Manufacturing method of spacer for electron-beam apparatus and manufacturing method of electron-beam apparatus
Abstract
There is herein disclosed a manufacturing method of a spacer for an electron-beam apparatus which comprises an airtight container, and an electron source. The spacer is arranged in the airtight container. The method comprises the step of heating and drawing a base material of the spacer to form a desired rough state on the surface of the base material, the step of heating and drawing the base material of the spacer to form the desired rough state and an electroconductive film on the surface of the base material, or the step of heating and drawing the base material of the spacer having the rough state on its surface. According to the present invention, the spacer having a surface structure on which can suppress charging can be manufactured at a low cost, and an electron-beam apparatus such as an image-forming apparatus having a sufficient display luminance can also be manufactured.

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Projected expiry passed 24 February 2020, 6.6 years ago.
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1 sheet
Sheet 1
Every citation, both ways
| Document | Relation | Office | Category | Cited during | Relevant claims |
|---|---|---|---|---|---|
| EP0725419A1 | Cites | European Patent Office (EPO) | X | Search report | 13 |
| EP0867911A1 | Cites | European Patent Office (EPO) | Y | Search report | 2,3,5,6,8,9 |
| US5721050A | Cites | United States of America | XY | Search report | 1,4,7,10-12 |
| WO9618204A1 | Cites | World Intellectual Property Organization (WIPO) | XY | Search report | 1-13 |
12 members in 4 offices
Priority claims10
| Document | Office | Kind | Date |
|---|---|---|---|
| 4849299 | Japan | A | |
| 4849299 | Japan | A | |
| 4849299 | Japan | – | |
| 2000046353 | Japan | A | |
| 2000046353 | Japan | A | |
| 2000046353 | Japan | – | |
| 2000046353 | – | – | – |
| 4849299 | – | – | – |
| JP19990048492 | – | – | – |
| JP20000046353 | – | – | – |
Members12
| Document | Office | Kind | |
|---|---|---|---|
| EP1032014A2 | European Patent Office (EPO) | A2 | |
| JP2000311607A | Japan | A | |
| JP2000311608A | Japan | A | |
| KR20000071388A | Republic of Korea | A | |
| JP3135897B2 | Japan | B2 | |
| JP2001143620A | Japan | A | |
| US2002123292A1 | United States of America | A1 | |
| US6494757B2 | United States of America | B2 | |
| US2003003838A1 | United States of America | A1 | |
| KR100367248B1 | Republic of Korea | B1 | |
| JP3854794B2 | Japan | B2 | |
| EP1032014A3This record | European Patent Office (EPO) | A3 |
17 legal events, as the office reported them to INPADOC
Over the term
Point at a mark for the eventEvents
| Event | Code | |
|---|---|---|
| Application withdrawnWithdrawn18W | 18W | |
| Information on the status of an ep patent application or granted ep patentGrantedSTATUS: THE APPLICATION HAS BEEN WITHDRAWNSTAA | STAA | |
| First examination report despatched17Q | 17Q | |
| Designation fees paidAKX | AKX | |
| Request for examination filed17P | 17P | |
| Designated contracting statesAK | AK | |
| Request for extension of the european patentAX | AX | |
| Information provided on ipc code assigned before grantRIC1 | RIC1 | |
| Information provided on ipc code assigned before grantRIC1 | RIC1 | |
| Information provided on ipc code assigned before grantRIC1 | RIC1 | |
| Information provided on ipc code assigned before grantRIC1 | RIC1 | |
| Information provided on ipc code assigned before grantRIC1 | RIC1 | |
| Information provided on ipc code assigned before grantRIC1 | RIC1 | |
| Search report despatchedORIGINAL CODE: 0009013PUAL | PUAL | |
| Designated contracting statesAK | AK | |
| Request for extension of the european patentAL;LT;LV;MK;RO;SIAX | AX | |
| Public reference made under article 153(3) epc to a published international application that has entered the european phaseORIGINAL CODE: 0009012PUAI | PUAI |
Numbers
- Publication
- 1032014
- Publication, DOCDB
- 1032014
- Publication, EPODOC
- EP1032014
- Application
- 301463
- Application, DOCDB
- 00301463
- Application, EPODOC
- EP20000301463
Titles3
- German
- Herstellungsverfahren eines Abstandshalters für ein Elektronenstrahlgerät und Verfahren zur Herstellung eines Elektronenstrahlgerätes
- English
- Manufacturing method of spacer for electron-beam apparatus and manufacturing method of electron-beam apparatus
- French
- Procédé pour la fabrication d'un élément d'espacement pour un appareil à faisceau d'électrons et procédé de fabrication d'un appareil à faisceau d'électrons
Classification
- CPC, 14
- C03B23/047
- H01J9/24
- H01J9/185
- H01J9/242
- H01J29/028
- H01J29/864
- H01J31/123
- H01J2329/8625
- H01J2329/8635
- H01J2329/864
- H01J2329/8645
- H01J2329/8655
- H01J2329/866
- Y02P40/57
- IPC, 7
- H01J9 18
- H01J29 02
- H01J9 24
- H01J29 86
- H01J31 12
- C03B23 047
- H01J29 87
Designated states2
- Contracting states, 1
- Sweden
- Extension states, 1
- Slovenia