26.25mm" /><colspec colnum="5" colname="col5" colwidth="26.25mm" /><colspec colnum="6" colname="col6" colwidth="26.25mm" /><thead valign="top"><row><entry namest="col1" nameend="col1" /><entry namest="col2" nameend="col2" align="center">Film type</entry><entry namest="col3" nameend="col3" align="center">Gas type</entry><entry namest="col4" nameend="col4" align="center">Resistivity [Ωcm]</entry><entry namest="col5" nameend="col5" align="center">Average particle diameter [nm]</entry><entry namest="col6" nameend="col6" align="center">Image evaluation</entry></row></thead><tbody valign="top"><row><entry namest="col1" nameend="col1" morerows="11" align="center">Example 31</entry><entry namest="col2" nameend="col2" morerows="2" align="center">Pt-Mg-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/Ar</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.3</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">5.E+10</entry><entry namest="col5" nameend="col5" align="center">0.8</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+04</entry><entry namest="col5" nameend="col5" align="center">8</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Pt-Mg-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">4.E+10</entry><entry namest="col5" nameend="col5" align="center">1</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+04</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Pt-Mg-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+14</entry><entry namest="col5" nameend="col5" align="center">0.2</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+08</entry><entry namest="col5" nameend="col5" align="center">4</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+07</entry><entry namest="col5" nameend="col5" align="center">5</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Pt-Mg-N-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/O₂</entry><entry namest="col4" nameend="col4" align="center">6.E+05</entry><entry namest="col5" nameend="col5" align="center">8</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+09</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row rowsep="1"><entry namest="col4" nameend="col4" align="center">3.E+03</entry><entry namest="col5" nameend="col5" align="center">12</entry><entry namest="col6" nameend="col6" align="center">×</entry></row></tbody></tgroup></table></tables>

(Example 32)

0234A film was formed with the use of an Au-Al mixture target having a composition ratio adjusted so as to comprise gold for a particle material, and aluminum nitride, aluminum oxide or aluminum nitride/oxide for a medium, and having the diameter of 8 inches.

0235The following 4 kinds of gas types were used in order to form the film: a nitrogen/Ar mixed gas, nitrogen gas, oxygen gas and an oxygen/nitrogen mixed gas. A sputtering pressure was set to 0.3 to 1.5 Pa, and an electrification power to 2,400 W.

0236A sputtering time of period was appropriately adjusted so that film thickness can be 200 nm.

0237The resistivities of these resistive films were measured. In addition, by using a TEM (transmission electron microscope), an average particle diameter of gold particles in a medium was determined.

0238A spacer substrate was prepared by forming each resistive film on a glass substrate, and was used as a spacer in a picture display unit using the surface conduction electron-emitting device, which is the present embodiment.

0239The influence of the spacer on an image was evaluated by measuring the deviation of an electron beam ΔL.

0240A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing gold particles with diameters in a range of 0.5 to 10 nm, showed the deviation of an electron beam ΔL of 3% or less (0.03L or less) and an adequate display image.

0241A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing gold particles with diameters in a range of 1 to 9 nm, showed the deviation of an electron beam ΔL of 1% or less (0.01L or less) and a particularly adequate display image.

0242The results are shown in Table 8. <tables id="tabl0008" num="0008"><table frame="all"><title>Table 8</title><tgroup cols="6" colsep="1" rowsep="1"><colspec colnum="1" colname="col1" colwidth="26.25mm" /><colspec colnum="2" colname="col2" colwidth="26.25mm" /><colspec colnum="3" colname="col3" colwidth="26.25mm" /><colspec colnum="4" colname="col4" colwidth="26.25mm" /><colspec colnum="5" colname="col5" colwidth="26.25mm" /><colspec colnum="6" colname="col6" colwidth="26.25mm" /><thead valign="top"><row><entry namest="col1" nameend="col1" /><entry namest="col2" nameend="col2" align="center">Film type</entry><entry namest="col3" nameend="col3" align="center">Gas type</entry><entry namest="col4" nameend="col4" align="center">Resistivity [Ωcm]</entry><entry namest="col5" nameend="col5" align="center">Average particle diameter [nm]</entry><entry namest="col6" nameend="col6" align="center">Image evaluation</entry></row></thead><tbody valign="top"><row><entry namest="col1" nameend="col1" morerows="11" align="center">Example 32</entry><entry namest="col2" nameend="col2" morerows="2" align="center">Au-Al-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/Ar</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+09</entry><entry namest="col5" nameend="col5" align="center">1</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">6.E+01</entry><entry namest="col5" nameend="col5" align="center">11</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Au-Al-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.6</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+04</entry><entry namest="col5" nameend="col5" align="center">9</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">9.E+02</entry><entry namest="col5" nameend="col5" align="center">12</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Au-Al-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+14</entry><entry namest="col5" nameend="col5" align="center">0.4</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+08</entry><entry namest="col5" nameend="col5" align="center">11</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+07</entry><entry namest="col5" nameend="col5" align="center">12</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Au-Al-N-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+12</entry><entry namest="col5" nameend="col5" align="center">0.4</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+04</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row rowsep="1"><entry namest="col4" nameend="col4" align="center">6.E+03</entry><entry namest="col5" nameend="col5" align="center">13</entry><entry namest="col6" nameend="col6" align="center">×</entry></row></tbody></tgroup></table></tables>

(Example 33)

0243A film was formed with the use of an Au-Ge mixture target having a composition ratio adjusted so as to comprise gold for a particle material, and germanium nitride, germanium oxide or germanium nitride/oxide for a medium, and having the diameter of 8 inches.

0244The following 4 kinds of gas types were used in order to form the film: a nitrogen/Ar mixed gas, nitrogen gas, oxygen gas and an oxygen/nitrogen mixed gas. A sputtering pressure was set to 0.3 to 1.5 Pa, and an electrification power to 2,400 W.

0245A sputtering time of period was appropriately adjusted so that film thickness can be 200 nm.

0246The resistivities of these resistive films were measured. In addition, by using a TEM (transmission electron microscope), an average particle diameter of gold particles in a medium was determined.

0247A spacer substrate was prepared by forming each resistive film on a glass substrate, and was used as a spacer in a picture display unit using the surface conduction electron-emitting device, which is the present embodiment.

0248The influence of the spacer on an image was evaluated by measuring the deviation of an electron beam ΔL.

0249A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing gold particles with diameters in a range of 0.5 to 10 nm, showed the deviation of an electron beam ΔL of 3% or less (0.03L or less) and an adequate display image.

0250A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing gold particles with diameters in a range of 1 to 9 nm, showed the deviation of an electron beam ΔL of 1% or less (0.01L or less) and a particularly adequate display image.

0251The results are shown in Table 9. <tables id="tabl0009" num="0009"><table frame="all"><title>Table 9</title><tgroup cols="6" colsep="1" rowsep="1"><colspec colnum="1" colname="col1" colwidth="26.25mm" /><colspec colnum="2" colname="col2" colwidth="26.25mm" /><colspec colnum="3" colname="col3" colwidth="26.25mm" /><colspec colnum="4" colname="col4" colwidth="26.25mm" /><colspec colnum="5" colname="col5" colwidth="26.25mm" /><colspec colnum="6" colname="col6" colwidth="26.25mm" /><thead valign="top"><row><entry namest="col1" nameend="col1" /><entry namest="col2" nameend="col2" align="center">Film type</entry><entry namest="col3" nameend="col3" align="center">Gas type</entry><entry namest="col4" nameend="col4" align="center">Resistivity [Ωcm]</entry><entry namest="col5" nameend="col5" align="center">Average particle diameter [nm]</entry><entry namest="col6" nameend="col6" align="center">Image evaluation</entry></row></thead><tbody valign="top"><row><entry namest="col1" nameend="col1" morerows="11" align="center">Example 33</entry><entry namest="col2" nameend="col2" morerows="2" align="center">Au-Ge-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/Ar</entry><entry namest="col4" nameend="col4" align="center">2.E+09</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+09</entry><entry namest="col5" nameend="col5" align="center">1</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">6.E+01</entry><entry namest="col5" nameend="col5" align="center">11</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Au-Ge-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+04</entry><entry namest="col5" nameend="col5" align="center">9</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">9.E+02</entry><entry namest="col5" nameend="col5" align="center">12</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Au-Ge-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+14</entry><entry namest="col5" nameend="col5" align="center">0.4</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+08</entry><entry namest="col5" nameend="col5" align="center">11</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+07</entry><entry namest="col5" nameend="col5" align="center">12</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Au-Ge-N-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.7</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+04</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row rowsep="1"><entry namest="col4" nameend="col4" align="center">6.E+03</entry><entry namest="col5" nameend="col5" align="center">13</entry><entry namest="col6" nameend="col6" align="center">×</entry></row></tbody></tgroup></table></tables>

(Example 34)

0252A film was formed with the use of an Au-Si mixture target having a composition ratio adjusted so as to comprise gold for a particle material, and silicon nitride, silicon oxide or silicon nitride/oxide for a medium, and having the diameter of 8 inches.

0253The following 4 kinds of gas types were used in order to form the film: a nitrogen/Ar mixed gas, nitrogen gas, oxygen gas and an oxygen/nitrogen mixed gas. A sputtering pressure was set to 0.3 to 1.5 Pa, and an electrification power to 2,400 W.

0254A sputtering time of period was appropriately adjusted so that film thickness can be 200 nm.

0255The resistivities of these resistive films were measured. In addition, by using a TEM (transmission electron microscope), an average particle diameter of gold particles in a medium was determined.

0256A spacer substrate was prepared by forming each resistive film on a glass substrate, and was used as a spacer in a picture display unit using the surface conduction electron-emitting device, which is the present embodiment.

0257The influence of the spacer on an image was evaluated by measuring the deviation of an electron beam ΔL.

0258A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing gold particles with diameters in a range of 0.5 to 10 nm, showed the deviation of an electron beam ΔL of 3% or less (0.03L or less) and an adequate display image.

0259A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing gold particles with diameters in a range of 1 to 9 nm, showed the deviation of an electron beam ΔL of 1% or less (0.01L or less) and a particularly adequate display image.

0260The results are shown in Table 10. <tables id="tabl0010" num="0010"><table frame="all"><title>Table 10</title><tgroup cols="6" colsep="1" rowsep="1"><colspec colnum="1" colname="col1" colwidth="26.25mm" /><colspec colnum="2" colname="col2" colwidth="26.25mm" /><colspec colnum="3" colname="col3" colwidth="26.25mm" /><colspec colnum="4" colname="col4" colwidth="26.25mm" /><colspec colnum="5" colname="col5" colwidth="26.25mm" /><colspec colnum="6" colname="col6" colwidth="26.25mm" /><thead valign="top"><row><entry namest="col1" nameend="col1" /><entry namest="col2" nameend="col2" align="center">Film type</entry><entry namest="col3" nameend="col3" align="center">Gas type</entry><entry namest="col4" nameend="col4" align="center">Resistivity [Ωcm]</entry><entry namest="col5" nameend="col5" align="center">Average particle diameter [nm]</entry><entry namest="col6" nameend="col6" align="center">Image evaluation</entry></row></thead><tbody valign="top"><row><entry namest="col1" nameend="col1" morerows="11" align="center">Example 34</entry><entry namest="col2" nameend="col2" morerows="2" align="center">Au-Si-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/Ar</entry><entry namest="col4" nameend="col4" align="center">1.E+09</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">6.E+08</entry><entry namest="col5" nameend="col5" align="center">1</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">3.E+01</entry><entry namest="col5" nameend="col5" align="center">11</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Au-Si-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+04</entry><entry namest="col5" nameend="col5" align="center">9</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">4.E+01</entry><entry namest="col5" nameend="col5" align="center">12</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Au-Si-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+14</entry><entry namest="col5" nameend="col5" align="center">0.4</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+08</entry><entry namest="col5" nameend="col5" align="center">7</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+07</entry><entry namest="col5" nameend="col5" align="center">8</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Au-Si-N-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.7</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+05</entry><entry namest="col5" nameend="col5" align="center">8</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row rowsep="1"><entry namest="col4" nameend="col4" align="center">1.E+04</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row></tbody></tgroup></table></tables>

(Example 35)

0261A film was formed with the use of an Au-Mg mixture target having a composition ratio adjusted so as to comprise gold for a particle material, and magnesium nitride, magnesium oxide or magnesium nitride/oxide for a medium, and having the diameter of 8 inches.

0262The following 4 kinds of gas types were used in order to form the film: a nitrogen/Ar mixed gas, nitrogen gas, oxygen gas and an oxygen/nitrogen mixed gas. A sputtering pressure was set to 0.3 to 1.5 Pa, and an electrification power to 2,400 W.

0263A sputtering time of period was appropriately adjusted so that film thickness can be 200 nm.

0264The resistivities of these resistive films were measured. In addition, by using a TEM (transmission electron microscope), an average particle diameter of gold particles in a medium was determined.

0265A spacer substrate was prepared by forming each resistive film on a glass substrate, and was used as a spacer in a picture display unit using the surface conduction electron-emitting device, which is the present embodiment.

0266The influence of the spacer on an image was evaluated by measuring the deviation of an electron beam ΔL.

0267A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing gold particles with diameters in a range of 0.5 to 10 nm, showed the deviation of an electron beam ΔL of 3% or less (0.03L or less) and an adequate display image.

0268A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing gold particles with diameters in a range of 1 to 9 nm, showed the deviation of an electron beam ΔL of 1% or less (0.01L or less) and a particularly adequate display image.

0269The results are shown in Table 11. <tables id="tabl0011" num="0011"><table frame="all"><title>Table 11</title><tgroup cols="6" colsep="1" rowsep="1"><colspec colnum="1" colname="col1" colwidth="26.25mm" /><colspec colnum="2" colname="col2" colwidth="26.25mm" /><colspec colnum="3" colname="col3" colwidth="26.25mm" /><colspec colnum="4" colname="col4" colwidth="26.25mm" /><colspec colnum="5" colname="col5" colwidth="26.25mm" /><colspec colnum="6" colname="col6" colwidth="26.25mm" /><thead valign="top"><row><entry namest="col1" nameend="col1" /><entry namest="col2" nameend="col2" align="center">Film type</entry><entry namest="col3" nameend="col3" align="center">Gas type</entry><entry namest="col4" nameend="col4" align="center">Resistivity [Ωcm]</entry><entry namest="col5" nameend="col5" align="center">Average particle diameter [nm]</entry><entry namest="col6" nameend="col6" align="center">Image evaluation</entry></row></thead><tbody valign="top"><row><entry namest="col1" nameend="col1" morerows="11" align="center">Example 35</entry><entry namest="col2" nameend="col2" morerows="2" align="center">Au-Mg-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/Ar</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.4</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">6.E+10</entry><entry namest="col5" nameend="col5" align="center">1</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+04</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Au-Mg-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">O</entry></row><row><entry namest="col4" nameend="col4" align="center">4.E+10</entry><entry namest="col5" nameend="col5" align="center">0.7</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+01</entry><entry namest="col5" nameend="col5" align="center">12</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Au-Mg-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+14&lt;&lt;</entry><entry namest="col5" nameend="col5" align="center">0,2</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+08</entry><entry namest="col5" nameend="col5" align="center">5</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+07</entry><entry namest="col5" nameend="col5" align="center">6</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Au-Mg-N-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/O₂</entry><entry namest="col4" nameend="col4" align="center">7.E+05</entry><entry namest="col5" nameend="col5" align="center">9</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+04</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row rowsep="1"><entry namest="col4" nameend="col4" align="center">3.E+03</entry><entry namest="col5" nameend="col5" align="center">14</entry><entry namest="col6" nameend="col6" align="center">×</entry></row></tbody></tgroup></table></tables>

(Example 36)

0270A film was formed with the use of an Ag-Al mixture target having a composition ratio adjusted so as to comprise silver for a particle material, and aluminum nitride, aluminum oxide or aluminum nitride/oxide for a medium, and having the diameter of 8 inches.

0271The following 4 kinds of gas types were used in order to form the film: a nitrogen/Ar mixed gas, nitrogen gas, oxygen gas and an oxygen/nitrogen mixed gas. A sputtering pressure was set to 0.3 to 1.5 Pa, and an electrification power to 2,400 W.

0272A sputtering time of period was appropriately adjusted so that film thickness can be 200 nm.

0273The resistivities of these resistive films were measured. In addition, by using a TEM (transmission electron microscope), an average particle diameter of silver particles in a medium was determined.

0274A spacer substrate was prepared by forming each resistive film on a glass substrate, and was used as a spacer in a picture display unit using the surface conduction electron-emitting device, which is the present embodiment.

0275The influence of the spacer on an image was evaluated by measuring the deviation of an electron beam ΔL.

0276A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing silver particles with diameters in a range of 0.5 to 10 nm, showed the deviation of an electron beam ΔL of 3% or less (0.03L or less) and an adequate display image.

0277A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing silver particles with diameters in a range of 1 to 9 nm, showed the deviation of an electron beam ΔL of 1% or less (0.01L or less) and a particularly adequate display image.

0278The results are shown in Table 12. <tables id="tabl0012" num="0012"><table frame="all"><title>Table 12</title><tgroup cols="6" colsep="1" rowsep="1"><colspec colnum="1" colname="col1" colwidth="26.25mm" /><colspec colnum="2" colname="col2" colwidth="26.25mm" /><colspec colnum="3" colname="col3" colwidth="26.25mm" /><colspec colnum="4" colname="col4" colwidth="26.25mm" /><colspec colnum="5" colname="col5" colwidth="26.25mm" /><colspec colnum="6" colname="col6" colwidth="26.25mm" /><thead valign="top"><row><entry namest="col1" nameend="col1" /><entry namest="col2" nameend="col2" align="center">Film type</entry><entry namest="col3" nameend="col3" align="center">Gas type</entry><entry namest="col4" nameend="col4" align="center">Resistivity [Ωcm]</entry><entry namest="col5" nameend="col5" align="center">Average particle diameter [nm]</entry><entry namest="col6" nameend="col6" align="center">Image</entry></row></thead><tbody valign="top"><row><entry namest="col1" nameend="col1" morerows="11" align="center">Example 36</entry><entry namest="col2" nameend="col2" morerows="2" align="center">Ag-Al-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/Ar</entry><entry namest="col4" nameend="col4" align="center">2.E+11</entry><entry namest="col5" nameend="col5" align="center">0.4</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+09</entry><entry namest="col5" nameend="col5" align="center">0.7</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+02</entry><entry namest="col5" nameend="col5" align="center">13</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Ag-Al-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+10</entry><entry namest="col5" nameend="col5" align="center">1</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+03</entry><entry namest="col5" nameend="col5" align="center">14</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Ag-Al-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+14</entry><entry namest="col5" nameend="col5" align="center">0.4</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+08</entry><entry namest="col5" nameend="col5" align="center">13</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+07</entry><entry namest="col5" nameend="col5" align="center">14</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Ag-Al-N-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/O₂</entry><entry namest="col4" nameend="col4" align="center">2.E+12</entry><entry namest="col5" nameend="col5" align="center">0.4</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+04</entry><entry namest="col5" nameend="col5" align="center">9</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row rowsep="1"><entry namest="col4" nameend="col4" align="center">1.E+09</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row></tbody></tgroup></table></tables>

(Example 37)

0279A film was formed with the use of an Ag-Ge mixture target having a composition ratio adjusted so as to comprise silver for a particle material, and germanium nitride, germanium oxide or germanium nitride/oxide for a medium, and having the diameter of 8 inches.

0280The following 4 kinds of gas types were used in order to form the film: a nitrogen/Ar mixed gas, nitrogen gas, oxygen gas and an oxygen/nitrogen mixed gas. A sputtering pressure was set to 0.3 to 1.5 Pa, and an electrification power to 2,400 W.

0281A sputtering time of period was appropriately adjusted so that film thickness can be 200 nm.

0282The resistivities of these resistive films were measured. In addition, by using a TEM (transmission electron microscope), an average particle diameter of silver particles in a medium was determined.

0283A spacer substrate was prepared by forming each resistive film on a glass substrate, and was used as a spacer in a picture display unit using the surface conduction electron-emitting device, which is the present embodiment.

0284The influence of the spacer on an image was evaluated by measuring the deviation of an electron beam ΔL.

0285A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing silver particles with diameters in a range of 0.5 to 10 nm, showed the deviation of an electron beam ΔL of 3% or less (0.03L or less) and an adequate display image.

0286A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing silver particles with diameters in a range of 1 to 9 nm, showed the deviation of an electron beam ΔL of 1% or less (0.01L or less) and a particularly adequate display image.

0287The results are shown in Table 13. <tables id="tabl0013" num="0013"><table frame="all"><title>Table 13</title><tgroup cols="6" colsep="1" rowsep="1"><colspec colnum="1" colname="col1" colwidth="26.25mm" /><colspec colnum="2" colname="col2" colwidth="26.25mm" /><colspec colnum="3" colname="col3" colwidth="26.25mm" /><colspec colnum="4" colname="col4" colwidth="26.25mm" /><colspec colnum="5" colname="col5" colwidth="26.25mm" /><colspec colnum="6" colname="col6" colwidth="26.25mm" /><thead valign="top"><row><entry namest="col1" nameend="col1" /><entry namest="col2" nameend="col2" align="center">Film type</entry><entry namest="col3" nameend="col3" align="center">Gas type</entry><entry namest="col4" nameend="col4" align="center">Resistivity [Ωcm]</entry><entry namest="col5" nameend="col5" align="center">Average particle diameter [nm]</entry><entry namest="col6" nameend="col6" align="center">Image valuation</entry></row></thead><tbody valign="top"><row><entry namest="col1" nameend="col1" morerows="11" align="center">Example 37</entry><entry namest="col2" nameend="col2" morerows="2" align="center">Ag-Ge-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/Ar</entry><entry namest="col4" nameend="col4" align="center">4.E+09</entry><entry namest="col5" nameend="col5" align="center">0.6</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+09</entry><entry namest="col5" nameend="col5" align="center">1</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+02</entry><entry namest="col5" nameend="col5" align="center">13</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Ag-Ge-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">5.E+04</entry><entry namest="col5" nameend="col5" align="center">9</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+03</entry><entry namest="col5" nameend="col5" align="center">14</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Ag-Ge-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+14</entry><entry namest="col5" nameend="col5" align="center">0.4</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+08</entry><entry namest="col5" nameend="col5" align="center">13</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+07</entry><entry namest="col5" nameend="col5" align="center">14</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Ag-Ge-N-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.9</entry><entry namest="col6" nameend="col6" align="center">O</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+04</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row rowsep="1"><entry namest="col4" nameend="col4" align="center">1.E+03</entry><entry namest="col5" nameend="col5" align="center">16</entry><entry namest="col6" nameend="col6" align="center">×</entry></row></tbody></tgroup></table></tables>

(Example 38)

0288A film was formed with the use of an Ag-Si mixture target having a composition ratio adjusted so as to comprise silver for a particle material, and silicon nitride, silicon oxide or silicon nitride/oxide for a medium, and having the diameter of 8 inches.

0289The following 4 kinds of gas types were used in order to form the film: a nitrogen/Ar mixed gas, nitrogen gas, oxygen gas and an oxygen/nitrogen mixed gas. A sputtering pressure was set to 0.3 to 1.5 Pa, and an electrification power to 2,400 W.

0290A sputtering time of period was appropriately adjusted so that film thickness can be 200 nm.

0291The resistivities of these resistive films were measured. In addition, by using a TEM (transmission electron microscope), an average particle diameter of silver particles in a medium was determined.

0292A spacer substrate was prepared by forming each resistive film on a glass substrate, and was used as a spacer in a picture display unit using the surface conduction electron-emitting device, which is the present embodiment.

0293The influence of the spacer on an image was evaluated by measuring the deviation of an electron beam ΔL.

0294A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing silver particles with diameters in a range of 0.5 to 10 nm, showed the deviation of an electron beam ΔL of 3% or less (0.03L or less) and an adequate display image.

0295A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing silver particles with diameters in a range of 1 to 9 nm, showed the deviation of an electron beam ΔL of 1% or less (0.01L or less) and a particularly adequate display image.

0296The results are shown in Table 14. <tables id="tabl0014" num="0014"><table frame="all"><title>Table 14</title><tgroup cols="6" colsep="1" rowsep="1"><colspec colnum="1" colname="col1" colwidth="26.25mm" /><colspec colnum="2" colname="col2" colwidth="26.25mm" /><colspec colnum="3" colname="col3" colwidth="26.25mm" /><colspec colnum="4" colname="col4" colwidth="26.25mm" /><colspec colnum="5" colname="col5" colwidth="26.25mm" /><colspec colnum="6" colname="col6" colwidth="26.25mm" /><thead valign="top"><row><entry namest="col1" nameend="col1" /><entry namest="col2" nameend="col2" align="center">Film type</entry><entry namest="col3" nameend="col3" align="center">Gas type</entry><entry namest="col4" nameend="col4" align="center">Resistivity[Ωcm]</entry><entry namest="col5" nameend="col5" align="left">Average particle diameter [nm]</entry><entry namest="col6" nameend="col6" align="center">Image evaluation</entry></row></thead><tbody valign="top"><row><entry namest="col1" nameend="col1" morerows="11" align="center">Example 38</entry><entry namest="col2" nameend="col2" morerows="2" align="center">Ag-Si-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/Ar</entry><entry namest="col4" nameend="col4" align="center">2.E+09</entry><entry namest="col5" nameend="col5" align="center">0.6</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+09</entry><entry namest="col5" nameend="col5" align="center">0.7</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">6.E+01</entry><entry namest="col5" nameend="col5" align="center">13</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Ag-Si-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂</entry><entry namest="col4" nameend="col4" align="center">1:E+11</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">8.E+10</entry><entry namest="col5" nameend="col5" align="center">1</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">8.E+01</entry><entry namest="col5" nameend="col5" align="center">14</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Ag-Si-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+14&lt;&lt;</entry><entry namest="col5" nameend="col5" align="center">0.7</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+08</entry><entry namest="col5" nameend="col5" align="center">8</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+07</entry><entry namest="col5" nameend="col5" align="center">9</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Ag-Si-N-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.9</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+04</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row rowsep="1"><entry namest="col4" nameend="col4" align="center">2.E+04</entry><entry namest="col5" nameend="col5" align="center">11</entry><entry namest="col6" nameend="col6" align="center">×</entry></row></tbody></tgroup></table></tables>

(Example 39)

0297A film was formed with the use of an Ag-Mg mixture target having a composition ratio adjusted so as to comprise silver for a particle material, and magnesium nitride, magnesium oxide or magnesium nitride/oxide for a medium, and having the diameter of 8 inches.

0298The following 4 kinds of gas types were used in order to form the film: a nitrogen/Ar mixed gas, nitrogen gas, oxygen gas and an oxygen/nitrogen mixed gas. A sputtering pressure was set to 0.3 to 1.5 Pa, and an electrification power to 2,400 W.

0299A sputtering time of period was appropriately adjusted so that film thickness can be 200 nm.

0300The resistivities of these resistive films were measured. In addition, by using a TEM (transmission electron microscope), an average particle diameter of silver particles in a medium was determined.

0301A spacer substrate was prepared by forming each resistive film on a glass substrate, and was used as a spacer in a picture display unit using the surface conduction electron-emitting device, which is the present embodiment.

0302The influence of the spacer on an image was evaluated by measuring the deviation of an electron beam ΔL.

0303A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing silver particles with diameters in a range of 0.5 to 10 nm, showed the deviation of an electron beam ΔL of 3% or less (0.03L or less) and an adequate display image.

0304A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing silver particles with diameters in a range of 1 to 9 nm, showed the deviation of an electron beam ΔL of 1% or less (0.01L or less) and a particularly adequate display image.

0305The results are shown in Table 15. <tables id="tabl0015" num="0015"><table frame="all"><title>Table 15</title><tgroup cols="6" colsep="1" rowsep="1"><colspec colnum="1" colname="col1" colwidth="26.25mm" /><colspec colnum="2" colname="col2" colwidth="26.25mm" /><colspec colnum="3" colname="col3" colwidth="26.25mm" /><colspec colnum="4" colname="col4" colwidth="26.25mm" /><colspec colnum="5" colname="col5" colwidth="26.25mm" /><colspec colnum="6" colname="col6" colwidth="26.25mm" /><thead valign="top"><row><entry namest="col1" nameend="col1" /><entry namest="col2" nameend="col2" align="center">Film type</entry><entry namest="col3" nameend="col3" align="center">Gas type</entry><entry namest="col4" nameend="col4" align="center">Resistivity [Ωcm]</entry><entry namest="col5" nameend="col5" align="center">Average particle diameter [nm]</entry><entry namest="col6" nameend="col6" align="center">Image evaluation</entry></row></thead><tbody valign="top"><row><entry namest="col1" nameend="col1" morerows="11" align="center">Example 39</entry><entry namest="col2" nameend="col2" morerows="2" align="center">Ag-Mg-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/Ar</entry><entry namest="col4" nameend="col4" align="center">2.E+11</entry><entry namest="col5" nameend="col5" align="center">0.4</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">1</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+04</entry><entry namest="col5" nameend="col5" align="center">12</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Ag-Mg-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">8.E+10</entry><entry namest="col5" nameend="col5" align="center">0.9</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">4.E+01</entry><entry namest="col5" nameend="col5" align="center">14</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Ag-Mg-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+14&lt;&lt;</entry><entry namest="col5" nameend="col5" align="center">0.3</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+08</entry><entry namest="col5" nameend="col5" align="center">6</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+07</entry><entry namest="col5" nameend="col5" align="center">7</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Ag-Mg-N-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+06</entry><entry namest="col5" nameend="col5" align="center">9</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+04</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row rowsep="1"><entry namest="col4" nameend="col4" align="center">6.E+03</entry><entry namest="col5" nameend="col5" align="center">17</entry><entry namest="col6" nameend="col6" align="center">×</entry></row></tbody></tgroup></table></tables>

(Example 40)

0306A film was formed with the use of a Ge-Al mixture target having a composition ratio adjusted so as to comprise germanium for a particle material, and aluminum nitride, aluminum oxide or aluminum nitride/oxide for a medium, and having the diameter of 8 inches.

0307The following 4 kinds of gas types were used in order to form the film: a nitrogen/Ar mixed gas, nitrogen gas, oxygen gas and an oxygen/nitrogen mixed gas. A sputtering pressure was set to 0.3 to 1.5 Pa, and an electrification power to 2,400 W.

0308A sputtering time of period was appropriately adjusted so that film thickness can be 200 nm.

0309The resistivities of these resistive films were measured. In addition, by using a TEM (transmission electron microscope), an average particle diameter of germanium particles in a medium was determined.

0310A spacer substrate was prepared by forming each resistive film on a glass substrate, and was used as a spacer in a picture display unit using the surface conduction electron-emitting device, which is the present embodiment.

0311The influence of the spacer on an image was evaluated by measuring the deviation of an electron beam ΔL.

0312A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing germanium particles with diameters in a range of 0.5 to 10 nm, showed the deviation of an electron beam ΔL of 3% or less (0.03L or less) and an adequate display image.

0313A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing germanium particles with diameters in a range of 1 to 9 nm, showed the deviation of an electron beam ΔL of 1% or less (0.01L or less) and a particularly adequate display image.

0314The results are shown in Table 16. <tables id="tabl0016" num="0016"><table frame="all"><title>Table 16</title><tgroup cols="6" colsep="1" rowsep="1"><colspec colnum="1" colname="col1" colwidth="26.25mm" /><colspec colnum="2" colname="col2" colwidth="26.25mm" /><colspec colnum="3" colname="col3" colwidth="26.25mm" /><colspec colnum="4" colname="col4" colwidth="26.25mm" /><colspec colnum="5" colname="col5" colwidth="26.25mm" /><colspec colnum="6" colname="col6" colwidth="26.25mm" /><thead valign="top"><row><entry namest="col1" nameend="col1" /><entry namest="col2" nameend="col2" align="center">Film type</entry><entry namest="col3" nameend="col3" align="center">Gas type</entry><entry namest="col4" nameend="col4" align="center">Resistivity [Ωcm]</entry><entry namest="col5" nameend="col5" align="center">Average particle diameter [nm]</entry><entry namest="col6" nameend="col6" align="center">Image evaluation</entry></row></thead><tbody valign="top"><row><entry namest="col1" nameend="col1" morerows="11" align="center">Example 40</entry><entry namest="col2" nameend="col2" morerows="2" align="center">Ge-Al-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/Ar</entry><entry namest="col4" nameend="col4" align="center">4.E+11</entry><entry namest="col5" nameend="col5" align="center">0.7</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">4.E+09</entry><entry namest="col5" nameend="col5" align="center">1</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+02</entry><entry namest="col5" nameend="col5" align="center">16</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Ge-Al-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">4.E+04</entry><entry namest="col5" nameend="col5" align="center">9</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">3.E+03</entry><entry namest="col5" nameend="col5" align="center">17</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Ge-Al-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+14&lt;&lt;</entry><entry namest="col5" nameend="col5" align="center">0.9</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">4.E+08</entry><entry namest="col5" nameend="col5" align="center">16</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">4.E+07</entry><entry namest="col5" nameend="col5" align="center">17</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Ge-Al-N-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">1</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+04</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row rowsep="1"><entry namest="col4" nameend="col4" align="center">2.E+04</entry><entry namest="col5" nameend="col5" align="center">12</entry><entry namest="col6" nameend="col6" align="center">×</entry></row></tbody></tgroup></table></tables>

(Example 41)

0315A film was formed with the use of a Ge-Si mixture target having a composition ratio adjusted so as to comprise germanium for a particle material, and silicon nitride, silicon oxide or silicon nitride/oxide for a medium, and having the diameter of 8 inches.

0316The following 4 kinds of gas types were used in order to form the film: a nitrogen/Ar mixed gas, nitrogen gas, oxygen gas and an oxygen/nitrogen mixed gas. A sputtering pressure was set to 0.3 to 1.5 Pa, and an electrification power to 2,400 W.

0317A sputtering time of period was appropriately adjusted so that film thickness can be 200 nm.

0318The resistivities of these resistive films were measured. In addition, by using a TEM (transmission electron microscope), an average particle diameter of germanium particles in a medium was determined.

0319A spacer substrate was prepared by forming each resistive film on a glass substrate, and was used as a spacer in a picture display unit using the surface conduction electron-emitting device, which is the present embodiment.

0320The influence of the spacer on an image was evaluated by measuring the deviation of an electron beam ΔL.

0321A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing germanium particles with diameters in a range of 0.5 to 10 nm, showed the deviation of an electron beam ΔL of 3% or less (0.03L or less) and an adequate display image.

0322A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing germanium particles with diameters in a range of 1 to 9 nm, showed the deviation of an electron beam ΔL of 1% or less (0.01L or less) and a particularly adequate display image.

0323The results are shown in Table 17. <tables id="tabl0017" num="0017"><table frame="all"><title>Table 17</title><tgroup cols="6" colsep="1" rowsep="1"><colspec colnum="1" colname="col1" colwidth="26.25mm" /><colspec colnum="2" colname="col2" colwidth="26.25mm" /><colspec colnum="3" colname="col3" colwidth="26.25mm" /><colspec colnum="4" colname="col4" colwidth="26.25mm" /><colspec colnum="5" colname="col5" colwidth="26.25mm" /><colspec colnum="6" colname="col6" colwidth="26.25mm" /><thead valign="top"><row><entry namest="col1" nameend="col1" /><entry namest="col2" nameend="col2" align="center">Film type</entry><entry namest="col3" nameend="col3" align="center">Gas type</entry><entry namest="col4" nameend="col4" align="center">Resistivity [Ωcm]</entry><entry namest="col5" nameend="col5" align="center">Average particle diameter [nm]</entry><entry namest="col6" nameend="col6" align="center">Image evaluation</entry></row></thead><tbody valign="top"><row><entry namest="col1" nameend="col1" morerows="11" align="center">Example 41</entry><entry namest="col2" nameend="col2" morerows="2" align="center">Ge-Si-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/Ar</entry><entry namest="col4" nameend="col4" align="center">4.E+09</entry><entry namest="col5" nameend="col5" align="center">0.7</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+09</entry><entry namest="col5" nameend="col5" align="center">0.9</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+02</entry><entry namest="col5" nameend="col5" align="center">16</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Ge-Si-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+11</entry><entry namest="col5" nameend="col5" align="center">1</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+02</entry><entry namest="col5" nameend="col5" align="center">17</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Ge-Si-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+14</entry><entry namest="col5" nameend="col5" align="center">0.4</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">4.E+08</entry><entry namest="col5" nameend="col5" align="center">9</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">4.E+07</entry><entry namest="col5" nameend="col5" align="center">11</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Ge-Si-N-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">1</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+04</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row rowsep="1"><entry namest="col4" nameend="col4" align="center">4.E+04</entry><entry namest="col5" nameend="col5" align="center">13</entry><entry namest="col6" nameend="col6" align="center">×</entry></row></tbody></tgroup></table></tables>

(Example 42)

0324A film was formed with the use of a Ge-Mg mixture target having a composition ratio adjusted so as to comprise germanium for a particle material, and magnesium nitride, magnesium oxide or magnesium nitride/oxide for a medium, and having the diameter of 8 inches.

0325The following 4 kinds of gas types were used in order to form the film: a nitrogen/Ar mixed gas, nitrogen gas, oxygen gas and an oxygen/nitrogen mixed gas. A sputtering pressure was set to 0.3 to 1.5 Pa, and an electrification power to 2,400 W.

0326A sputtering time of period was appropriately adjusted so that film thickness can be 200 nm.

0327The resistivities of these resistive films were measured. In addition, by using a TEM (transmission electron microscope), an average particle diameter of germanium particles in a medium was determined.

0328A spacer substrate was prepared by forming each resistive film on a glass substrate, and was used as a spacer in a picture display unit using the surface conduction electron-emitting device, which is the present embodiment.

0329The influence of the spacer on an image was evaluated by measuring the deviation of an electron beam ΔL.

0330A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing germanium particles with diameters in a range of 0.5 to 10 nm, showed the deviation of an electron beam ΔL of 3% or less (0.03L or less) and an adequate display image.

0331A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing germanium particles with diameters in a range of 1 to 9 nm, showed the deviation of an electron beam ΔL of 1% or less (0.01L or less) and a particularly adequate display image.

0332The results are shown in Table 18. <tables id="tabl0018" num="0018"><table frame="all"><title>Table 18</title><tgroup cols="6" colsep="1" rowsep="1"><colspec colnum="1" colname="col1" colwidth="26.25mm" /><colspec colnum="2" colname="col2" colwidth="26.25mm" /><colspec colnum="3" colname="col3" colwidth="26.25mm" /><colspec colnum="4" colname="col4" colwidth="26.25mm" /><colspec colnum="5" colname="col5" colwidth="26.25mm" /><colspec colnum="6" colname="col6" colwidth="26.25mm" /><thead valign="top"><row><entry namest="col1" nameend="col1" /><entry namest="col2" nameend="col2" align="center">Film type</entry><entry namest="col3" nameend="col3" align="center">Gas type</entry><entry namest="col4" nameend="col4" align="center">Resistivity [Ωcm]</entry><entry namest="col5" nameend="col5" align="center">Average article diameter [nm]</entry><entry namest="col6" nameend="col6" align="center">Image evaluation</entry></row></thead><tbody valign="top"><row><entry namest="col1" nameend="col1" morerows="11" align="center">Example 42</entry><entry namest="col2" nameend="col2" morerows="2" align="center">Ge-Mg-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/Ar</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+10</entry><entry namest="col5" nameend="col5" align="center">1</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+04</entry><entry namest="col5" nameend="col5" align="center">14</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Ge-Mg-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+11</entry><entry namest="col5" nameend="col5" align="center">1</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">8.E+01</entry><entry namest="col5" nameend="col5" align="center">17</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Ge-Mg-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+14&lt;&lt;</entry><entry namest="col5" nameend="col5" align="center">0.3</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">4.E+08</entry><entry namest="col5" nameend="col5" align="center">7</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">4.E+07</entry><entry namest="col5" nameend="col5" align="center">9</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Ge-Mg-N-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/O₂</entry><entry namest="col4" nameend="col4" align="center">2.E+06</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+04</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row rowsep="1"><entry namest="col4" nameend="col4" align="center">1.E+02</entry><entry namest="col5" nameend="col5" align="center">20</entry><entry namest="col6" nameend="col6" align="center">×</entry></row></tbody></tgroup></table></tables>

(Example 43)

0333A film was formed with the use of a Si-Al mixture target having a composition ratio adjusted so as to comprise silicon for a particle material, and aluminum nitride, aluminum oxide or aluminum nitride/oxide for a medium, and having the diameter of 8 inches.

0334The following 4 kinds of gas types were used in order to form the film: a nitrogen/Ar mixed gas, nitrogen gas, oxygen gas and an oxygen/nitrogen mixed gas. A sputtering pressure was set to 0.3 to 1.5 Pa, and an electrification power to 2,400 W.

0335A sputtering time of period was appropriately adjusted so that film thickness can be 200 nm.

0336The resistivities of these resistive films were measured. In addition, by using a TEM (transmission electron microscope), an average particle diameter of silicon particles in a medium was determined.

0337A spacer substrate was prepared by forming each resistive film on a glass substrate, and was used as a spacer in a picture display unit using the surface conduction electron-emitting device, which is the present embodiment.

0338The influence of the spacer on an image was evaluated by measuring the deviation of an electron beam ΔL.

0339A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing silicon particles with diameters in a range of 0.5 to 10 nm, showed the deviation of an electron beam ΔL of 3% or less (0.03L or less) and an adequate display image.

0340A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing silicon particles with diameters in a range of 1 to 9 nm, showed the deviation of an electron beam ΔL of 1% or less (0.01L or less) and a particularly adequate display image.

0341The results are shown in Table 19. <tables id="tabl0019" num="0019"><table frame="all"><title>Table 19</title><tgroup cols="6" colsep="1" rowsep="1"><colspec colnum="1" colname="col1" colwidth="26.25mm" /><colspec colnum="2" colname="col2" colwidth="26.25mm" /><colspec colnum="3" colname="col3" colwidth="26.25mm" /><colspec colnum="4" colname="col4" colwidth="26.25mm" /><colspec colnum="5" colname="col5" colwidth="26.25mm" /><colspec colnum="6" colname="col6" colwidth="26.25mm" /><thead valign="top"><row><entry namest="col1" nameend="col1" /><entry namest="col2" nameend="col2" align="center">Film type</entry><entry namest="col3" nameend="col3" align="center">Gas type</entry><entry namest="col4" nameend="col4" align="center">Resistivity [Ωcm]</entry><entry namest="col5" nameend="col5" align="center">Average particle diameter [nm]</entry><entry namest="col6" nameend="col6" align="center">image evaluation</entry></row></thead><tbody valign="top"><row><entry namest="col1" nameend="col1" morerows="11" align="center">Example 43</entry><entry namest="col2" nameend="col2" morerows="2" align="center">Si-Al-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/Ar</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.8</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">9.E+09</entry><entry namest="col5" nameend="col5" align="center">1</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">5.E+02</entry><entry namest="col5" nameend="col5" align="center">19</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Si-Al-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">9.E+04</entry><entry namest="col5" nameend="col5" align="center">9</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">7.E+03</entry><entry namest="col5" nameend="col5" align="center">21</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Si-Al-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+19</entry><entry namest="col5" nameend="col5" align="center">0.4</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">9.E+08</entry><entry namest="col5" nameend="col5" align="center">19</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">9.E+07</entry><entry namest="col5" nameend="col5" align="center">21</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Si-Al-N-0</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">1</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+04</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row rowsep="1"><entry namest="col4" nameend="col4" align="center">5.E+04</entry><entry namest="col5" nameend="col5" align="center">14</entry><entry namest="col6" nameend="col6" align="center">×</entry></row></tbody></tgroup></table></tables>

(Example 44)

0342A film was formed with the use of an Si-Ge mixture target having a composition ratio adjusted so as to comprise silicon for a particle material, and germanium nitride, germanium oxide or germanium nitride/oxide for a medium, and having the diameter of 8 inches.

0343The following 4 kinds of gas types were used in order to form the film: a nitrogen/Ar mixed gas, nitrogen gas, oxygen gas and an oxygen/nitrogen mixed gas. A sputtering pressure was set to 0.3 to 1.5 Pa, and an electrification power to 2,400 W.

0344A sputtering time of period was appropriately adjusted so that film thickness can be 200 nm.

0345The resistivities of these resistive films were measured. In addition, by using a TEM (transmission electron microscope), an average particle diameter of silicon particles in a medium was determined.

0346A spacer substrate was prepared by forming each resistive film on a glass substrate, and was used as a spacer in a picture display unit using the surface conduction electron-emitting device, which is the present embodiment.

0347The influence of the spacer on an image was evaluated by measuring the deviation of an electron beam ΔL.

0348A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing silicon particles with diameters in a range of 0.5 to 10 nm, showed the deviation of an electron beam ΔL of 3% or less (0.03L or less) and an adequate display image.

0349A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing silicon particles with diameters in a range of 1 to 9 nm, showed the deviation of an electron beam ΔL of 1% or less (0.01L or less) and a particularly adequate display image.

0350The results are shown in Table 20. <tables id="tabl0020" num="0020"><table frame="all"><title>Table 20</title><tgroup cols="6" colsep="1" rowsep="1"><colspec colnum="1" colname="col1" colwidth="26.25mm" /><colspec colnum="2" colname="col2" colwidth="26.25mm" /><colspec colnum="3" colname="col3" colwidth="26.25mm" /><colspec colnum="4" colname="col4" colwidth="26.25mm" /><colspec colnum="5" colname="col5" colwidth="26.25mm" /><colspec colnum="6" colname="col6" colwidth="26.25mm" /><thead valign="top"><row><entry namest="col1" nameend="col1" /><entry namest="col2" nameend="col2" align="center">Film type</entry><entry namest="col3" nameend="col3" align="center">Gas type</entry><entry namest="col4" nameend="col4" align="left">Resistivity [Ωcm]</entry><entry namest="col5" nameend="col5" align="center">Average particle diameter [nm]</entry><entry namest="col6" nameend="col6" align="center">Image evaluation</entry></row></thead><tbody valign="top"><row><entry namest="col1" nameend="col1" morerows="11" align="center">Example 44</entry><entry namest="col2" nameend="col2" morerows="2" align="center">Si-Ge-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/Ar</entry><entry namest="col4" nameend="col4" align="center">2.E+10</entry><entry namest="col5" nameend="col5" align="center">0.8</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">9.E+09</entry><entry namest="col5" nameend="col5" align="center">1</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">5.E+02</entry><entry namest="col5" nameend="col5" align="center">19</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Si-Ge-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂</entry><entry namest="col4" nameend="col4" align="center">5.E+11</entry><entry namest="col5" nameend="col5" align="center">0.1</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">7.E+03</entry><entry namest="col5" nameend="col5" align="center">21</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Si-Ge-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+14</entry><entry namest="col5" nameend="col5" align="center">0.4</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">9.E+08</entry><entry namest="col5" nameend="col5" align="center">19</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">9.E+07</entry><entry namest="col5" nameend="col5" align="center">21</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Si-Ge-N-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/O₂</entry><entry namest="col4" nameend="col4" align="center">9.E+10</entry><entry namest="col5" nameend="col5" align="center">9</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+04</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row rowsep="1"><entry namest="col4" nameend="col4" align="center">5.E+03</entry><entry namest="col5" nameend="col5" align="center">23</entry><entry namest="col6" nameend="col6" align="center">×</entry></row></tbody></tgroup></table></tables>

(Example 45)

0351A film was formed with the use of a Si-Mg mixture target having a composition ratio adjusted so as to comprise silicon for a particle material, and magnesium nitride, magnesium oxide or magnesium nitride/oxide for a medium, and having the diameter of 8 inches.

0352The following 4 kinds of gas types were used in order to form the film: a nitrogen/Ar mixed gas, nitrogen gas, oxygen gas and an oxygen/nitrogen mixed gas. A sputtering pressure was set to 0.3 to 1.5 Pa, and an electrification power to 2,400 W.

0353A sputtering time of period was appropriately adjusted so that film thickness can be 200 nm.

0354The resistivities of these resistive films were measured. In addition, by using a TEM (transmission electron microscope), an average particle diameter of silicon particles in a medium was determined.

0355A spacer substrate was prepared by forming each resistive film on a glass substrate, and was used as a spacer in a picture display unit using the surface conduction electron-emitting device, which is the present embodiment.

0356The influence of the spacer on an image was evaluated by measuring the deviation of an electron beam ΔL.

0357A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing silicon particles with diameters in a range of 0.5 to 10 nm, showed the deviation of an electron beam ΔL of 3% or less (0.03L or less) and an adequate display image.

0358A spacer provided with a resistive film having a resistivity ρ of 1×10⁴ to 1×10¹¹ Ωcm and containing silicon particles with diameters in a range of 1 to 9 nm, showed the deviation of an electron beam ΔL of 1% or less (0.01L or less) and a particularly adequate display image.

0359The results are shown in Table 21. <tables id="tabl0021" num="0021"><table frame="all"><title>Table 21</title><tgroup cols="6" colsep="1" rowsep="1"><colspec colnum="1" colname="col1" colwidth="26.25mm" /><colspec colnum="2" colname="col2" colwidth="26.25mm" /><colspec colnum="3" colname="col3" colwidth="26.25mm" /><colspec colnum="4" colname="col4" colwidth="26.25mm" /><colspec colnum="5" colname="col5" colwidth="26.25mm" /><colspec colnum="6" colname="col6" colwidth="26.25mm" /><thead valign="top"><row><entry namest="col1" nameend="col1" /><entry namest="col2" nameend="col2" align="center">Film type</entry><entry namest="col3" nameend="col3" align="center">Gas type</entry><entry namest="col4" nameend="col4" align="center">Resistivity [Ωcm]</entry><entry namest="col5" nameend="col5" align="center">Average particle diameter [nm]</entry><entry namest="col6" nameend="col6" align="center">Image evaluation</entry></row></thead><tbody valign="top"><row><entry namest="col1" nameend="col1" morerows="11" align="center">Example 45</entry><entry namest="col2" nameend="col2" morerows="2" align="center">Si-Mg-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/Ar</entry><entry namest="col4" nameend="col4" align="center">2.E+10</entry><entry namest="col5" nameend="col5" align="center">0.6</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">9.E+09</entry><entry namest="col5" nameend="col5" align="center">2</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">5.E+04</entry><entry namest="col5" nameend="col5" align="center">17</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Si-Mg-N</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂</entry><entry namest="col4" nameend="col4" align="center">1.E+11</entry><entry namest="col5" nameend="col5" align="center">0.5</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col4" nameend="col4" align="center">4.E+11</entry><entry namest="col5" nameend="col5" align="center">1</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">2.E+02</entry><entry namest="col5" nameend="col5" align="center">21</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Si-Mg-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">O₂</entry><entry namest="col4" nameend="col4" align="center">1.E+14&lt;&lt;</entry><entry namest="col5" nameend="col5" align="center">0.4</entry><entry namest="col6" nameend="col6" align="center">×</entry></row><row><entry namest="col4" nameend="col4" align="center">9.E+08</entry><entry namest="col5" nameend="col5" align="center">8</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">9.E+07</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row><entry namest="col2" nameend="col2" morerows="2" align="center">Si-Mg-N-O</entry><entry namest="col3" nameend="col3" morerows="2" align="center">N₂/O₂</entry><entry namest="col4" nameend="col4" align="center">6.E+06</entry><entry namest="col5" nameend="col5" align="center">9</entry><entry namest="col6" nameend="col6" align="center">ⓞ</entry></row><row><entry namest="col4" nameend="col4" align="center">1.E+04</entry><entry namest="col5" nameend="col5" align="center">10</entry><entry namest="col6" nameend="col6" align="center">○</entry></row><row rowsep="1"><entry namest="col4" nameend="col4" align="center">1.E+00</entry><entry namest="col5" nameend="col5" align="center">24</entry><entry namest="col6" nameend="col6" align="center">×</entry></row></tbody></tgroup></table></tables>

0360As described above, the present invention can provide the resistive film which is superior controllability for a resistivity value, stability and reproducibility, has adequate temperature characteristics of resistance, and is suitable for an antistatic film.

0361In addition, the present invention can provide a picture display unit having the effect of reducing the instability of a display image, which originates from a temperature distribution in an airtight vessel caused by a temperature difference between a pair of substrates that compose the airtight vessel, and having superior display performance.

0362An antistatic film installed in an airtight vessel containing an electron source of an electron-generating device such as a picture display unit has a structure comprising an image of conductor particles with particle diameters of 0.5 to 10 nm dispersed in a medium containing a nitride; and thereby improves controllability for a resistivity value, stability and reproducibility, and the adequate temperature characteristics of resistance.