EP1537425B1

Method and apparatus for detecting wear in components of high voltage electrical equipment

Abstract

A tracer material is embedded in a component of electrical equipment to detect excessive wear of the component when it is exposed to an electrical arc. As the component wears, the tracer material becomes exposed to the electrical arc and emits electromagnetic radiation, which is monitored continuously. The tracer material is selected so that it emits electromagnetic radiation when it is exposed to an electrical arc that is distinct from electromagnetic radiation emitted by any other parts of the component.

EP1537425B1, drawing sheet 1
Sheet 1 of 9

Term

Term ended

Expired 4 September 2023, 3.1 years ago.

  1. Priority
  2. Filed
  3. Granted
  4. Expired
  5. Today

17 claims: 12 independent, 5 dependent

  1. 1
    A method for detecting wear in a component (202) of an electrical device, comprising:operating a component (202) of an electrical device, thereby eroding (104) the component (202) and exposing a tracer material (204) embedded at a predetermined depth in the component (202) to an electric arc (206), thereby causing electromagnetic radiation from the tracer material (204) to be emitted, and detecting (106) the electromagnetic radiation emitted by the tracer material (204).
  2. 4
    The method of any of the preceding claims comprising embedding the tracer material (204) in the component (202) at a predetermined depth.
  3. 5
    The method of any of the preceding claims, wherein detecting the electromagnetic radiation emitted by the tracer material (204) involves using a photodiode (210) having a narrow band electromagnetic radiation filter.
  4. 6
    The method of any of claims 1 to 4, wherein detecting the electromagnetic radiation emitted by the tracer material (204) involves using a spectrophotometer (406).
  5. 7
    The method of any of the preceding claims, wherein the tracer material (204) is selected from the group consisting of lithium, cobalt, niobium, and a rare earth metal.
  6. 8
    The method of any of the preceding claims, wherein the tracer material (204) comprises a first tracer material (402) that is able to emit a first electromagnetic radiation and a second tracer material (404) that is able to emit a second electromagnetic radiation that is distinct from the first electromagnetic radiation, wherein the first tracer material (402) is provided at a first predetermined depth in the component (202) and the second tracer material (404) is provided at a second predetermined depth in the component (202), the method comprising:operating and thereby eroding the component (202) and exposing the first tracer material (402) to an electric arc (206), thereby causing the first electromagnetic radiation from the first tracer material (402) to be emitted;continuing to operate and thereby erode the component (202) and exposing the second tracer material (404) to an electric arc (206), thereby causing the second electromagnetic radiation to be emitted;and detecting the first and second electromagnetic radiation emitted.
  7. 10
    A system for detecting wear in an electrical device, the apparatus comprising:a component (202) of a device that is exposed to an electrical arc (206);a tracer material (204) embedded at a predetermined depth in the component (202), wherein the tracer material (204) is capable of emitting electromagnetic radiation when exposed to the electrical arc (206) and the electromagnetic radiation emitted by the tracer material (204) is distinct from electromagnetic radiation emitted by any other parts of the component (202) when the component (202) is exposed to the electrical arc (206) and an electromagnetic detector configured to monitor the component (202) for the electromagnetic radiation emitted by the tracer material (204).
  8. 13
    The system of any of claims 10 to 12, wherein the electromagnetic detector is configured to monitor the component (202) continuously.
  9. 14
    The system of any of claims 10 to 13, wherein the electromagnetic detector is a photodiode (210) having a narrow band electromagnetic radiation filter.
  10. 15
    The system of any of claims 10 to 14, wherein the electromagnetic detector is a spectrophotometer (406).
  11. 16
    The system of any of claims 10 to 15, further comprising a fibre optic cable (504) configured to transmit the electromagnetic radiation to the electromagnetic detector.
  12. 17
    The system of any of claims 10 to 16, wherein the tracer material (204) is selected from the group consisting of lithium, cobalt, niobium, and a rare earth metal.