Nova Patents
ATE511661T1

Rfid application test systems and methods

Abstract

Systems and methods provide location determination for the application of radio frequency identification (RFID) devices (e.g., performance evaluation of one or more RFID devices for various locations on an object to be associated with an RFID device). For example, in accordance with an embodiment of the present invention, an RFID test device includes a housing, an RFID device coupled to the housing, and a near field coupler contained at least partially within the housing and configured to communicate in a near field region with the RFID device.

Term

Term ended

Projected expiry passed 10 March 2026, 0.5 years ago.

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10 members in 6 offices

This recordMember, by publication datePriority claim

Priority claims3

Priority claims
DocumentOfficeKindDate
66141205United States of AmericaP
37045906United States of AmericaA
2006009005United States of AmericaW

Members10

Family members, oldest first
DocumentOfficeKind
US2006202705A1United States of AmericaA1
WO2006099356A1World Intellectual Property Organization (WIPO)A1
EP1861727A1European Patent Office (EPO)A1
CN101142491AChinaA
US7477152B2United States of AmericaB2
EP1861727B1European Patent Office (EPO)B1
AT511661TAustriaT
ATE511661T1This recordAustriaT1
CN101142491BChinaB
ES2367318T3SpainT3