AT504065T

Reducing read disturb for non-volatile storage

Abstract

The present invention relates to a system for reducing or eliminating failure in the form of reading (read disturb) of the non-volatile storage. In one embodiment it is an object is to prevent reading failure to prevent or minimize the boosted channel of the memory device. For example, it can be implemented to control the boosting of the source side of the NAND string channel during a read process, or so as to decrease. The source side of the NAND string channel is not boosted, at least one read fault types is minimized or not generated.

Term

Projected expiry 30 November 2026.

  1. Priority
  2. Filed
  3. Granted
  4. Today
  5. Projected expiry

27 members in 9 offices

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Priority claims
DocumentOfficeKindDate
29577605United States of AmericaA
29608705United States of AmericaA
2006046126United States of AmericaW

Members27

Family members, oldest first
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US2007127291A1United States of AmericaA1
US2007133295A1United States of AmericaA1
WO2007067447A1World Intellectual Property Organization (WIPO)A1
US2007153573A1United States of AmericaA1
US7262994B2United States of AmericaB2
TW200741719ATaiwan Province of ChinaA
US7295473B2United States of AmericaB2
US7349258B2United States of AmericaB2
US2008137411A1United States of AmericaA1
US2008137423A1United States of AmericaA1
US2008137424A1United States of AmericaA1
EP1958206A1European Patent Office (EPO)A1
KR20080080621ARepublic of KoreaA
US7440318B2United States of AmericaB2
US7447065B2United States of AmericaB2
CN101371314AChinaA
US7495956B2United States of AmericaB2
JP2009518774AJapanA
TWI315524BTaiwan Province of ChinaB
KR100948200B1Republic of KoreaB1
EP2256748A1European Patent Office (EPO)A1
EP1958206B1European Patent Office (EPO)B1
AT504065TThis recordAustriaT
DE602006021058D1GermanyD1
CN101371314BChinaB
JP4960378B2JapanB2
EP2256748B1European Patent Office (EPO)B1