Nova Patents
AT470577T

Method for creating a test pattern in a 3D printer, and test pattern

Abstract

This record has no abstract on file.

Term

Term ended

Expired 15 September 2025, 1 year ago.

  1. Priority
  2. Filed
  3. Granted
  4. Expired
  5. Today

37 members in 10 offices

This recordMember, by publication datePriority claim

Priority claims12

Priority claims
DocumentOfficeKindDate
61206804United States of AmericaP
61206804United States of AmericaP
10004United States of AmericaA
10004United States of AmericaA
2005033112United States of AmericaW
2005033112United States of AmericaW
100–––
612068P–––
0533112–––
US20040000100–––
US20040612068P–––
WO2005US33112–––

Members37

Family members, oldest first
DocumentOfficeKind
US2006061613A1United States of AmericaA1
US2006061618A1United States of AmericaA1
WO2006033903A2World Intellectual Property Organization (WIPO)A2
WO2006034012A2World Intellectual Property Organization (WIPO)A2
WO2006034012A3World Intellectual Property Organization (WIPO)A3
WO2006033903A3World Intellectual Property Organization (WIPO)A3
EP1799463A2European Patent Office (EPO)A2
EP1805024A2European Patent Office (EPO)A2
KR20070083737ARepublic of KoreaA
KR20070085273ARepublic of KoreaA
CN101056766AChinaA
CN101060990AChinaA
HK1102573AHong Kong, ChinaA
HK1102573A1Hong Kong, ChinaA1
JP2008513199AJapanA
JP2008513252AJapanA
US7387359B2United States of AmericaB2
US2008252682A1United States of AmericaA1
CN101056766BChinaB
EP1799463B1European Patent Office (EPO)B1
AT470577TThis recordAustriaT
ATE470577T1AustriaT1
DE602005021806D1GermanyD1
EP2226200A1European Patent Office (EPO)A1
ES2346768T3SpainT3
US7824001B2United States of AmericaB2
US2011032301A1United States of AmericaA1
CN101060990BChinaB
US8167395B2United States of AmericaB2
JP5122960B2JapanB2
JP2013047003AJapanA
EP1805024B1European Patent Office (EPO)B1
KR101273794B1Republic of KoreaB1
JP5243030B2JapanB2
KR101342341B1Republic of KoreaB1
EP2226200B1European Patent Office (EPO)B1
JP5678018B2JapanB2