EP1500634A4

Glass substrate and process for producing the same

Abstract

This record has no abstract on file.

EP1500634A4, drawing sheet 1 — Sheet 1 of 4

Term

Term ended

Projected expiry passed 25 March 2023, 3.5 years ago.

4 sheets

Sheet 1
Sheet 2
Sheet 3
Sheet 4

Every citation, both waysCites: the store holds 2 of 3

Citations
Document	Relation	Office	Category	Cited during	Relevant claims
JP2002042557A	Cites	Japan	A	Search report	1-6
JP2002080830A	Cites	Japan	A	Search report	1-6
CHU J H ET AL: "FINE SILICON OXIDE PARTICLES IN RF HOLLOW MAGNETRON DISCHARGES", JOURNAL OF APPLIED PHYSICS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, vol. 74, no. 7, 1 October 1993 (1993-10-01), pages 4741 - 4745, XP000402765, ISSN: 0021-8979	Non-patent	–	–	Search report	–
See also references of WO 03080530A1	Non-patent	–	–	Search report	–

7 members in 4 offices

This recordMember, by publication datePriority claim

Priority claims9

Priority claims
Document	Office	Kind	Date
2002085445	Japan	A	2002-03-26
2002085445	Japan	A	2002-03-26
2002085445	Japan	–	2002-03-26
0303578	Japan	W	2003-03-25
0303578	Japan	W	2003-03-25
2002085445	–	–	–
JP20020085445	–	–	–
JP2003003578	–	–	–
WO2003JP03578	–	–	–

Members7

Family members, oldest first
Document	Office	Kind
WO03080530A1	World Intellectual Property Organization (WIPO)	A1	2003-10-02
EP1500634A1	European Patent Office (EPO)	A1	2005-01-26
US2005089693A1	United States of America	A1	2005-04-28
JPWO2003080530A1	Japan	A1	2005-07-21
US7320827B2	United States of America	B2	2008-01-22
EP1500634A4This record	European Patent Office (EPO)	A4	2008-01-23
JP4430402B2	Japan	B2	2010-03-10

11 legal events, as 2 offices reported them to INPADOC

Over the term

Point at a mark for the event

Events

Legal events, newest first
	Event	Code	Office
2011-03-30	Application deemed to be withdrawnWithdrawn18D	18D	EP
2011-02-25	Information on the status of an ep patent application or granted ep patentGrantedSTATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWNSTAA	STAA	EP
2008-11-05	First examination report despatched17Q	17Q	EP
2008-03-13	Designated country de not longer valid8566	8566	DE
2008-01-23	Supplementary search report drawn up and despatchedA4	A4	EP
2008-01-23	Information provided on ipc code assigned before grantRIC1	RIC1	EP
2008-01-23	Information provided on ipc code assigned before grantRIC1	RIC1	EP
2008-01-23	Information provided on ipc code assigned before grantRIC1	RIC1	EP
2005-01-26	Request for examination filed17P	17P	EP
2005-01-26	Designated contracting statesAK	AK	EP
2004-12-10	Public reference made under article 153(3) epc to a published international application that has entered the european phaseORIGINAL CODE: 0009012PUAI	PUAI	EP