Nova Patents
EP0404598A2

Interpolator.

Abstract

An interpolator, particularly for use with an optical grating for detecting position in a metrological apparatus, receives input signals in quadrature. One of the input signals is squared and the two signals are multiplied together to provide further signals in quadrature at twice the frequency of the input signals. One of the further signals is also squared and the further signals are multiplied together to provide output signals at four times the frequency of the input signals. Filtering is provided to remove DC components, such as due to drift. In the illustrated metrological apparatus, the zero crossing points of the output signals are detected to effect sampling, with high resolution, of a surface sensor output. Interpolation noise occurs at a high frequency and is removed by low pass filtering of the sample signal from the surface sensor.

EP0404598A2, drawing sheet 1
Sheet 1 of 13

Term

Term ended

Projected expiry passed 22 June 2010, 16.3 years ago.

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16 claims: 5 independent, 11 dependent

  1. 1
    An interpolator (32) for receiving quadrature input signals at a first frequency and producing quadrature output signals at a second frequency which is a multiple of the first frequency, comprising means for producing first and second signals at double the input frequency and substantially in quadrature if the input signals are in quadrature, characterised in that the producing means comprises means (60a) for squaring only one of the input signals to provide the first signal and means (60b) for multiplying the input signals together to provide the second signal.
  2. 4
    An interpolator according to any of claims 1 to 3 wherein the second signal is obtained using the trigonometric identity sinAcosA = (sin2A)/2.
  3. 5
    An interpolator according to any of claims 1 to 4, including high pass filtering means (56a, 56b) for removing DC drift components.
  4. 12
    An interpolator according to any one of the preceding claims in association with a zero-crossing detector (38) which receives the signals output by the interpolator (32).
  5. 14
    Metrological apparatus comprising a surface sensor (16, 18, 19), means (20) for causing said sensor to traverse the surface (6) of a workpiece (4), and means for sampling the output of the surface sensor during said traversing, said sampling means comprising a position detector (22, 24, 26, 27) for producing first quadrature signals in response to said traversing, an interpolator (32) according to any of claims 1 to 12 for producing further quadrature signals at a frequency which is a multiple of the frequency of the first quadrature signals, and means (40, 42) to effect said sampling in response to a predetermined condition in each of said further quadrature signals.