EP0147529A2

Process for the determination of the position and/or dimensions of an object to be tested, and device for carrying it out.

Abstract

In such a process, a test object is touched by a relative thereto movable switch button (S) and the relative position between the UUT and the switching button (S) of a measuring device (L) measured. The switching button (S) is at the time of its contact with the test object from a signal for retaining the present at that time measured value of the measuring device (L). Since these by the measuring device (L) measured values ​​determined as a function of the probing and / or the material pairing between the switching button (S) and the test object is erroneous, at the time of contact present measured value in an adder (AD) in advance is determined, in a memory (Mi) Stored correction values ​​for the probing and / or previously determined, in a memory (M2) Stored correction values ​​for the combination of materials applied (Figure 3).

EP0147529A2, drawing sheet 1
Sheet 1 of 3

Term

Term ended

Projected expiry passed 28 August 2004, 22.1 years ago.

  1. Priority
  2. Filed
  3. Published
  4. Projected expiry
  5. Today

11 claims: 4 independent, 7 dependent

  1. c-de-0001
    1. A method for determining the position and / or dimensions of a test object by means of a movable relative to this shift key and at least one measuring device for measuring the relative position between the UUT and the switching button, at which the switching button at the time of contact with the test object, a signal for holding of the then current measured value of the measuring device generates, characterized in that in advance depending on the probing and / or the material pairing between the switching button (S) and the test object (P) determined correction values ​​for correcting the probing and / or the material pairing erroneous readings are taken.
  2. c-de-0005
    5. The method according to claims 1 and 2, characterized in that the by the measuring device (L) supplied measured value in an adder (AD) with the respective correction values ​​of the memories (M1, M2) Is applied.
  3. c-de-0006
    6. The method according to claims 1 and 5, characterized in that the adder (AD) by a computer of a control device (ST) for relative displacement between the switching probe (S) and the test object (P) is formed.
  4. c-de-0007
    7. The method according to claims 2 and 6, characterized. in that the memory (M1) By the control device (ST) and the memory (M2) Are acted upon by an input unit (E) to select the designated correction values.