ATE328366T1

Semiconductor structure implementing sacrificial material and methods for making and implementing the same

Abstract

Methods of fabricating semiconductor structures on a substrate, where the substrate has transistors formed thereon, are provided. One method includes forming interconnect metallization structures in a plurality of levels. The forming of the interconnect metallization structures includes depositing a sacrificial layer and performing a process to etch trenches, vias, and stubs into the sacrificial layer. The method further includes filling and planarizing the trenches, vias, and stubs that were etched and then etching away the sacrificial layer throughout the plurality of levels of the interconnect metallization structures. The etching leaving a voided interconnect metallization structure that is structurally supported by stubs that are non-electrically functional.

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Projected expiry passed 26 March 2022, 4.5 years ago.

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82141501United States of AmericaA

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WO02103791A2World Intellectual Property Organization (WIPO)A2
TW533574BTaiwan Province of ChinaB
KR20030086613ARepublic of KoreaA
WO02103791A3World Intellectual Property Organization (WIPO)A3
IL157828D0IsraelD0
EP1415344A2European Patent Office (EPO)A2
CN1531755AChinaA
JP2005519454AJapanA
US2005194688A1United States of AmericaA1
US6984892B2United States of AmericaB2
US2006043596A1United States of AmericaA1
EP1415344B1European Patent Office (EPO)B1
AT328366TAustriaT
ATE328366T1This recordAustriaT1
DE60211915D1GermanyD1
DE60211915T2GermanyT2
US7425501B2United States of AmericaB2
KR100874521B1Republic of KoreaB1
US2009004845A1United States of AmericaA1
CN100481437CChinaC
JP4283106B2JapanB2
CN101488473AChinaA
IL157828AIsraelA
IL201926D0IsraelD0
US7875548B2United States of AmericaB2
CN101488473BChinaB