Method and apparatus for reading thermoluminescent phosphors

5,~578 4929 The technical field of this invent;on includes apparatus and methods for reading thermoluminescent phosphors to determine the level of excitation which has occurred from exposure of the phosphors to ionizing radiation .

It is well kilown in the art that certain materials called thermoluminescent phosphors can be irradiated with high energy radiation, and then subsequently stimulated using heat, to produce a luminescent emission.

Thermoluminescent phosphors are in widespread use in radiation dosimeters used to rneasvre the amollnt of incident r~diation to which people, animals, plants and other things are exposed.

Thermoluminescent dosimeters are widely usecl by workers in the nuclear industries to provide a constant monitor for measuring exposure to radiation.

Thermoluminescent phosphors are excited by energetic radiation such as ultraviolet, X-ray, gamma, and other forms of radiation.

Such ioni~i~g radiation causes electrons within the thermoluminescent material to become highly energized.

The nature of thermoluminescent materials cause these high energy electrons to be trapped at relatively stable higher energy levels.

The electrons stay at these higher energy levels until additional energy, usually in the form of heat, is supplied which releases the 2 0 trapped electrons thereby allowing them to fall back to a lower energy state.

The return of the electrons to a lower energy state causes a release of energy primarily in the form of visible light which is ordinarily termed a luminescent emission.

The use of thermoluminescent phosphors in personal dosimeters has led to demand for a large number of dosimeters which must be read on a routine basis in order to monitor the possible exposure of persons or other objects to ionizing radiation.

Because of the substantial numbers, the job of reading dosimeters becomes time-consuming and costly.

1~492~ 5A~357~ There are four commonlv known methods s~f heating thermoluminescent material in order to release the trapped electrons and provide the luminescent emission which is measured as an indication of the amount of ionizing radiation to which the dosimeter was exposed.

The first and most 5 common method for heating thermoluminescent phosphors is by contact heating.

The second method is heating using a hot gas stream which is impinged upon the phosphor.

The third method uses radiant energy in the form of infrared beams which heat the luminescent phosphor.

The fourth method uses inIrared laser beams to provide the necessary heat for 10 luminescent emi~;sion.

Contact heating is the most widespread, but is also the most time-consuming and unreliable.

Conventional contact heating occurs using a hot finger or contacting probe which produces a highly non-uniform temperature distribution in the phosphor being heated.

This is 15 particularly true when thin layer or film type dosimeter configurations are used.

Contact heating has also been found unacceptable for reading dosimeters used to measure relatively low energy beta ray doses.

Heating of phosphors using a hot gas stream has proven to be faster and more uniform than contact heating.

Unfortunately, this method of 2 0 heating requires rather large scale heat exchanger equipment and is fairly costly to implement.

Heating with infrared beams has provided improved results over contact and hot gas heating.

One example of such a thermoluminescent phosphor reading apparatus is shown in U . S .

Patent No. 4, 204 ,119 to 25 Yasuno et al.

The Yasuno patent shows an apparatus using an infrared emitting incandescent lamp which rapidly heats the back surface of a substrate. A small amount of thermoluminescent powder is attached to the substrate on the opposite side from the surface exposed to the infrared 1;Z3492~ 5~8578 beam.

Yasuno thus shows a configuration where the substrate is heated directly, and through conduction the heat is l:ransferred to the thermoluminescent powder.

United States Patent No. 3, 531, 641 to Weissenberg teaches the 5 manufacture of thermoluminescent ~osimeters containing thermoluminescent phosphors held in a synthetic material.

The synthetic material must be capable of surviving the heat and heating rays since it is used as a conductor of heat to the thermoluminescent phosphor which is contained therein .

The dosimeters and heating method described by Yasuno et al and Weissenberg have provided useful technology, but unfortunately are limited and have been found not entirely satisfactory for thermoluminescent dosimetry used in medical research, radiation therapy, and personal and environmental rnonitoring.

Such applications preferably use or require 15 very small dosimeters using in many cases less than one milligram of thermoluminescent phosphor in the form of a small discrete dot or very thin layer.

In the case of thin layer dosimeters, it is desirable to have less than ten milligrams of thermoluminescent phosphor per square centimeter of dosimeter area.

Using such small amounts of 2 o thermoluminescent material requires that the material be heated in a very rapid manner in order to provide sufficient luminescent energy emission so that detectable levels of emission can be measured without being obscured by the electronic noise in the measuring equipment.

Rapid heating of such small amounts of luminescent phosphor to about 400C is severely slowed 25 when a substrate material must be initially heated in order to conduct heat to the thermoluminescent phosphor.

Heating of thermoluminescent phosphors by heat conduction through a substrate also severely limits the rate at which the material can be heated 1~49Z9 5A8578 for anotller reason.

If too much heat is applied very rapidly, the substrate material itself tends to ;ncandesce thereby creating luminous emissions which are sensed by the luminescent emission detection equlpment and translated into an erroneous reading of the dosimeter.

Accordingly, 5 the time required for reading thermoluminescent phosphors using conduction techni~ues has becn severely limited and the best known times are approximately one half second.

U . S .

Patent No. 3, 729, 63û to Yamashita et al discloses a thermolurninescent readout instrument utilizing an infrared laser source 10 which is used to heat a thermoluminescent dosimeter element.

Instruments constructed according to Yamashita et al have been found lacking in that the luminescent emission glow curve resulting from laser stimulation does not provide the characteristîc glow peak which is desirable for easy, accurate determination of the radiation levels to which the dosimeter was 15 exposed.

The current invention has identified that nonuniformity in the laser beam power density and also instabilities over time in the power output of the laser contribute to a lack of speed and accuracy in reading thermoluminescent phosphors.

The nonuniformity in laser beam power 20 appears to be a characteristic of carbon dioxide lasers used in this type of application.

Carbon dioxide lasers typically produce a laser beam exhibiting a Gaussian or bell-shaped curve when power or intensity is graphically plotted as a function of beam cross sectional position.

This nonuniform beam power profile causes localized intense heating at the 2 5 center of the beam because of the substantially higher amounts of power being released thereat.

This nonuniform beam power profile causes temperatures to vary greatly, even across the small distances from the center to the outside of the laser beam.

4929 5A8578 Instabilities in the power output of the laser with time have also been identified in the current invention as a contributing factor making the resulting glow curves from the luminescent phosphors less capable of accurate interpretation.

It has been previously known that laser power 5 can be made more constant over time using temperature stabilizing devices, or closed loop controlled piezoelectric pushers which move the laser mirrors relative to one another in quick response to the thermally induced motions of the laser components.

The temperature stabilization techni~ues for stabilizing laser power output are not totally effective. in part because of 10 the very slow response times.

The piezoelectric pushers are very expensive and accordingly have not been widely used.

It is an object of this invention to provide thermoluminescent phosphor reading apparatus which can very rapidly stimulate thermoluminescent phosphors in a manner that allows accurate and reliable 15 measurement of the resulting luminescent emissions.

It is another object of this invention to provide methods by which thermoluminescent phosphors can be very rapidly stimulated using a laser source adapted to provide a uniform beam profile to produce very accurate and repeatable luminescent emissions wh;ch are indicative of the amount of 2 0 ionizing radiation to which the original thermoluminescent material was exposed .

These and other objects and advantages of this invention will be apparent from the description given herein.

Preferred embodiments according to the invention are illustrated in 2 5 the accompanying drawings, in which:

Fig. 1 is a diagrammatic representation of a preferred embodiment thermoluminescent phosphor reading apparatus according to this invention;

5A8578 9Z9 Fig. 2 is a schematic representation s:)f electronic circuitry which can be used to construct the laser power detection and laser power signal enh~ncer portions shown in Fig. 1;

Fig. 3 is a schematic representation of electronic circuitry which can be used to construct the modulation control circuit and power reference signal generator portions shown in Fig. 1;

Fig. 4 is a schematic representation of electronic circuitry which can be use-l to construct the central control and operator control portions shown in Fig. l;

Fig. 5 is a graph showing two differcnt luminescent glow curves;

Fig. 6A is a graph showing a triangle wave and two laser control level signals;

Figs. 6B and 6C are graphs showing two different laser modulation signals used to modulate the laser power supply;

Fig. r is a timing diagram showing the relationship between the detector signal and control timing signals;

Fig. 8 is an alternative beam equalizing means; and Fig. 9 is a further alternative beam equalizing means; and ~ig. 10 is a still further alternative beam equalizing means.

2 0 A preferred form of apparatus according to this invention is shown in Fig. 1 and includes a laser beam source means 10 to provide the laser radiant energy for heating thermoluminescent phosphors being read.

Laser beam source means 10 includes a laser head 12 having a laser cavity 11, and preferably a laæer cooling and temperature stabilization unit 13 attached thereto for helping to stabilize the temperature and intensity level of laser cavity 11.

Laser beam source means 10 preferably emits a laser beam 16 which is preferably in the infrared spectrum so that the visible i~3~29 5A8578 light luminescent emissions can be distinguished therefrom.

Laser head 12 is powered by a laser powe-r supply 15.

~ Y~amples of acceptable instruments for constructing the laser beam source means 10 include a radio frequency carbon dioxide laser available 5 from Laakmann Electro-Optics, Model RF125.

The laser cooling and temperature stabiliæation unit 13 can advantageously be a I.aakman Electro-Optics Model RF165 cooling unit and Model TC16000 temperature controller.

Laser power supply 15 can advantageously be a radio frequency power sllpply such as Laakman Model RF250.

Such a radio 10 frequency power supply can advantageously be operated at 44 megahert~ or other suitable frequencies depending on the system employed.

Such a combination of components produces a laser beam 16 having a nominal power of 15 watts and a nominal beam diameter of 1.8 millimeters.

An alternative laser configuration could include a carbon dioxide wave 15 guide laser with a direct current high voltage excitation such as Model 82-40000 from California Laser.

Such a laser has the nominal power output of 45 watts.

Using such a model eliminates the need for the radio frequency power supply since the Model 82-40000 has a high voltage direct current power supply and also uses water cooling for temperature 2 0 stabilization .

Laser power supply 15 must be capable of being modulated to regulate the output power of the power supply and hence the output power of the laser beam 16 which is emitted from laser cavity 11.

In the case of a radio frequency power supply, the laser power supply 15 can be modulated 25 by varying the amplitude of the radio frequency voltage.

In the case of a direct current high voltage power supply the discharge current of the high voltage DC power supply is modulated to regulate the laser beam 1~3~9z9 5A~5~8 power.

ModulQtion of tlle laser power supply 15 may be possible using other alternative variations.

Laser beam 16 is emil ted from laser beam source means 10 and is advantageously, ~ut not necessarily, directed against a reflecti~e means 5 such as infrared mirror 17.

Reflected laser beam 16 then encounters a laser beam splitting means 18 which allows most of the beam to be transmitted directly therethrough and the remaining beam to be reflected toward a laser power detector 20.

Laser beam split,ting means 18 can advantageously be a thin sheet of material which is transpnrent to the 10,6 10 micrometer wavelength radiation produced by a typical S~O2 laser.

Examples of suitable materials include germanium, barium fluoride, or zinc selenide.

Thin flat pieces constructed of these and other suitable materials form windows which are usually antireflectively coated to provide high transmissibility.

Orientation of the beam splitting means at a 15 particular angle allows only a small percentage of the beam to be reflected, thereby forming detector beam 21.

Laser beam 16 is preferably polarized either within laser cavity 11 or at some point between laser beam source means 10 and infrared mirror 17.

Polarization of beam 16 is achieved using a polarization means which 2 o preferably provides time independent or fixed polarization .

Fixed polarization is needed because the reflective elements such as mirror 17 and beam splitter 18 have varying reflectiveness depending upon the polarization orientation of the beam.

Changes of polarization experienced in some lasers cause changes in the intensity of the reflected detector 25 beam 21.

This leads to erroneous power adjustments ~olely due to polarization changes.

An appropriate polarization means 118 can comprise a thin film of polarizing material well known in the art applied upon an optically flat 9Z9 5A8578 substrate which can advantageously be zinc selenide.

The composite is oriented with the incidence beam at the ~rewster angle of approximately 67 degrees from a line perpendicular to the surface of the polarizer.

Other alternative polarization means will be apparent to those skilled in the art.

~s an alternative to the lasers and polarizer described above, it may also be possible to use a laser having a polarizer integrated or inclllcied in the laser cavity.

An example of such a laser is Model No. LS35-P from Directed Energy , Inc ., Irvine , CA which can be equipped with an intracavitary polarizer.

Detector beam 21 from beam splitting me~ns 18 is directed to a laser power detector 20. A beam interruption means such as chopping wheel 23 can be used to limit the time during which detector beam 21 strikes laser power detector 20, Chopping wheel 23 is provided because a preferred form of laser power detector is not capable of continuously reading the power of detector beam 21.

Where alternative laser power detectors capable of continuous monitoring are used, then such a beam interruption means will be unnecessary.

Laser power detector 20 is preferably capable of responding very quickly to variations in the power of beam 16 and the resulting power of detector beam 21. A pre~erred laser pcwer detector 20 is a pyroelectric type detector.

An example of an acceptable pyroclectric detector is the Series 350 lead-zirconate-titanate detector manufactures~ by Barnes Engineering. I.aser power detector 20 monitors the power during the time that it is exposed to detector beam 21 when the aperture 24 of chopper 2 5 wheel 23 is properly positioned .

The chopper wheel is necessary becausesuch pyroelectric detectors are not capable of continuously measuring the laser power output.

The chopper wheel 23 is advantageously synchronized with the operation of the overall system so that beam 21 is allowed to pass 5A8578 1~3~929 through chopper wheel aperture 24 at times appropriate for control of thc primary laser beam power.

Preferably a number of power readings are taken during the period of time durir.g which the luminescent phosphor sample ~0 is being heated.

If the sample exposure time is 100 5 milliseconds, tllen chopping wheel 23 would be turned at a rate of approximately 100 revolutions per second, or sorne integer division thereof ir more than one aperture 24 is provided.

In addition to the pyroelectric detector and chopping wheel configuration shown in Fig. 1, it is also possible to use alternative laser 10 power detectors which are capable of continuously monitoring laser beam power.

One example of an alternative dctector which is capable of continuous monitoring is the photoconductive mercury-cadmium-telluride detectors that are known in the art.

These detectors are more costly but do provide the benefits of continuous monitoring.

In such a case the beam 15 interruption means 23 can be eliminated.

Other components relating to the electronic control of the system can also be eliminated in such an alternative embodiment.

Laser beam splitter 18 is designed and oriented so that the bulk of laser beam 16 passes directly therethrough.

The continuing laser beam 16 2 0 is directed to a shutter means 26 for controlling exposure of the thermoluminescent phosphor sample 40 to the laser beam.

Shutter means 26 can be selected from a variety of standard shutters available for high-powered lasers.

Shutter 26 is preferably electrically actuated and controlled by an electrical control signal coming from the central control 2 5 circuitry 75 .

Shutter means 26 is preferably oriented at an oblique angle so that the re~lected laser beam 16a (in phantom) is directed into a beam dump 28.

Beam dump 28 is designecl to stop the laser beam and to dissipate the 1~3'~9;29 5RB578 energy of the laser beam.

Bearn dump 28 can be of a variety of different types, with a heat resistant ceramic having provision for heat dîssipation being the preferred type.

Opening shutter means 26 allows laser beam 16 to continue 5 therethrough and the beam can advantageously be redirected by reflecting it off of a second reflective means such as infrared mirror 30.

Laser beam 16 is then preferably fed ;nto a bearn equaliæing means 31.

Beam equalizing means 31 can include a lens means 32 which preferably is a convex, hemispherical or other in-frared lens which 1 0 disperses the parallel laser light into a dispersed beam 35 which is directed into an optical channel means 33.

Optical channel means 33 has an optical channel 34 extending therethrough.

Optical channel 34 is an elongated passageway or channel for reflecting, aligning, and equalizing the clispersed laser beam 35 as it passes therethrough.

Optical channel 34 1 5 can have a square, round or other cross-sectional shape .

The inner walls of optical channel 34 are preferable highly polished and coated with a reflective substance, such as gold, to provide almost complete reflection of the dispersed laser beam 35.

Dispersed laser beam 35 is emitted from optical channel means 33 as an equalized laser beam 36 and preferably 2C beamed directly onto the luminescent phosphor sample 40 being read.

Fig. 8 shows an alternative beam equalizing means 150.

Beam equalizing means 150 reflects and disperses laser beam 16 from a convex reflector 151 and into an optical channel 152. Optical channel 152 is highly reflective and can be similar to optical channel 33.

The dispersed 25 laser beam 153 is beamed onto the concave surface of a parabolic or other focusing reflector 154.

The dispersed beam 153 is focused by parabolic reflector 154 onto an appropriate phosphor sample 155.

The relative position of sample 155 with respect to reflector 154 is preferably adjustable 11 1~3~ 9z9 5~8578 so that the clegree of focusing can be adjusted.

The heam equalizing means of Fig. 8 provides a nearly uniform power and intensity profile across the beam at the point of impingement upon sample 1~5.

l;'ig. 9 shows a further alternative beam equali:~ing means lfiO.

5 Incoming laser beam 16 is beamed through a convex lens 161 to disperse the beam into an optical channel means 162.

The resulting dispersed laser beam 163 is gathered b~ a focusing lens 164 and focused to a point near phosphor sample 165.

The relative position of sample 165 is advantageously adjustable so that the size and intensity of the impinging 10 beam can be adjusted as needed.

Fig. 10 shows a still further alternative beam equalizing means.

Incoming laser beam 16 is focused through a convex lens 219 onto a solid infrared transmissive fiber optic light guide 220.

Internal reflections within the optic fiber 220 produce an equalized beam similar to optical 15 channel 34.

Fig. 10 also shows a thermoluminescent phosphor sample 221 positioned at the end opposite from lens 219.

The thermoluminescent emission from sample 221 can be transmitted through a light guide similar to that shown in Fig. 1 at numeral 47 and then detected by a detector similar to detector 45.

This alternative beam equalizing means has the 2 0 advantage of allowing the laser beam to be directed to remote locations to perform readings in place at the remote measurement location.

The equalized laser beam 36 has an approximately uniform beam intensity and power profile.

Prior art laser beam heating techniques typically employed carbon dioxide or other laser beams which have an 2 5 approximately Gaussian beam intensity profile .

The Gaussian beam intensity profile causes the central areas of the beam to more rapidly heat the substrate or thermoluminescent material positioned at the center of the beam than at the edges.

Such nonuniformity in the heating laser beam 12 5~57~3 9Z9 causes localized incandescence to occur in the substrate material if power is increased.

Such incandescense substantially changes the characteristics of the glow curve produced by the thermolumillescent sample 40. ~ven if incandescense does ns~t occur, heating with a laser beam having a Gaussian 5 power profile also causes the phosphor to be heated nonuniformly.

The temperature threshold for thern~oluminescence accordingly propagates from an inner core outwardly, thus releasing the thermoluminescent emission over a period of time.

This delayed release greatly reduces the height of the measured luminescent emission glow peak.

The height of the glow 10 peak as well as the integral under the glow curve are used in analyzing the overall amount of ionizing radiation to which the phosphor has been e~posed .

Fig. 5 shows two glow curves produced in response to heating of a thermoluminescent sample with a carbon dioxide laser beam.

Curve 91 15 shows a typical thermoluminescent emission occurring when a sample is heated using an unequalized laser beam having an approximately Gaussian beam intensity.

Curve 91 rises rapidly, usually to a maximum, and then begins dropping off as the thermoluminescent temperature threshold propagates outwardly.

Curve 92 shows a theoretical glow curve which 2 0 occurs when the thermoluminescent phosphor is heated uniformly such as with the apparatus of this invention.

Glow curve 92 inclucles a glow peak 93 which is clearly defined in comparison to the glow curve 91.

One of the advantages of the intensified glow peak 93 is that the signal to noise ratio is increased substantially.

This is particularly 2 5 important when the amGunts of thermoluminescent phosphor materials are small as indicated for the preferred thin film and discrete dot dosimeter configurations.

The thermoluminescent phosphor films used in this invention are preferably very thin having approximately less than 10 13 5A~578 1;~3~9;29 milligrams of phosphor per square centimeter of film.

The discrete dots preferably use less than 1 milligram of thermolumirlescent material.

It is also possible to heat local;~ed areas of thermoluminescent phosphor layers.

A large number of different types of thermoluminescent phosphors known 5 in the art can be used with this invention.

Examples of acceptable types of thermoluminescent phosphors include calcium fluoride doped with manganese, lithium fluoride doped with titanium and magnesium, calcium sulfate doped with thulium ~ and others known in the art and hereafter developed .

It is desirable that the thermoluminescent phosphors used in this invention be supplied in a form which does not interposition a substrate m&terial between the equalized laser beam 36 and the thermoluminescent phosphor being heated.

Elimination of the interpositioned substrate allows for increased heating rates of the thermoluminescent material without 15 slowing the heating process and without the troublesome incandescent emissions which can occur when substrate materials are heated very rapidly .

Luminescent phosphor sample 40 is preferably held in position for beaming equalized laser beam 36 thereon using a phosphor holding or 20 positioning means (not shown).

The phosphor holding or positioning means can be of any type suitable surface or bracket serving to hold the specific dosimeter configuration or other phosphor sample 40 in position to receive equalized beam 36.

It i.s well known that thermoluminescent materials heated to 25 thermoluminescent threshold temperatures will produce luminescent emissions which are usually in the visible light range with the specific wavelength(s) oE light produced being dependent upon the particular phosphor chosen.

Thermoluminescent threshold temperatures usually range 14 5A8578 ~3~929 between 100-5û0C depending upon the particular phosphor.

Heating of the phosphor sample 40 by e~ualized beam 36 causes such a luminescent emission to occur.

The luminescent emission can be measured by a thermoluminescent emission measuring means such as photodetector 45.

5 The thermoluminescent emission measuring means is preferably an amplifying device such as a photomult;plier tube well known in the art.

Such amplifying photomultiplier tubes require a high voltage power supply 48.

Other alternative means for measuring the intensity of emission from luminescent phosphor 40 may be possible either with current or future 10 technology.

Photodetector 45 can receive the luminescent ernission directly or using a light guide 47 which is helpful in gathering and transmitting the thermoluminescent emission from phosphor 40 to the thermoluminescent emission measuring means 45.

An infrared filter means 46 is preferably 15 included somewhere between phosphor sample 40 and the photodetector 45.

Filter means 46 filters any infrared light caused by any minute incandescence of sample 40 or any scattered infrared light from the laser beam or other sources.

The intensity or other relevant output signal from thermoluminescent 2 0 emission measuring means 45 is sent to a luminescent emission signal processing and memory unit 52.

Appropriate signal processing and memory units are well known in the art and can provide amplification, digitalization, visual display, computer analysis, graphical printouts, and memory storage capability.

It is hîghly desirable that the signal be 2 5 amplified and recorded so that glow curve configurations can be carefully examined to determine the amount of ionizing radiation which struck the thermoluminescent phosphor being read.

It is also possible in signal processing unit 5~ to provide computerized integration or other empirical 5A8578 ~3~9~9 analysis to calculate the amount of ionizing radial:ion to which the thermoluminescent phosphor sample 40 was subjected.

One embodirnent of the invention performs further analysis to compare the amount of ionizing radiatlon to a threshold value ancl provide a simple output in the form of 5 acceptable versus nonacceptab]e.

The apparatus of this invention is capable of readillg thermoluminescent samples using heating times which are greatly reduced as compared to the prior art.

It has been found that heating times in the range of 5 to 500 milliseconds are sufficient to heat and read the 10 thermoluminescent phosphors.

This must be compared with prior art techniques which at best claim reading times down to 500 milliseconds.

This reduction in the amount of time necessary to heat the thermoluminescent phosphors can be translated into greatly reduced times and increased throughput for machinery constructed according to this 15 invention designed for automated processing of dosimeters.

The greatly reduced heating times are made possible in part by equalizing the laser beam intensity profile so that a nearly uniform beam strikes the thermoluminescent material being heated.

This allows the phosphors to be uniformly and rapidly heated at a ma~imurn rate without 20 causing incandescense of the substrate or phosphor due to localized overheating.

Another advantage of the uniform beam profile is that it allows a well defined portion of the thermoluminescent material to be read and read with accuracy without stimulating peripheral portions at reduced power which causes unwanted emissions to be read.

Thus, it becomes 2 5 possible to read a plurality of points on a single very small sample of thermoluminescent foil or other dosimeter configurations.

Reading discrete dots on the same sample is limited only by conductive heating effects which 16 5A8578 1;~349Z9 may cause minute thermolum;nescent emissions to occur about the boundary of the phosphor being heated directly by the equalized laser beam 36.

In addition to beam equalization this invention also allows for much greater power stability in the laser beam used to stimulate phosphor 40.

5 Stable beam power with time is accomplished using an electronic closed loop feedback control. A variety of systems are possible with alterations and alternatives being necessary depending upon -the specific equipment and configuration being used.

In general the laser power control system includes laser power detector 20, control circuitry for taking the power 10 detector output signal and providing a modulated signal for controlling laser power supply 15, and a laser power supply 15 which is capable of varying its power output in response to the modulated control signal.

Laser power detector 20 provides a laser power signal which is sent to a laser power signal enhancer 62.

Fig. 2 shows in greater detail one 15 preferred form of laser power signal enhancer.

The signal from the preferred lead-zirconate-titanate pyroelectric laser power detector 20 produces a current varying signal which is connected to a first amplifier A1 as shown in Fig. 2. A first resistor R1 and first capacitor C1 having approximate values of 100 kilohms and 470 picofarads are connected in 2 0 parallel with amplifier A1.

Values of various electronic components are shown in Table 1 near the end of the Detailed Description.

The output from amplifier A1 is passed through resistor R2 and to the negative input of a second amplifier A2.

The positive inputs of amplifier A1 and A2 are set to zero volts by grounding. A third resistor R3 i5 connected in 25 parallel with amplifier A2.

Amplifier A1 and resistor R1 convert the current signal of detector 20 into a voltage varying equivalent.

The current is converted to a voltage by a conversion factor that is equal to R1.

Amplifier A2 amplifies the output of A1 to provide a signal in the 17 1~34929 5~57~ range of 1-10 volts.

Capacitor C1 lirnits the frequency response to A1 preventing response to high frequency detector signals such as the 100 ~Hz modulation frequency discussed helow or radiated high frequency noise .

The output of amplifier A2 js processed by amplifiers A3, A~, A5, and A6, resistors R4-~8, diode D1 and capacitor C2 to produce an output signal from amplifier A3 which is positive and referenced to zero.

The resulting enhanced laser power signal is subsequently used in the modulation control circuit 70. A peak detection circuit formed by amplifier A6a, diode D2, capacitor C3 and resistor R9 can also advantageously be included to further process the output from laser power detector 20 so that peak values can be held and be more easily identified.

Amplifiers A1-A6a can advantageously be type LF 356, LF353 or LF347 manufactured by National Semiconductor.

The output from amplifier A6a is advantageously connected to a sample and hold circuit which includes an integrated circuit IC1 which preferably is a type I.F 398.

Integrated circuit IC1 is connected in the manner indicated with pin 1 being identified by the dot.

Other integrated circuits are also referenced to pin 1 using the dot.

Output 110 from integrated circuit IC1 is connected to the modulation control circuit 70 shown in greater detail in Fig. 3.

Modulation control circuit 7~ is designed to control the power of laser beam 16 by providing an output or modulation signal which is used to control laser power supply 15.

The modulation control circuit will necessarily be governed in its 2 5 specific design by the type of Iaser power supply used and many s~.lternative modulation circuits are theoretically possible.

With the preferred embodiment radio frequency laser power supply, it is advantageous to modulate the power of laser beam 16 by regulating the 18 5A8578 1~3~929 length of time during which power is supplied to the laser.

This intermittent control of voltage amplitude is preferably done at a high frequency relative to the exposure time of the phosphor samples and any beam interruption means frequency which is used.

Frequencies for ihe modulation of the laser power supply of between 10 kilohertz to 1 megahertz hav~ been found useful when using a 44 megahertz laser power supply. A 100 kilohertz frequcncy is preferred.

The radio frequency power from the radio frequency power supply is accordingly turned off and on at a rate of 100 kilohertz with the length of time during which the power remains on during each cycle being changed to control total laser beam power.

Fig. 3 shows a preferred form of modulation control circuit 70.

Modulation control circuit 70 receives an enhanced laser power signal from the output of signal enhancer 62 via connector 110.

This output signal comes from ICl and is connected to a difference amplifier A8.

Difference amplifier A8 also receives input from a power reference signal generator 63.

The gain of difference amplifier A8 is determined by R10 and R9a.

Power reference signal generator 63 is preferably constructed to provide an adjustable 0-5 volt output voltage range.

Diodes D5-D8 and IC4 2 0 provide a stable power supply in that voltage range O Integrated circuit IC4 is preferably a type LM 336-5 by National Semiconductor. A variable potentiometer 89 serves as an adjustable operator power level control 8 (Fig. 1).

The output of amplifier A8 is connected through resistors R45 and R44 to a positive current source 83 and a negative current source 80, respectively.

Current source 83 includes two resistors Rll and Rt2 connected to a positive 15 volt supply.

Transistors Ql and Q2 are connected to resistors Rll and R12 as indicated in Fig. 3.

Current from 1~ 5A8578 929 positive currellt supply 83 is switched by transistor 1~3 which is controlled by a timing signal TS-2, so that power adjustment occurs during timing period T2, immedialely after a laser power measurement has been made (see ~'ig. ~).

Negative current source 80 is similarly controlled by a 5 parallel t;ming signal TS-1.

Timing signals TS-1 and TS-2 originate in the central control 75.

Current source 80 includes resistor R13 and a variable resistor R14 connected to a -15 volt supply.

Transistors Q4 and ~5 control current supply.

Timing signal TS-1 from central control 75 permits current to 10 flow only during timing pulse T2.

The collectors of transistors Q2 and Q4 are the outputs of current sources 83 and 80, respectively.

Both outputs are connected to capacitor C5 which is also connected to the positive (+) input of amplifier A9.

The output of amplifier A9 is fed back to the negative ( - ) input thereof, so 15 that the amplifier gain is equal to 1.

Current source 80 discharges capacitor C5 decreasing the voltage on capacitor C5 when the measured power represented by enhanced laser detector signal 110 is higher than the desired power level determined by the power reference signal from power reference generator 63.

Current 20 source 83 charges capacitor C5~ increasing the vs~ltage on capacitor C5 when the measured power is lower than the power reference signal.

The voltage applied to capacitor C5 is buffered through amplifier A9 to provide a control level or control voltage.

The control voltage from amplifier A9 is connected to the positive 25 input of a comparator CP1.

The negative input of comparator CPl is connected to a triangle or other periodically increasing and decreasing wave generator having an output which is less than +15 volts and operated 1~492~ ~A8578 at A frequency which determines the modulation frequency, prefera~ly at 100 kilohert~.

Comparator CP1 provides an output which is a modulation signal used to modulate the radio rrequency laser power supply 15.

Fig. 6A shows a 5 line 120 which represents the output voltage of triangle wave generator 85.

Comparator CPl compares the output voltage of generator g5 to the power control voltage from amplifier ~9.

Fig. 6B represents the output of comparator CP1 when the control voltage is at voltage level 122.

The modulation signal has an on period P122.

If this amount of laser power is 10 insufficient as determined by laser power reference signal generator 63, then difference amplifier A8 causes current source 83 to increase the control voltage supplied to comparator CP1.

An increase in control voltage is represented by line 121 in Fig. 6A.

At control voltage level 121 there is an associaced mdulation signal having an on period P121 which is longer 15 than period P122.

Such increased period increases the amount of time laser power supply 15 is on thus increasing the power in laser beam 16 and adjusting the power of laser beam 15 until the power is equal to the predetermined set point established by power signal reference generator 63 .

Downward adj ustment of beam 16 power is accomplished in similar but 20 opposite manner from that increase just described.

The thermoluminescent phosphor reading apparatus of this invention also includes a central control 75.

Central control 75 can be any one of mflny different control circuits which perform the necessary and any optional functions desired. A preferred circuit for central control 75 is 2 5 shown in Fig. 4 .

The central control circuit of Fig. 4 includes a comparator CP2 which is provided with an adjustable reference voltage and capacitance at the negative input.

The enhanced laser power detector signal is connected to the positive input terminal of comparator CP2.

The 21 g29 5 A 85 7 8 output of comparator CP2 is inputted into a first integrated timing circuit IC2 which is ~dvantageously a National ~emiconductor type LM556 dual timing unit.

Integrated timing circuit IC2 creates timing signals T1 and T2. A number of resistors and capacitors are connected to IC2 to provide 5 the desired timing periods.

Additional capacitance is provided to the circuit by capacitors C12-C15.

The value of preferred components are given in TABLE 1.

Timing signal T1 is initiated by the onset of the rise in the laser power detector signal and its effect on comparator CP2.

This is illustrated 10 in Fig. 7.

Timing signal T1 is sustained until the laser power detector signRl decreases.

Timing signal T2 is initiated upon termination of timing signal Tl.

Timing signals TS-1 and TS-2 are generated from and based upon timing signal T2 using comparators CP3 and CP4.

The differences in signals T2, TS-1 and TS-2 being the voltage thereof.

The central control also includes a second timing integrated circuit IC3 which also is a dual timer type LM 556.

Integrated timing circuit IC3 is used to time the startup, sequence and the period of exposure of phosphor sample 40.

The read or exposure cycle is initiated by closing start switch 130 20 which sets latch Ll and starts second integrated timing circuit IC3 through a startup procedure which turns on laser lD and adjusts the laser power to the desired level.

After this startup is completed then a second cycle is started which determines the period of exposure of phosphor 40 to the equalized laser beam.

The period is adjustable using an exposure time 25 control, which is advantageously variable resistor 131.

The second cycle also opens shutter means 26 using the output from transistor Q15.

AND gate 109 generates a laser on signal which acts through comparator CP5 so that laser modulation signal from modulation control 22 1~4929 5A8578 circuit 70 is grounded out unless a read cycle has been started.

Indicator iights LRD 1, ~ED 2, and LED 3 provide indication of power on, read cycle activated, and laser on, respectively.

Latch L2 is used to prevent the shutter from operating during the timing signal T2 so that spurious electromagnetic noise does not affect the laser power detector signal.

It will be apparent to a person of ordinary skill in the art that other alternative central control circuits 75 can be used to operate the apparatus of this invention.

Apparatuses according to this invention are operated by first supplying electrical power to the system as a whole or the various components if separate power supplies are used. A previously exposed thermoluminescent phosphor is positioned in a phosphor positioning means (not shown) adjacent the optical equalizer means 31 for exposure to the equalized laser beam 36.

The operator closes the start switch 130 and the central control 75, modulation control 70 and remaining circuitry is initiated and the power of laser beam 16 is adjusted automatically at a set point adjustable by power level control 89. ~eading of the phosphor then automatically occurs, controlled by the control circuitry.

The equalized laser beam strikes the phDsphor sample 40 and heats it to the threshold temperature in the range of 100-500C.

The phosphor then produces a thermoluminescent emission which is advantageously collected by light guide 47 and converted by photodetector 45 into an electrical signal measuring intensity.

The resulting intensity versus time information is advantageously received, recorded, printed and analyzed by a suitable luminescent emission signal processing and memory unit 52 well known in the art of scientific data analysis.

The method of this invention comprises a new method for rapidly reading thermoluminescent phosphors to accurately determine the amount of 23 1;~39L~29 5A~578 ionizing radiation to which the phosphors have been exposed.

This method first involves emitting a laser beam from a source of appropriate laser light.

The laser beam is preferably all infrared beam emitting from a carbon dioxide laser such as describecl above as laser beam source means 5 lO.

The method also involYes measuring the power contained in the emitted laser beam and controlling the power level of the laser beam to provide a very nearly constant laser beam power level with time.

It is preferable to control the laser beam power within a variance range equal to approximately 1% or less of the total power contained in the laser beam.

The method of this invention also includes equalizing the power profile of the laser beam with an optical equalizer such as 31 to produce a nearly uniform power density across the full cross section of the laser beam used to stimulate the thermoluminescent phosphor sample being read.

The method of this invention further involves controlling the amount 15 of time the thermoluminescent phosphor sample is exposed to the equalized laser beam and the power of the beam so that rapid uniform heating to approximately 100-500C is obtained.

This is necessary in order to prevent overheating of the thermoluminescent phosphors so that erroneous readings and damage do not occur.

Control of exposure time and power of 2 0 the thermoluminescent phosphors is also advantageous in that it allows different phosphor samples or different areas of phosphors to be exposed for reading at different times so that discrete portions or sarnples of the thermoluminescent phosphors can be read independently. ~ontrol of exposure time can be accomplished using shutter means 26 described 2 5 above .

The method of this invention also advantageously includes the step of measuring the luminescent emission occurring as a result of exposure of the thermoluminescent phosphor to the equalized laser beam.

This is 24 49Z9 5A8578 accomplished using the thermolumineseent emission measuring means.

The resulting measurements of thermoluminescent emission intensity, time interval and peak height can be theoretically analyzed and checked by calibratecl specimens lo provide st~ndard values or measurements which are 5 accurate as a measure of total radiation exposure.

The improvecl methods according to this invention provide increased speed and accuracy in heating and reading thermolumin~scent phosphors.

TABLE 1 Rl~SISTORS R1 100 kilohms R2 1 kilohm R3 2Qû kilohms R4 1 kilohm R5 1 kilohm R6 10 kilohms R7 100 kilohms 1 5 R8 100 kilohms R9 1 megohm R9a 6.8 kilohms R10 680 kilohms R11 510 ohms R12 510 ohms R13a 470 kilohms R13 510 ohms R14 0-1 kilohm R18 30 kilohms R19 0-10 kilohms R21 200 kilohms R22 300 kilohms R23 6.8 kilohms R24 30 kilohms R25 6.8 kilohms R26 20 kilohms R27 30 kilohms R30 100 ohms R31 270 ohms R32 200 kilohms R33 4.7 megaohms R34 30 kilohms R35 30 kilohms R36 100 kilohms R37 6.8 kilohms R38 20 kilohms ~5 5A8578 49Z~ R3 9 3 0 kilohm R40 510 ohms R41 270 ohms R42 270 ohms R43 3 kilohms R44 200 kilohms p,45 200 kilohms CAPACITORS Cl 470 picofarads C2 1 microfarad C3 0.1 microfarad C4 6800 picofarads C5 0.1 microfarad C6 10 microfarads C7 0.1 microfarad C8 0 . 01 microfarad C9 0~ 01 microfarad C10 0 . 01 microfarad C11 0 . 01 microfarad C12 10 microfarads C13 0.1 microfarad C14 10 microfarads C15 0.1 microfarad C16 0 . 001 microfarad C17 18 microfarads C18 0 . 01 microfarad C 19 0 . 01 microfarad C20 0 . 01 microfarad C21 0 . 001 microfarad C22 0 . 001 microfarad C23 0.001 microfarad C24 10 microfarads 26