Zone boundary adjustment for defects in non-volatile memories

Distributed a non-volatile storage of the card controller multiple logical area, and movable of a reducing structure of data the size is an mapping. The adjusting a periphery; comprises a defect of memory testing permits, so improving the card rate of finished product and adjusting to the periphery area to lengthen with the card service life. The scanning component in said card for with a defect block. An knew of the opposite positions, wherein the frame is made of block are uniformly distributed a groove on the area to of the flat boundary. Each memory testing criteria a measuring block is structured the test card criteria, therefore the defect to reduce the card rate of finished product of drop. The controller is can implement dynamic boundary adjusting. Is a defect, wherein the controller is can implement the analysis which multiple, comprising a flexible, arranged with a periphery; thus with the user data.