Fired cartridge examination method and imaging apparatus

The apparatus has a fired cartridge mounting device for holding the cartridge substantially aligned with a longitudinal axis with a primer surface of the cartridge substantially perpendicular to the axis, a cartridge microscope mounted with its optical axis substantially parallel to the longitudinal axis, a focusing mechanism for focusing the microscope to image a breech face impression on the primer surface and a firing pin impression surface in the primer surface, and an axisymmetric light source mounted to project axially symmetric light onto the breech face impression and the firing pin impression surface about the longitudinal axis. Images of the breech face and the firing pin impressions can be used for comparative analysis independently of an angular orientation of the cartridge held by the mounting device. During this analysis, a first image from a test cartridge and a second image from a computer data bank are rotated relative to one another, and a maximum correlation value for the rotated first and second images is obtained.