Process for controlling solder joint geometry when surface mounting a leadless integrated circuit package on a substrate
Abstract
A solder joint assembly technique applies controlled volumes of solder to pads of both package and substrate (31, 32). The two units are positioned adjacent each other with the pads and solder deposits mechanically maintained in registration with each other (34, 35). The assembly is reflowed and the final separation between package and substrate at which the resulting solder joint solidifies is mechanically controlled in order to control a geometry of the resultant solidified joint (36, 37). The solder volume deposits may assume various forms including spherical bumps and solder paste deposits.

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Projected expiry passed 21 May 2007, 19.3 years ago.
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1 sheet
Sheet 1
Every citation, both ways
| Document | Relation | Office | Category | Cited during |
|---|---|---|---|---|
| EP0147576A1 | Cites | European Patent Office (EPO) | X | Search report |
| IBM TECHNICAL DISCLOSURE BULLETIN, vol. 16, no. 3, August 1973, page 767, NY, US, V.D. Coombs: 'Chip mounting with prestretched joints' | Non-patent | – | – | Search report |
| PATENT ABSTRACTS OF JAPAN, vol. 9, no. 47 (E-299)(1770) 27-02-1985 & JP-A-59 188155 (HITACHI MAIKURO COMPUTER ENGINEERING K.K.) 25-10-1984 | Non-patent | – | – | Search report |
| IBM TECHNICAL DISCLOSURE BULLETIN, vol. 23, no. 5, October 1980, page 2156, NY, US, A.F. Galloway et al.: 'Stand-offs for chip alignment as well as controlled collapse in chip joining' | Non-patent | – | – | Search report |
5 members in 3 offices; this record represents the family
Priority claims2
| Document | Office | Kind | Date |
|---|---|---|---|
| 868988 | United States of America | – | |
| 86898886 | United States of America | A |
Members5
| Document | Office | Kind | |
|---|---|---|---|
| EP0248566A2 | European Patent Office (EPO) | A2 | |
| JPS6312142A | Japan | A | |
| US4878611A | United States of America | A | |
| EP0248566A3This record | European Patent Office (EPO) | A3 | |
| JP2559408B2 | Japan | B2 |
16 legal events, as the office reported them to INPADOC
Over the term
Point at a mark for the eventEvents
| Event | Code | |
|---|---|---|
| Information on inventor provided before grant (corrected)RIN1 | RIN1 | |
| Information on inventor provided before grant (corrected)RIN1 | RIN1 | |
| Appeal reference modifiedAppealORIGINAL CODE: EPIDOSCREFNEAPAF | APAF | |
| Application refused18R | 18R | |
| Information on the status of an ep patent application or granted ep patentGrantedSTATUS: THE APPLICATION HAS BEEN REFUSEDSTAA | STAA | |
| Appeal dossier modifiedAppealORIGINAL CODE: EPIDOS NOAPEAPAB | APAB | |
| Communication from the board of appeal sentAppealORIGINAL CODE: EPIDOS OBAPEAPCB | APCB | |
| Communication from the board of appeal sentAppealORIGINAL CODE: EPIDOS OBAPEAPCB | APCB | |
| Party data changed (applicant data changed or rights of an application transferred)RAP3 | RAP3 | |
| Party data changed (applicant data changed or rights of an application transferred)RAP1 | RAP1 | |
| First examination report despatched17Q | 17Q | |
| Request for examination filed17P | 17P | |
| Designated contracting statesAK | AK | |
| Search report despatchedORIGINAL CODE: 0009013PUAL | PUAL | |
| Designated contracting statesAK | AK | |
| Public reference made under article 153(3) epc to a published international application that has entered the european phaseORIGINAL CODE: 0009012PUAI | PUAI |
Numbers
- Publication
- 0248566
- Application
- 873045108
Titles3
- German
- Verfahren zur Kontrolle der Geometrie der Lötverbindung während der Montage eines Halbleiterbauelementes ohne Verdrahtung auf einer Substratoberfläche
- English
- Process for controlling solder joint geometry when surface mounting a leadless integrated circuit package on a substrate
- French
- Procédé pour contrôler la géométrie des raccords de soudure lors du montage d'un dispositif à circuit intégré sans fils de connection sur la surface d'un substrat
Classification
- CPC, 20
- H10W72/20
- H05K3/303
- H05K3/3436
- H05K2201/035
- H05K2201/0379
- H05K2201/09909
- H05K2201/10568
- H05K2201/10734
- H05K2201/2036
- H05K2203/043
- H05K2203/0465
- H05K2203/167
- H05K3/3485
- Y02P70/50
- H10W72/252
- H10W72/07211
- H10W72/07227
- H10W72/241
- H10W72/072
- H10W72/07236
- IPC, 4
- B23K1 00
- H01L21 60
- H05K3 30
- H05K3 34
Designated states1
- Contracting states, 1
- Sweden