ATE445176T1
Spin-on-glass anti-reflective coatings for photolithography
Abstract
Anti-reflective coating materials for deep ultraviolet photolithography include one or more organic dyes incorporated into spin-on-glass materials. Suitable dyes are strongly absorbing over wavelength ranges around wavelengths such as 248 nm and 193 nm that may be used in photolithography. A method of making dyed spin-on-glass materials includes combining one or more organic dyes with alkoxysilane reactants during synthesis of the spin-on-glass materials.
Term
Term ended
Projected expiry passed 8 June 2020, 6.3 years ago.
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86 members in 11 offices
Priority claims3
| Document | Office | Kind | Date |
|---|---|---|---|
| 33024899 | United States of America | A | |
| 49116600 | United States of America | A | |
| 0015772 | United States of America | W |
Members86
| Document | Office | Kind | |
|---|---|---|---|
| CA2374944A1 | Canada | A1 | |
| WO0077575A1 | World Intellectual Property Organization (WIPO) | A1 | |
| AU5600200A | Australia | A | |
| US6268457B1 | United States of America | B1 | |
| EP1190277A1 | European Patent Office (EPO) | A1 | |
| US6365765B1 | United States of America | B1 | |
| US2002055000A1 | United States of America | A1 | |
| KR20020036956A | Republic of Korea | A | |
| US2002095018A1 | United States of America | A1 | |
| US2002128388A1 | United States of America | A1 | |
| US6506497B1 | United States of America | B1 | |
| JP2003502449A | Japan | A | |
| WO03044078A1 | World Intellectual Property Organization (WIPO) | A1 | |
| WO03044079A1 | World Intellectual Property Organization (WIPO) | A1 | |
| WO03044600A1 | World Intellectual Property Organization (WIPO) | A1 | |
| AU2002227106A1 | Australia | A1 | |
| AU2002336709A1 | Australia | A1 | |
| AU2002359387A1 | Australia | A1 | |
| US2003120018A1 | United States of America | A1 | |
| TW200302259A | Taiwan Province of China | A | |
| TW200306342A | Taiwan Province of China | A | |
| WO03044078A9 | World Intellectual Property Organization (WIPO) | A9 | |
| TW570964B | Taiwan Province of China | B | |
| WO2004044025A2 | World Intellectual Property Organization (WIPO) | A2 | |
| AU2003295517A1 | Australia | A1 | |
| AU2003295517A8 | Australia | A8 | |
| WO2004044025A3 | World Intellectual Property Organization (WIPO) | A3 | |
| KR20040066124A | Republic of Korea | A | |
| KR20040075866A | Republic of Korea | A | |
| WO2004044025A8 | World Intellectual Property Organization (WIPO) | A8 | |
| EP1472574A1 | European Patent Office (EPO) | A1 | |
| EP1478682A1 | European Patent Office (EPO) | A1 | |
| EP1478683A1 | European Patent Office (EPO) | A1 | |
| US6824879B2 | United States of America | B2 | |
| TW200426199A | Taiwan Province of China | A | |
| US2005058929A1 | United States of America | A1 | |
| CN1606713A | China | A | |
| JP2005509913A | Japan | A | |
| JP2005509914A | Japan | A | |
| JP2005512309A | Japan | A | |
| WO2005037907A1 | World Intellectual Property Organization (WIPO) | A1 | |
| KR20050042068A | Republic of Korea | A | |
| KR20050042069A | Republic of Korea | A | |
| CN1615332A | China | A | |
| CN1615333A | China | A | |
| KR20050044501A | Republic of Korea | A | |
| EP1472574A4 | European Patent Office (EPO) | A4 | |
| EP1478682A4 | European Patent Office (EPO) | A4 | |
| EP1478683A4 | European Patent Office (EPO) | A4 | |
| TW200526750A | Taiwan Province of China | A | |
| US6956097B2 | United States of America | B2 | |
| US2005245717A1 | United States of America | A1 | |
| US6969753B2 | United States of America | B2 | |
| US7012125B2 | United States of America | B2 | |
| KR20060097744A | Republic of Korea | A | |
| KR20060131735A | Republic of Korea | A | |
| US2007022909A1 | United States of America | A1 | |
| KR100705849B1 | Republic of Korea | B1 | |
| JP2007510761A | Japan | A | |
| KR100804873B1 | Republic of Korea | B1 | |
| TW200833799A | Taiwan Province of China | A | |
| TWI304833B | Taiwan Province of China | B | |
| TWI308585B | Taiwan Province of China | B | |
| KR100897575B1 | Republic of Korea | B1 | |
| EP1190277B1 | European Patent Office (EPO) | B1 | |
| AT445176T | Austria | T | |
| ATE445176T1This record | Austria | T1 | |
| DE60043105D1 | Germany | D1 | |
| JP2009282524A | Japan | A | |
| JP4381143B2 | Japan | B2 | |
| US7678462B2 | United States of America | B2 | |
| TWI324626B | Taiwan Province of China | B | |
| JP4703745B2 | Japan | B2 | |
| CN1606713B | China | B | |
| US8101015B2 | United States of America | B2 | |
| JP2012049548A | Japan | A | |
| US2012070689A1 | United States of America | A1 | |
| US8344088B2 | United States of America | B2 | |
| US2013164677A1 | United States of America | A1 | |
| JP5348843B2 | Japan | B2 | |
| TWI429721B | Taiwan Province of China | B | |
| US2014227538A1 | United States of America | A1 | |
| US8889334B2 | United States of America | B2 | |
| JP2015029110A | Japan | A | |
| JP5674614B2 | Japan | B2 | |
| US9069133B2 | United States of America | B2 |
Numbers
- Application
- 941275
Titles2
- English
- SPIN-ON-GLASS SEMICONDUCTORS WITH ANTI-REFLECTION COATINGS FOR PHOTOLITHOGRAPHY
- German
- SPIN-ON-GLASS ANTIREFLEKTIONSBESCHICHTUNGEN AUFWEISENDER HALBLEITER FÜR PHOTOLITHOGRAPHIE
Classification
- CPC, 12
- G03F7/091
- C03C17/008
- C03C17/30
- C08K5/0008
- C09D183/04
- C09D183/06
- C09D183/08
- Y10T428/31663
- H10P76/2043
- G03F7/094
- G03F1/46
- G03F7/031
- IPC, 8
- C03C17 00
- C03C17 30
- C08K5 00
- C09D183 04
- C09D183 06
- C09D183 08
- G03F7 09
- H01L21 027