Method and apparatus for semiconductor chip transducer
Abstract
A motion transducer fabricated from a semiconductor material by etched exposure and release of a resiliently suspended element (16). Electrical sensing and/or torquing is applied to the suspended element (16) to produce mass or vibrational sensitivities to provide a transducer for various physical parameters. In the case of a gyroscopic transducer a mass (28) is applied to the element and may be applied in a balanced configuration on either side. The semiconductor element and electrodes (30,32) may be isolated by the use of buried PN junctions or dielectric layers, and a separately formed insulating dielectric bridge may be used to provide a support link between the suspended element (16) and the remainder of the semiconductor material. A specific crystal orientation is useful in permitting etch control in freeing the suspended element from the remainder of the material. Suspension link stress relief is provided and a waffle construction achieved in the suspended element for use in motional transduction.

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Projected expiry passed 18 January 2011, 15.7 years ago.
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1 sheet
Sheet 1
Every citation, both ways
| Document | Relation | Office | Category | Cited during | Relevant claims |
|---|---|---|---|---|---|
| EP0223694A2 | Cites | European Patent Office (EPO) | A | Search report | 29,33,34 |
| EP0339912A2 | Cites | European Patent Office (EPO) | A | Search report | 29,33,34 |
| EP0342391A1 | Cites | European Patent Office (EPO) | XA | Search report | 33 |
| GB2198231A | Cites | United Kingdom | A | Search report | – |
| US4598585A | Cites | United States of America | DXA | Search report | 1-17,25-27,29,31,32,35,36 |
| US4699006A | Cites | United States of America | XA | Search report | 1-17,25-27,29,31,32,35,36 |
23 members in 7 offices
Priority claims3
| Document | Office | Kind | Date |
|---|---|---|---|
| 479854 | United States of America | – | |
| 47985490 | United States of America | A | |
| US19900479854 | – | – | – |
Members23
| Document | Office | Kind | |
|---|---|---|---|
| US5016072A | United States of America | A | |
| CA2034663A1 | Canada | A1 | |
| EP0442280A2 | European Patent Office (EPO) | A2 | |
| CA2057919A1 | Canada | A1 | |
| WO9114285A1 | World Intellectual Property Organization (WIPO) | A1 | |
| US5060039A | United States of America | A | |
| EP0472717A1 | European Patent Office (EPO) | A1 | |
| US5111693A | United States of America | A | |
| US5126812A | United States of America | A | |
| EP0472717A4 | European Patent Office (EPO) | A4 | |
| US5195371A | United States of America | A | |
| JPH05502945A | Japan | A | |
| JPH05133976A | Japan | A | |
| US5216490A | United States of America | A | |
| US5473945A | United States of America | A | |
| EP0442280A3This record | European Patent Office (EPO) | A3 | |
| US5635739A | United States of America | A | |
| EP0472717B1 | European Patent Office (EPO) | B1 | |
| AT154166T | Austria | T | |
| DE69126381D1 | Germany | D1 | |
| DE69126381T2 | Germany | T2 | |
| CA2034663C | Canada | C | |
| CA2057919C | Canada | C |
9 legal events, as the office reported them to INPADOC
Over the term
Point at a mark for the eventEvents
| Event | Code | |
|---|---|---|
| Application refused18R | 18R | |
| Information on the status of an ep patent application or granted ep patentGrantedSTATUS: THE APPLICATION HAS BEEN REFUSEDSTAA | STAA | |
| Despatch of communication of intention to grantORIGINAL CODE: EPIDOS AGRAGRAG | GRAG | |
| First examination report despatched17Q | 17Q | |
| Request for examination filed17P | 17P | |
| Designated contracting statesAK | AK | |
| Search report despatchedORIGINAL CODE: 0009013PUAL | PUAL | |
| Designated contracting statesAK | AK | |
| Public reference made under article 153(3) epc to a published international application that has entered the european phaseORIGINAL CODE: 0009012PUAI | PUAI |
Numbers
- Publication
- 0442280
- Publication, DOCDB
- 0442280
- Publication, EPODOC
- EP0442280
- Application
- 91100592
- Application, DOCDB
- 91100592
- Application, EPODOC
- EP19910100592
Titles3
- English
- Method and apparatus for semiconductor chip transducer
- German
- Verfahren und Apparat für Halbleitermesswertaufnehmer in integrierter Technik
- French
- Procédé et appareil pour transducteur à puce semi-conductrice
Classification
- CPC, 4
- G01C19/5719
- G01P15/0802
- G01P15/0888
- G01P2015/0828
- IPC, 4
- G01C19 56
- G01L1 18
- G01P15 08
- H01L29 84
Designated states14
- Contracting states, 14
- Austria
- Belgium
- Switzerland
- Germany
- Denmark
- Spain
- France
- United Kingdom
- Greece
- Italy
- Liechtenstein
- Luxembourg
- Netherlands (Kingdom of the)
- Sweden