An isfet chip suitable to be used in an apparatus comprising a measuring circuit for selectively measuring ions in a liquid
Abstract
An ISFET chip suitable to be used in an apparatus comprising a measuring circuit for selectively measuring ions in a liquid, said ISFET chip including a source and a drain diffused in bulk of the chip and provided with a source contact element and a drain contact element, as well as provided with means for protection of the ISFET from damage due to the presence of high voltages, having as the protection means an electrode on the chip closely adjacent to the gate region of the ISFET, said electrode taking the form of a metallic ring applied around the gate region of the ISFET.

Term
Term ended
Projected expiry passed 23 August 2004, 22.1 years ago.
- Priority
- Filed
- Published
- Projected expiry
- Today
1 sheet
Sheet 1
Every citation, both ways
| Document | Relation | Office | Category | Cited during |
|---|---|---|---|---|
| EP0043284A2 | Cites | European Patent Office (EPO) | A | Search report |
| GB2060255A | Cites | United Kingdom | A | Search report |
| US4020830A | Cites | United States of America | AD | Search report |
| US4086642A | Cites | United States of America | AD | Search report |
| US4397714A | Cites | United States of America | A | Search report |
| US4514646A | Cites | United States of America | A | Search report |
16 members in 6 offices
Priority claims6
| Document | Office | Kind | Date |
|---|---|---|---|
| 8302963 | Netherlands (Kingdom of the) | A | |
| 8302963 | Netherlands (Kingdom of the) | – | |
| 641911 | United States of America | – | |
| 64191184 | United States of America | A | |
| NL19830002963 | – | – | – |
| US19840641911 | – | – | – |
Members16
| Document | Office | Kind | |
|---|---|---|---|
| NL8302963A | Netherlands (Kingdom of the) | A | |
| EP0139312A2 | European Patent Office (EPO) | A2 | |
| JPS6089744A | Japan | A | |
| EP0139312A3 | European Patent Office (EPO) | A3 | |
| US4589970A | United States of America | A | |
| CA1228894A | Canada | A | |
| EP0307973A2 | European Patent Office (EPO) | A2 | |
| EP0139312B1 | European Patent Office (EPO) | B1 | |
| DE3480430D1 | Germany | D1 | |
| EP0307973A3This record | European Patent Office (EPO) | A3 | |
| EP0307973B1 | European Patent Office (EPO) | B1 | |
| DE3486239D1 | Germany | D1 | |
| DE3486239T2 | Germany | T2 | |
| JPH06308078A | Japan | A | |
| JPH0765982B2 | Japan | B2 | |
| JPH0774794B2 | Japan | B2 |
26 legal events, as 2 offices reported them to INPADOC
Over the term
Point at a mark for the eventEvents
| Event | Code | Office | |
|---|---|---|---|
| Nl: ceased due to reaching the maximum lifetime of a patentCeasedNLV7 | NLV7 | EP | |
| Patent expired after termination of 20 yearsExpiredPE20 | PE20 | GB | |
| Lapsed in a contracting state [announced via postgrant information from national office to epo]LapsedPG25 | PG25 | EP | |
| Lapsed in a contracting state [announced via postgrant information from national office to epo]LapsedPG25 | PG25 | EP | |
| Annual fee paid to national office [announced via postgrant information from national office to epo]GrantedPGFP | PGFP | EP | |
| Annual fee paid to national office [announced via postgrant information from national office to epo]GrantedPGFP | PGFP | EP | |
| Annual fee paid to national office [announced via postgrant information from national office to epo]GrantedPGFP | PGFP | EP | |
| Annual fee paid to national office [announced via postgrant information from national office to epo]GrantedPGFP | PGFP | EP | |
| European patent in force as of 2002-01-01IF02 | IF02 | GB | |
| No opposition filedOpposition26N | 26N | EP | |
| No opposition filed within time limitOppositionORIGINAL CODE: 0009261PLBE | PLBE | EP | |
| Information on the status of an ep patent application or granted ep patentGrantedSTATUS: NO OPPOSITION FILED WITHIN TIME LIMITSTAA | STAA | EP | |
| Fr: translation filedET | ET | EP | |
| Corresponds to:REF | REF | EP | |
| Divisional application: reference to earlier applicationAC | AC | EP | |
| Designated contracting statesAK | AK | EP | |
| It: translation for a ep patent filedITF | ITF | EP | |
| It: translation for a ep patent filedITF | ITF | EP | |
| (expected) grantORIGINAL CODE: 0009210GRAA | GRAA | EP | |
| First examination report despatched17Q | 17Q | EP | |
| Request for examination filed17P | 17P | EP | |
| Designated contracting statesAK | AK | EP | |
| Search report despatchedORIGINAL CODE: 0009013PUAL | PUAL | EP | |
| Divisional application: reference to earlier applicationAC | AC | EP | |
| Designated contracting statesAK | AK | EP | |
| Public reference made under article 153(3) epc to a published international application that has entered the european phaseORIGINAL CODE: 0009012PUAI | PUAI | EP |
Numbers
- Publication
- 0307973
- Publication, DOCDB
- 0307973
- Publication, EPODOC
- EP0307973
- Application
- 19880200725
- Application, DOCDB
- 88200725
- Application, EPODOC
- EP19880200725
Titles3
- English
- AN ISFET CHIP SUITABLE TO BE USED IN AN APPARATUS COMPRISING A MEASURING CIRCUIT FOR SELECTIVELY MEASURING IONS IN A LIQUID
- German
- Ionenselektiver Feldeffekttransistor, der in einer Vorrichtung mit einer Messschaltungen zur selektiven Messung von Ionen in einer Flüssigkeit gebraucht werden kann
- French
- Transistor à effet de champ sensible aux ions pouvant être utilisé dans un appareil comportant un circuit de mesure pour mesurer sélectivement les ions dans un liquide
Classification
- CPC, 1
- G01N27/4148
- IPC, 5
- A61B5 145
- A61B5 1473
- G01N27 27
- G01N27 30
- G01N27 414
Designated states5
- Contracting states, 5
- Germany
- France
- United Kingdom
- Italy
- Netherlands (Kingdom of the)