Method of inspecting a negative film in a photographic processing apparatus.
Abstract
A method of inspecting a negative film (1) in a photographic processing apparatus comprises the steps of detecting with a detector (3) location data arranged at equal intervals on the negative film (1), electrically comparing the detected location data with equally spaced reference location data having a regularity and assigned to a standard negative film, and automatically stopping the advancing movement of the negative film upon finding a fault in the regularity of the detected location data.

Term
Term ended
Projected expiry passed 27 March 2015, 11.5 years ago.
- Priority
- Filed
- Published
- Projected expiry
- Today
1 claim: 1 independent, 0 dependent
- 1A method of inspecting a negative film in a photographic processing apparatus comprising the steps of:detecting with a detector location data arranged at equal intervals on the negative film;electrically comparing the detected location data with equally distanced reference location data having a regularity and assigned to a standard negative film;and automatically stopping the advancing movement of the negative film upon finding a fault in the regularity of the detected location data.
12 paragraphs in 4 sections, as filed
BACKGROUND OF THE INVENTION
The present invention relates to a method of inspecting a negative film (referred to as a negative hereinafter) in a photographic processing apparatus.
It is known that a negative may be jammed and injured during the advancing movement along a film passage in a photographic processing apparatus when it has a defect such as a slit to perforation.
For preventing such an incident, the negatives are inspected by an operator viewing one by one before loading to the photographic processing apparatus. If any defective negative is found, it is reclaimed or repaired for ease of the advancing movement along the passage.
The inspection by view of the negatives is a troublesome task as is very low in the efficiency and may allow possible omission of a defect or misjudgment. if any defective film is loaded through possible omission of a defect, misjudgment, or fault action of a drive system in the film passage, it will be jammed and injured causing cancellation of the further action of a printing process.
It is thus essential to stop the advancing movement immediately and remove the defective negative from the film passage by manual action of the operator upon jamming of the defective negative. This will obligate the operator to pay a constant attention on the advancing movement of the negative film to prevent generation of trouble. In addition, the inspection for identifying any defect on the negative is not easy but requires a level of skill. It has been much desired to propose a technique for elimination of such a disadvantage.
It is an object of the present invention, in view of the foregoing aspect, to provide a method of inspecting a negative for slits or cuts without checking by view of a service person or operator so that any defective negative film is exactly identified and prevented for loading to the film passage of a photographic processing apparatus.
SUMMARY OF THE INVENTION
For achievement of the object of the present invention, a method of inspecting a negative film in a photographic processing apparatus comprises the steps of detecting with a detector location data arranged at equal intervals on the negative film, electrically comparing the detected location data with equally distanced reference location data having a regularity and assigned to a standard negative film, and automatically stopping the advancing movement of the negative film upon finding a fault in the rgularity of the detected location data.
According to the inspection method of the present invention, the location data arranged at equal intervals on the negative film in the form of e.g. perforations are electrically measured or monitored and electrically compared with the equally distanced reference location data which have a regularity and are arranged on the standard film. If a fault in the regularity of the measured location data on the negative film is found, it is judged that there is at least a slit to one of the perforations or any obstruction in the same. In response to the judgment, the advancing movement of the negative film is systematically stopped for preventing any damage to the film and the apparatus.
BRIEF DESCRIPTION OF THE DRAWINGS
<ul id="ul0001" list-style="none"><li>Fig. 1 is a schematic explanatory view showing an action of inspecting a negative during the advancing movement according to the present invention; and</li><li>Fig. 2 is a flow chart of the procedure of inspecting the negative for defect.</li></ul>
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT
One preferred embodiment of the present invention will be described referring to the accompanying drawings.
As shown in Fig. 1, a negative film 1 is continuously advanced by the action of drive rollers 2 towards a detector 3 which electrically examines whether or not the negative 1 has a defect such as a slit to perforation. Fig. 2 is a flow chart showing a procedure of the examination. As reference location data arranged at equal intervals on a standard negative are initiated having a degree of regularity, the advancing movement of the negative 1 is commenced. Location data arranged on the negative 1 are detected by the detector 3 and transmitted to a comparator (not shown) where it is electrically compared with the reference location data. More specifically, it is examined whether the location data on the negative 1 are identical or not in the regularity to the reference location data on the standard negative. if a fault in the regularity of the location data is found, the advancing movement of the negative 1 is terminated. When the regularity stands, it is further examined whether the advancing movement of the negative 1 is continued or not before restarting the advancing movement.
In more detail, the location data arranged on the negative 1 are provided in the form of a row of perforations which are aligned at equal intervals of a given distance as sized in physical manner for detection with the detector 3. As the perforations pass the detector 3, the distance between any two adjacent perforations is detected (or measured) and examined (or monitored) by a computer. The distance data are then compared with the reference data for examining the regularity of the perforations. If any fault in the regularity is found, it is judged that there is a slit to one of the perforations in the negative 1 or an obstruction trapped in the perforation. Accordingly, the advancing movement of the negative 1 is automatically terminated to prevent any damage to the negative 1. The detector 3 may be a known perforation detector or the like which allows the negative 1 to be transferred to an appropriate location before canceling the advancing movement.
Contents4
3 sheets
Sheet 1 Sheet 2 Sheet 3
Every citation, both ways
| Document | Relation | Office | Cited during |
|---|---|---|---|
| EP0668531A1 | Cites | European Patent Office (EPO) | Examiner |
| US4400074A | Cites | United States of America | Search report |
| US4933713A | Cites | United States of America | Examiner |
13 members in 7 offices
Priority claims4
| Document | Office | Kind | Date |
|---|---|---|---|
| 5770594 | Japan | – | |
| 5770594 | Japan | A | |
| 5770594 | – | – | – |
| JP19940057705 | – | – | – |
Members13
| Document | Office | Kind | |
|---|---|---|---|
| CA2145688A1 | Canada | A1 | |
| EP0675397A2This record | European Patent Office (EPO) | A2 | |
| JPH07270927A | Japan | A | |
| EP0675397A3 | European Patent Office (EPO) | A3 | |
| KR950033656A | Republic of Korea | A | |
| CN1115404A | China | A | |
| US5574529A | United States of America | A | |
| KR100187380B1 | Republic of Korea | B1 | |
| JP2979949B2 | Japan | B2 | |
| CA2145688C | Canada | C | |
| EP0675397B1 | European Patent Office (EPO) | B1 | |
| DE69517841D1 | Germany | D1 | |
| DE69517841T2 | Germany | T2 |
36 legal events, as 5 offices reported them to INPADOC
Over the term
Point at a mark for the eventEvents
| Event | Code | Office | |
|---|---|---|---|
| Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal feeWithdrawnR119 | R119 | DE | |
| Lapsed in a contracting state [announced via postgrant information from national office to epo]LapsedPG25 | PG25 | EP | |
| Annual fee paid to national office [announced via postgrant information from national office to epo]GrantedPGFP | PGFP | EP | |
| Lapsed in a contracting state [announced via postgrant information from national office to epo]LapsedPG25 | PG25 | EP | |
| Notification of lapseLapsedST | ST | FR | |
| Gb: european patent ceased through non-payment of renewal feeCeasedGBPC | GBPC | EP | |
| Lapsed in a contracting state [announced via postgrant information from national office to epo]LapsedPG25 | PG25 | EP | |
| Patent ceasedCeasedPL | PL | CH | |
| Lapsed in a contracting state [announced via postgrant information from national office to epo]LapsedPG25 | PG25 | EP | |
| Lapsed in a contracting state [announced via postgrant information from national office to epo]LapsedPG25 | PG25 | EP | |
| Lapsed in a contracting state [announced via postgrant information from national office to epo]LapsedPG25 | PG25 | EP | |
| Annual fee paid to national office [announced via postgrant information from national office to epo]GrantedPGFP | PGFP | EP | |
| Annual fee paid to national office [announced via postgrant information from national office to epo]GrantedPGFP | PGFP | EP | |
| Annual fee paid to national office [announced via postgrant information from national office to epo]GrantedPGFP | PGFP | EP | |
| European patent in force as of 2002-01-01IF02 | IF02 | GB | |
| No opposition filedOpposition26N | 26N | EP | |
| No opposition filed within time limitOppositionORIGINAL CODE: 0009261PLBE | PLBE | EP | |
| Information on the status of an ep patent application or granted ep patentGrantedSTATUS: NO OPPOSITION FILED WITHIN TIME LIMITSTAA | STAA | EP | |
| Fr: translation filedET | ET | EP | |
| New agentNV | NV | CH | |
| Corresponds to:REF | REF | EP | |
| European patent takes effect as a national patent in ch/liEP | EP | CH | |
| Designated contracting statesAK | AK | EP | |
| (expected) grantORIGINAL CODE: 0009210GRAA | GRAA | EP | |
| It: translation for a ep patent filedITF | ITF | EP | |
| It: translation for a ep patent filedITF | ITF | EP | |
| Despatch of communication of intention to grant a patentORIGINAL CODE: EPIDOS IGRAGRAH | GRAH | EP | |
| Despatch of communication of intention to grantORIGINAL CODE: EPIDOS AGRAGRAG | GRAG | EP | |
| Despatch of communication of intention to grant a patentORIGINAL CODE: EPIDOS IGRAGRAH | GRAH | EP | |
| Despatch of communication of intention to grantORIGINAL CODE: EPIDOS AGRAGRAG | GRAG | EP | |
| First examination report despatched17Q | 17Q | EP | |
| Request for examination filed17P | 17P | EP | |
| Designated contracting statesAK | AK | EP | |
| Search report despatchedORIGINAL CODE: 0009013PUAL | PUAL | EP | |
| Designated contracting statesAK | AK | EP | |
| Public reference made under article 153(3) epc to a published international application that has entered the european phaseORIGINAL CODE: 0009012PUAI | PUAI | EP |
Numbers
- Publication
- 0675397
- Publication, DOCDB
- 0675397
- Publication, EPODOC
- EP0675397
- Application
- 95302018
- Application, DOCDB
- 95302018
- Application, EPODOC
- EP19950302018
Titles6
- German
- Verfahren zur Inspektion eines Negativfilmes in einem photographischen Behandlungsgerät
- English
- Method of inspecting a negative film in a photographic processing apparatus
- French
- Méthode pour l'inspection d'un film négatif dans un appareil de traitement photographique
- German
- Verfahren zur Inspektion eines Negativfilmes in einem photographischen Behandlungsgerät.
- English
- Method of inspecting a negative film in a photographic processing apparatus.
- French
- Méthode pour l'inspection d'un film négatif dans un appareil de traitement photographique.
Classification
- CPC, 2
- G03B27/6285
- G03B1/60
- IPC, 4
- G03B27 32
- B65H43 04
- G03B1 60
- G03B27 62
Designated states6
- Contracting states, 6
- Switzerland
- Germany
- France
- United Kingdom
- Italy
- Liechtenstein