Circuit for focused ion beam sensor
Abstract
A circuit is enabled to capacitively drive a memory cell (erasing, programming, and reading) via a capacitance. The capacitance is additionally present and isolates the antenna from the driver circuit of the memory cell. Charge accumulates on the antenna in the case of a FIB attack. The capacitance prevents the charge from flowing away, so that the voltage thus generated acts on the memory cell, which thus experiences a corresponding alteration of its charge state, which is detected. The capacitance can be implemented and realized in any conventional manner, such as any arbitrary capacitor structure of the circuit.
Term
Term ended
Projected expiry passed 15 February 2022, 4.6 years ago.
- Priority
- Filed
- Published
- Projected expiry
- Today
14 members in 8 offices
Priority claims1
| Document | Office | Kind | Date |
|---|---|---|---|
| 10111027 | Germany | A |
Members14
| Document | Office | Kind | |
|---|---|---|---|
| DE10111027C1 | Germany | C1 | |
| WO02071485A2 | World Intellectual Property Organization (WIPO) | A2 | |
| TW552506B | Taiwan Province of China | B | |
| WO02071485A3 | World Intellectual Property Organization (WIPO) | A3 | |
| EP1368834A2 | European Patent Office (EPO) | A2 | |
| US2004051054A1 | United States of America | A1 | |
| JP2004527034A | Japan | A | |
| CN1528019A | China | A | |
| US6964378B2 | United States of America | B2 | |
| JP3853737B2 | Japan | B2 | |
| EP1368834B1 | European Patent Office (EPO) | B1 | |
| AT417360T | Austria | T | |
| ATE417360T1This record | Austria | T1 | |
| DE50213099D1 | Germany | D1 |
1 legal event, as the office reported them to INPADOC
Events
| Event | Code | |
|---|---|---|
| Ceased due to non-payment of the annual feeCeasedREN | REN |
Numbers
- Application
- 2714017
Titles2
- German
- SCHALTUNG FÜR FOCUSED ION BEAM-SENSOR
- English
- CIRCUIT FOR FOCUSED ION BEAM SENSOR
Classification
- CPC, 1
- G11C16/22
- IPC, 3
- G06K19 073
- G06K19 07
- G11C16 22