AT475186T

Reading of a nonvolatile memory cell by taking account of the stored state of a neighboring memory cell

Abstract

The apparent charge stored on a floating gate of the nonvolatile memory cell (or other charge storing element), can be changed due to the coupling of the electric field based on the charge stored in adjacent floating gates (or other charge storage device). In order to solve this coupling problem, invar the read process for a targeted memory cell will provide compensation to an adjacent memory cell (or other memory cell), which reduce the coupling effect of the adjacent memory cell is in the target memory cell, intended to. It is that compensation is based on the state of an adjacent memory cell. In order to apply the correct compensation, the read process is at least partially alternating the reading operation for the target memory cell in the read operation for the adjacent memory cells.Coupling effect, the target memory cell, the adjacent memory cells, the flash memory

Term

No projected expiry on record.

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18 members in 9 offices

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Priority claims
DocumentOfficeKindDate
61856906United States of AmericaA
61857806United States of AmericaA
2007088787United States of AmericaW

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DocumentOfficeKind
US2008158946A1United States of AmericaA1
US2008158974A1United States of AmericaA1
WO2008083137A1World Intellectual Property Organization (WIPO)A1
US7440324B2United States of AmericaB2
TW200849263ATaiwan Province of ChinaA
US7495962B2United States of AmericaB2
EP2078303A1European Patent Office (EPO)A1
KR20090117709ARepublic of KoreaA
CN101627443AChinaA
JP2010515202AJapanA
EP2078303B1European Patent Office (EPO)B1
AT475186TThis recordAustriaT
ATE475186T1AustriaT1
DE602007007974D1GermanyD1
KR101100359B1Republic of KoreaB1
CN101627443BChinaB
JP5174829B2JapanB2
TWI397075BTaiwan Province of ChinaB