AT460658T - TEST STRIP MEASURING METHOD

27 members in 16 offices

This recordMember, by publication datePriority claim6 more offices are in the list below

Priority claims
Document	Office	Kind	Date
2000024938	Japan	A	2000-02-02
2000024939	Japan	A	2000-02-02
2000160646	Japan	A	2000-05-30
0100606	Japan	W	2001-01-30

Family members, oldest first
Document	Office	Kind
CA2397525A1	Canada	A1	2001-08-09
WO0157502A1	World Intellectual Property Organization (WIPO)	A1	2001-08-09
JP2001215223A	Japan	A	2001-08-10
AU2885601A	Australia	A	2001-08-14
JP2001289846A	Japan	A	2001-10-19
TW496949B	Taiwan Province of China	B	2002-08-01
KR20020086489A	Republic of Korea	A	2002-11-18
EP1259799A1	European Patent Office (EPO)	A1	2002-11-27
MXPA02007463A	Mexico	A	2002-12-13
CN1397013A	China	A	2003-02-12
US2003049849A1	United States of America	A1	2003-03-13
AR027933A1	Argentina	A1	2003-04-16
HK1051895A	Hong Kong, China	A	2003-08-22
AU774242B2	Australia	B2	2004-06-24
BR0107984A	Brazil	A	2004-07-06
CN1164927C	China	C	2004-09-01
US2005191210A1	United States of America	A1	2005-09-01
KR100522341B1	Republic of Korea	B1	2005-10-20
JP4216434B2	Japan	B2	2009-01-28
MY138075A	Malaysia	A	2009-04-30
JP4335414B2	Japan	B2	2009-09-30
EP1259799B1	European Patent Office (EPO)	B1	2010-03-10
AT460658TThis record	Austria	T	2010-03-15
ATE460658T1	Austria	T1	2010-03-15
DE60141507D1	Germany	D1	2010-04-22
US7833792B2	United States of America	B2	2010-11-16
CA2397525C	Canada	C	2012-04-17

1 legal event, as the office reported them to INPADOC

Legal events, newest first
	Event	Code
2010-09-15	Ceased as to paragraph 5 lit. 3 law introducing patent treatiesCeasedRER	RER

Test strip measuring method