AT66071T

Method and apparatus for examining a workpiece

Abstract

This record has no abstract on file.

Term

No projected expiry on record.

  1. Priority
  2. Filed
  3. Granted
  4. Today

9 members in 6 offices

This recordMember, by publication datePriority claim

Priority claims1

Priority claims
DocumentOfficeKindDate
70514985United States of AmericaA

Members9

Family members, oldest first
DocumentOfficeKind
JPS61195352AJapanA
EP0193315A2European Patent Office (EPO)A2
US4644271AUnited States of AmericaA
EP0193315A3European Patent Office (EPO)A3
CA1238685ACanadaA
EP0193315B1European Patent Office (EPO)B1
AT66071TThis recordAustriaT
DE3680687D1GermanyD1
JPH087191B2JapanB2