Nova Patents
ATE201265T1

Optical test system including interferometer with micromirror

Abstract

This record has no abstract on file.

Term

Term ended

Projected expiry passed 19 March 2016, 10.5 years ago.

  1. Priority
  2. Filed
  3. Published
  4. Projected expiry
  5. Today

45 members in 16 offices

This recordMember, by publication datePriority claim6 more offices are in the list below

Priority claims1

Priority claims
DocumentOfficeKindDate
41832895United States of AmericaA

Members45

Family members, oldest first
DocumentOfficeKind
NO960583D0NorwayD0
TW285713BTaiwan Province of ChinaB
CA2169141A1CanadaA1
NO960583LNorwayL
EP0736759A2European Patent Office (EPO)A2
AU4578896AAustraliaA
JPH08297009AJapanA
KR960038363ARepublic of KoreaA
CN1153297AChinaA
US5675413AUnited States of AmericaA
SG43240A1SingaporeA1
EP0814331A2European Patent Office (EPO)A2
EP0736759A3European Patent Office (EPO)A3
EP0814331A3European Patent Office (EPO)A3
US5771095AUnited States of AmericaA
CN1210975AChinaA
HK1012704A1Hong Kong, ChinaA1
EP0736759B1European Patent Office (EPO)B1
AT189520TAustriaT
ATE189520T1AustriaT1
US6025912AUnited States of AmericaA
DE69606450D1GermanyD1
ES2142023T3SpainT3
PT736759EPortugalE
DK0736759T3DenmarkT3
SG73523A1SingaporeA1
SG73524A1SingaporeA1
DE69606450T2GermanyT2
AU721210B2AustraliaB2
KR100262683B1Republic of KoreaB1
US6204925B1United States of AmericaB1
EP0814331B1European Patent Office (EPO)B1
DK0814331T3DenmarkT3
AT201265TAustriaT
ATE201265T1This recordAustriaT1
ES2156326T3SpainT3
DE69612844D1GermanyD1
US2001019415A1United States of AmericaA1
DE69612844T2GermanyT2
PT814331EPortugalE
KR100297262B1Republic of KoreaB1
CN1075630CChinaC
US6493094B2United States of AmericaB2
JP2003177006AJapanA
JP2003185503AJapanA