AT545910T

Improving reliability, availability, and serviceability in a memory device

Abstract

The name of the invention is improvement of memory device reliability usability and maintainability. The embodiment of this invention relates generally to improve memory device and the reliability usability and maintainability. The first embodiment in memory device comprises data storing position of the first part and storing data corresponding to the position of the error correcting code ecc the position of the second part of the memory core. Memory device can also in the memory core on the same chip comprises an error correction logic part. In some embodiments in error correction logic part makes the storage device can be calculated and the ecc position of the stored ecc position and the calculated position of the ecc comparing.

Term

0.8 yearsleft in the term

Expires 27 June 2027.

  1. Priority
  2. Filed
  3. Granted
  4. Today
  5. Expires

2 priority claims, no other members on record

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Priority claims2

Priority claims
DocumentOfficeKindDate
47906706United States of AmericaA
2007072295United States of AmericaW