Apparatus and method for pattern recognition
Abstract
A method and an apparatus for pattern recognition are described. Features characterizing at least two significant portions or regions of the printed pattern on a model document are extracted from a scanned-in image of the model document. Statistical characteristics of each significant region are calculated from the extracted features and saved in a memory. In addition, geometrical relationships, e.g. distances and angles, between the regions are also saved in a memory. The geometrical relationships are represented by the coordinates of the regions in a predetermined coordinate system, e.g. the x-y coordinate system corresponding to the scan area on the platen of a scanner. When a new or trial document is scanned and examined through a search window, features are extracted from the search window blocks and compared to the statistical characteristics of the model document previously stored in memory. If there is a match, the coordinates of the search window having the matching features in the trial document are recorded in a candidate list. After the entire trial document has been processed, the geometric relationships between the window blocks on the candidate list are compared with the geometrical relationships of the matching significant region blocks of the model document and if the relationships correspond the trial document is considered a match.

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1 sheet
Sheet 1
Every citation, both waysCites: the store holds 1 of 2
| Document | Relation | Office | Category | Cited during | Relevant claims |
|---|---|---|---|---|---|
| US5216724A | Cites | United States of America | Y | Search report | 1,2,4-8,11,13,14,16-19,23,25-28 |
| PATENT ABSTRACTS OF JAPAN vol. 018, no. 675 (E - 1648) 20 December 1994 (1994-12-20) | Non-patent | – | – | Search report | – |
| YAMAMOTO A ET AL: "EXTRACTION OF OBJECT FEATURES AND ITS APPLICATION TO IMAGE RETRIEVAL", TRANSACTIONS OF THE INSTITUTE OF ELECTRONICS, INFORMATION AND COMMUNICATION ENGINEERS OF JAPAN, INST. OF ELECTRONICS & COMMUNIC. ENGINEERS OF JAPAN. TOKYO, JP, vol. E72, no. 6, 1 June 1989 (1989-06-01), pages 771 - 781, XP000050590 | Non-patent | – | – | Search report | – |
8 members in 4 offices
Priority claims5
| Document | Office | Kind | Date |
|---|---|---|---|
| 12901 | United States of America | – | |
| 1290198 | United States of America | A | |
| 1290198 | United States of America | A | |
| 12901 | – | – | – |
| US19980012901 | – | – | – |
Members8
| Document | Office | Kind | |
|---|---|---|---|
| EP0932115A2 | European Patent Office (EPO) | A2 | |
| JPH11250265A | Japan | A | |
| JP3052947B2 | Japan | B2 | |
| US6272245B1 | United States of America | B1 | |
| EP0932115A3This record | European Patent Office (EPO) | A3 | |
| EP0932115B1 | European Patent Office (EPO) | B1 | |
| DE69930560D1 | Germany | D1 | |
| DE69930560T2 | Germany | T2 |
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| Notification of lapseLapsedST | ST | FR | |
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Numbers
- Publication
- 0932115
- Publication, DOCDB
- 0932115
- Publication, EPODOC
- EP0932115
- Application
- 99100350
- Application, DOCDB
- 99100350
- Application, EPODOC
- EP19990100350
Titles3
- German
- Verfahren und Vorrichtung zur Mustererkennung
- English
- Apparatus and method for pattern recognition
- French
- Procédé et dispositif de reconnaissance de formes
Classification
- CPC, 2
- G06V30/414
- G06V10/7515
- IPC, 5
- H04N1 40
- G06K9 20
- G06K9 64
- G06T7 60
- G07D7 00
Designated states2
- Contracting states, 1
- Sweden
- Extension states, 1
- Slovenia