EP0444843A2

Interference sensor and method of measuring a physical quantity using such an interference sensor.

Abstract

An interference sensor passes radiation from a source (10) and a polariser (30) to a loop (40) of optical fiber so that radiation beams circulate in opposite directions around the loop (40) and interfere. The loop (40) contains an optical phase modulation (50) which imposes an optical modulation on the radiation beams circulating on the loop (40). A converter (70) detects the interfering and modulated beams and generates an interference signal which is then processed by an analyser (100). The interference in the loop (40) is dependent on rotation of the loop (40) and therefore analysis of the interference signal permits that rotation to be measured. In the present invention, the interference signal is (i) sampled at a frequency different from that of the optical modulation, or (ii) electronically modulated on the analyser at a frequency different from that of the optical modulation, or (iii) optically modulated in the loop (40) at a second optical modulation frequency. The analysis in the analyser (100) may be in the frequency domain (i.e. consideration being given to the frequency of the interference signal) or in the time domain, (i.e. independent of frequency).

EP0444843A2, drawing sheet 1
Sheet 1 of 51

Term

Term ended

Projected expiry passed 25 February 2011, 15.6 years ago.

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34 claims: 16 independent, 18 dependent

  1. 1
    An interference sensor for measuring a physical quantity, comprising:a source (10) for generating radiation;means (40) for generating first and second radiation beams from said radiation, the phase relationship between the first and second radiation beams being dependent on said physical quantity;an optical phase modulator (50) for modulating said first and second radiation beams with an optical phase modulation;means (22) for causing said first and second radiation beams to interfere and thereby to generate an interference beam;means (70) for generating an electronic interference signal from said interference beam;and    an analyser (100) for analysing said electronic interference signal to derive said physical quantity;characterised in that:    said analyser (100) has means (120) for obtaining a Fourier line spectrum of said electronic interference signal, means (140) for generating a predetermined sampling frequency, and means (17) for investigating a property of a frequency component corresponding to a difference relationship between the frequency of at least one line of said Fourier line spectrum and said predetermined sampling frequency.
  2. 5
    An interference sensor according to any one of the preceding claims, wherein the predetermined sampling frequency is less than the frequency of said at least one line of said Fourier line spectrum.
  3. 6
    An interference sensor according to any one of the preceding claims, wherein said means (40) for generating first and second radiation beams is a loop of optical fiber arranged such that said first and second radiation beams propagate in opposite directions around said loop.
  4. 7
    An interference sensor according to any one of the preceding claims, having means (150) for varying said predetermined sampling frequency.
  5. 8
    An interference sensor according to any one of the preceding claims, wherein said analyser (100) also has means (201) for electronically modulating said electronic interference signal by a periodic electronic modulation of predetermined frequency to obtain a modulated signal, and means for obtaining a Fourier line spectrum of modulated signal.
  6. 9
    An interference sensor according to any one of the preceding claims, further including means (60) for imposing a further optical phase modulation on said first and second radiation beams at a second modulation frequency, and said analyser (100) is arranged to analyse said interference signal in dependence on said further optical phase modulation.
  7. 10
    An interference sensor for measuring a physical quantity, comprising:a source (10) for generating radiation;means (40) for generating first and second radiation beams from said radiation, the phase relationship between the first and second radiation beams being dependent on said physical quantity;an optical phase modulator (50) for modulating said first and second radiation beams with an optical phase modulation;means (22) for causing said first and second radiation beams to interfere and thereby to generate an interference beam;means (70) for generating an electronic interference signal from said interference beam;and    an analyser (100) for analysing said electronic interference signal to derive said physical quantity;characterised in that:    said analyser (100) has means (201) for electronically modulating said electronic interference signal by a periodic electronic modulation of at least one frequency to obtain a modulated signal;means (203) for obtaining a Fourier line spectrum of said modulated signal;and means (170) for investigating a property of a frequency component corresponding to a difference relationship between the frequency of at least one line of said Fourier line spectrum and said at least one frequency.
  8. 13
    An interference sensor according to any one of claims 10 to 12, wherein said difference relationship is the difference between said at least one frequency and the frequency of said at least one line of said Fourier line spectrum.
  9. 14
    An interference sensor according according to any one of claims 10 to 13 further including means (60) for imposing a further optical phase modulation on said first and second radiation beams at a second modulation frequency and said analyser (100) is arranged to analyse said interference signal in dependence on said further optical phase modulation.
  10. 15
    An interference sensor for measuring a physical quantity, comprising:a source (10) for generating radiation;means (40) for generating first and second radiation beams from said radiation, the phase relationship between the first and second radiation beams being dependent on said physical quantity;an optical phase modulator (50) for modulating said first and second radiation beams with an optical phase modulation of a first modulation frequency;means (22) for causing said first and second radiation beams to interfere and thereby to generate an interference beam;means (70) for generating an electronic interference signal from said interference beam;and    an analyser (100) for analysing said electronic interference signal to derive said physical quantity;characterised in that:    the interference sensor (100) further includes means (60) for imposing a further optical phase modulation on said first and second radiation beams at a second modulation frequency;and    said analyser (100) is arranged to analyse said interference signal in dependence on said further optical phase modulation said analyser having means for obtaining a Fourier line spectrum of said electronic interference signal and means for investigating a property of a frequency component corresponding to a difference relationship between the frequency of at least one line of said Fourier line spectrum and said first and second modulation frequencies.
  11. 18
    An interference sensor according to any one of claims 15 to 17, wherein said difference relationship is the difference between:a) the difference between the product of said first modulation frequency and a first integer and the product of said second modulation frequency and a second integer;and b) the product of the frequency of said at least one line of said Fourier line spectrum and a third integer.
  12. 19
    An interference sensor for measuring a physical quantity, comprising:a source (10) for generating radiation;means (40) for generating first and second radiation beams from said radiation, the phase relationship between the first and second radiation beams being dependent on said physical quantity;an optical phase modulator (50) for modulating said first and second radiation beams with an optical phase modulation;means (22) for causing said first and second radiation beams to interfere and thereby to generate an interference beam;means (70) for generating an electronic interference signal from said interference beam;and    an analyser (100) for analysing said electronic interference signal to derive said physical quantity;characterised in that:    said analyser (100) has means (170) for measuring the value of a time-dependent feature of said electronic interference signal independent of fequency, and means for deriving from said value the relationship between said electronic interference signal and said physical quantity.
  13. 22
    An interference sensor according to any one of claims 19 to 21, wherein said analyser further includes means (140) for generating a predetermined sampling rate and means (170) for sampling said electronic interference signal at said predetermined sampling rate.
  14. 24
    An interference sensor according to any one of claims 19 to 23, wherein said analyser further includes means (201) for electronically modulating said electronic modulation of at least one frequency.
  15. 25
    An interference sensor according to any one of claims 19 to 24, further including means (60) for imposing a further optical phase modulation on said first and second radiation beams at a second modulation frequency and said analyser means is arranged to analyse said interference signal in dependence on said further optical phase modulation.
  16. 26
    An interference sensor according to any one of claims 19 to 25, wherein said means (44) for generating first and second radiation beams is a loop of optical fiber arranged such that said first and second radiation beams propagate in opposite directions around said loop.
  17. 27
    An electronic analyser for an optical sensor, said electronic analyser having means for obtaining a Fourier line spectrum of an electronic interface signal from said optical sensor, means for generating a predetermined sampling frequency, and means for investigating a property of a frequency component corresponding to a difference relationship between the frequency of at least one line of said Fourier line spectrum and said predetermined sampling frequency.
  18. 28
    An electronic analyser for an optical sensor, said electronic analyser has means for electronically modulating an electronic interference signal from said optical sensor by a periodic electronic modulation of at least one frequency to obtain a modulated signal, means for obtaining a Fourier line spectrum of said modulated signal;and means for investigating a property of a frequency component corresponding to a difference relationship between the frequency of at least one line of said Fourier line spectrum and said at least one frequency.
  19. 29
    A vehicle control system having a) an interference sensor according to any one of claims 1 to 26;b) means for generating a vehicle control signal from the measurement of said physical quantity;and c) means responsive to said vehicle control signal for controlling said vehicle.
  20. 30
    A method of measuring a physical quantity, comprising the steps of:a) generating first and second radiation beams such that the phase relationship between the first and second beams is dependent on said physical quantity;b) modulating said first and second radiation beams with an optical phase modulation;c) causing said modulated first and second beams to interfere so as to generate an interference beam;d) generating an electronic interference signal from said interference beam;and e) analysing said electronic interference signal to derive said physical quantity;characterised in that:    said step (e) includes obtaining a Fourier line spectrum of said electronic interference signal, and investigating a property of a frequency component corresponding to a different relationship between the frequency of at least one line of said Fourier line spectrum and a predetermined frequency.
  21. 31
    A method of measuring a physical quantity, comprising the steps of:a) generating first and second radiation beams such that the phase relationship between the first and second beams is dependent on said physical quantity;b) modulating said first and second radiation beams with an optical phase modulation;c) causing said modulated first and second beams to interfere so as to generate an interference beam;d) generating an electronic interference signal from said interference beam;and e) analysing said electronic interference signal to derive said physical quantity;characterised in that:    said step (e) includes obtaining a Fourier line spectrum of said electronic interference signal, and investigating a property of a frequency component corresponding to a difference relationship between the frequency of at least one line of said Fourier line spectrum and a predetermined sampling frequency.
  22. 32
    A method of measuring a physical quantity, comprising the steps of:a) generating first and second radiation beams such that the phase relationship between the first and second beams is dependent on said physical quantity;b) modulating said first and second radiation beams with an optical phase modulation;c) causing said modulated first and second beams to interfere so as to generate an interference beam;d) generating an electronic interference signal from said interference beam;and e) analysing said electronic interference signal to derive said physical quantity;characterised in that:    said step (e) includes modulating said electronic interference signal by a periodic electronic modulation of at least one frequency to obtain a modulated signal, obtaining a Fourier line spectrum of said modulated signal, and investigating a property of a frequency component corresponding to a difference relationship between the frequency of at least one line of said Fourier line spectrum and said at least one frequency.
  23. 33
    A method of measuring a physical quantity, comprising the steps of:a) generating first and second radiation beams such that the phase relationship between the first and second beams is dependent on said physical quantity;b) modulating said first and second radiation beams with an optical phase modulation;c) causing said modulated first and second beams to interfere so as to generate an interference beam;d) generating an electronic interference signal from said interference beam;and e) analysing said electronic interference signal to derive said physical quantity;characterised in that:    the method further includes the step of imposing a further optical phase modulation on said first and second radiation beams at a second modulation frquency, obtaining a Fourier line spectrum of said electronic interference signal, and investigating a property of a frequency component corresponding to a difference relationship between the frequency of at least one line of said Fourier line spectrum and said first and second modulation frequencies.
  24. 34
    A method of measuring a physical quantity, comprising the steps of:a) generating first and second radiation beams such that the phase relationship between the first and second beams is dependent on said physical quantity;b) modulating said first and second radiation beams with an optical phase modulation;c) causing said modulated first and second beams to interfere so as to generate an interference beam;d) generating an electronic interference signal from said interference beam;and e) analysing said electronic interference signal to derive said physical quantity;characterised in that:    said step (e) includes measuring the value of a time-dependent feature of said electronic signal independent of frequency, and deriving from said value the relationship between said electronic interference signal and said physical quantity.
Independent claims24