AT459964T
Semiconductor memory cell and memory array using a breakdown phenomena in an ultra-thin dielectric
Abstract
This record has no abstract on file.
Term
Term ended
Expired 17 September 2022, 4 years ago.
- Priority
- Filed
- Granted
- Expired
- Today
25 members in 8 offices
Priority claims3
| Document | Office | Kind | Date |
|---|---|---|---|
| 95564101 | United States of America | A | |
| 2432701 | United States of America | A | |
| 0229507 | United States of America | W |
Members25
| Document | Office | Kind | |
|---|---|---|---|
| WO03025944A1 | World Intellectual Property Organization (WIPO) | A1 | |
| US2003063518A1 | United States of America | A1 | |
| US2003198085A1 | United States of America | A1 | |
| US6667902B2 | United States of America | B2 | |
| US6671040B2 | United States of America | B2 | |
| US2004008538A1 | United States of America | A1 | |
| TW577081B | Taiwan Province of China | B | |
| US2004047218A1 | United States of America | A1 | |
| EP1436815A1 | European Patent Office (EPO) | A1 | |
| US6798693B2 | United States of America | B2 | |
| US2004208055A1 | United States of America | A1 | |
| US2004223370A1 | United States of America | A1 | |
| US6822888B2 | United States of America | B2 | |
| JP2005504434A | Japan | A | |
| CN1667753A | China | A | |
| US7031209B2 | United States of America | B2 | |
| US7042772B2 | United States of America | B2 | |
| EP1436815A4 | European Patent Office (EPO) | A4 | |
| CN100585738C | China | C | |
| EP1436815B1 | European Patent Office (EPO) | B1 | |
| AT459964TThis record | Austria | T | |
| ATE459964T1 | Austria | T1 | |
| DE60235562D1 | Germany | D1 | |
| JP2010103563A | Japan | A | |
| JP4599059B2 | Japan | B2 |
1 legal event, as the office reported them to INPADOC
Events
| Event | Code | |
|---|---|---|
| Ceased as to paragraph 5 lit. 3 law introducing patent treatiesCeasedRER | RER |
Numbers
- Application
- 2759714
Titles2
- German
- HALBLEITERSPEICHERZELLE UND SPEICHERARRAY MIT EINEM DURCHBRUCHSPHÄNOMEN IN EINEM ULTRADÜNNEN DIELEKTRIKUM
- English
- SEMICONDUCTOR MEMORY CELL AND STORAGE ARRAY WITH A BREAKTHING PHENOMENON IN AN ULTRADÜNNE DIELEKTRIKUM
Classification
- CPC, 5
- G11C11/5692
- H10B20/367
- G11C17/16
- H01L2924/0002
- H10B20/00
- IPC, 5
- G11C17 16
- G11C11 56
- H01L21 8246
- H01L23 525
- H01L27 112