Semiconductor structure implementing sacrificial material and methods for making and implementing the same
Abstract
Methods of fabricating semiconductor structures on a substrate, where the substrate has transistors formed thereon, are provided. One method includes forming interconnect metallization structures in a plurality of levels. The forming of the interconnect metallization structures includes depositing a sacrificial layer and performing a process to etch trenches, vias, and stubs into the sacrificial layer. The method further includes filling and planarizing the trenches, vias, and stubs that were etched and then etching away the sacrificial layer throughout the plurality of levels of the interconnect metallization structures. The etching leaving a voided interconnect metallization structure that is structurally supported by stubs that are non-electrically functional.
Term
Term ended
Projected expiry passed 26 March 2022, 4.5 years ago.
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- Filed
- Published
- Projected expiry
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26 members in 10 offices
Priority claims1
| Document | Office | Kind | Date |
|---|---|---|---|
| 82141501 | United States of America | A |
Members26
| Document | Office | Kind | |
|---|---|---|---|
| WO02103791A2 | World Intellectual Property Organization (WIPO) | A2 | |
| TW533574B | Taiwan Province of China | B | |
| KR20030086613A | Republic of Korea | A | |
| WO02103791A3 | World Intellectual Property Organization (WIPO) | A3 | |
| IL157828D0 | Israel | D0 | |
| EP1415344A2 | European Patent Office (EPO) | A2 | |
| CN1531755A | China | A | |
| JP2005519454A | Japan | A | |
| US2005194688A1 | United States of America | A1 | |
| US6984892B2 | United States of America | B2 | |
| US2006043596A1 | United States of America | A1 | |
| EP1415344B1 | European Patent Office (EPO) | B1 | |
| AT328366T | Austria | T | |
| ATE328366T1This record | Austria | T1 | |
| DE60211915D1 | Germany | D1 | |
| DE60211915T2 | Germany | T2 | |
| US7425501B2 | United States of America | B2 | |
| KR100874521B1 | Republic of Korea | B1 | |
| US2009004845A1 | United States of America | A1 | |
| CN100481437C | China | C | |
| JP4283106B2 | Japan | B2 | |
| CN101488473A | China | A | |
| IL157828A | Israel | A | |
| IL201926D0 | Israel | D0 | |
| US7875548B2 | United States of America | B2 | |
| CN101488473B | China | B |
Numbers
- Application
- 2760997
Titles2
- English
- SEMICONDUCTOR STRUCTURE USING SACRIFICIAL MATERIAL AND RELATED MANUFACTURING METHODS
- German
- HALBLEITERSTRUKTUR UNTER VERWENDUNG VON OPFERMATERIAL UND ZUGEÖRIGE HERSTELLUNGSVERFAHREN
Classification
- CPC, 6
- H10W20/495
- H10W20/01
- H10W20/072
- H10W20/46
- H10W20/4421
- H10W20/48
- IPC, 4
- H01L23 522
- H01L23 532
- H10P14 40
- H10P14 60