AT413028T - SIMPLIFIED QUALITY INDICATOR BIT TEST PROCEDURES

26 members in 17 offices

This recordMember, by publication datePriority claim7 more offices are in the list below

Priority claims
Document	Office	Kind	Date
23977500	United States of America	P	2000-10-11
82294701	United States of America	A	2001-03-30

Family members, oldest first
Document	Office	Kind
CA2425436A1	Canada	A1	2002-04-18
WO0231987A2	World Intellectual Property Organization (WIPO)	A2	2002-04-18
AU9670101A	Australia	A	2002-04-22
US2002064133A1	United States of America	A1	2002-05-30
WO0231987A3	World Intellectual Property Organization (WIPO)	A3	2002-06-20
TW520580B	Taiwan Province of China	B	2003-02-11
NO20031641D0	Norway	D0	2003-04-10
KR20030036912A	Republic of Korea	A	2003-05-09
NO20031641L	Norway	L	2003-05-27
EP1325577A2	European Patent Office (EPO)	A2	2003-07-09
MXPA03003205A	Mexico	A	2003-09-10
IL155262A0	Israel	A0	2003-11-23
BR0114557A	Brazil	A	2004-01-20
CN1471767A	China	A	2004-01-28
JP2004511947A	Japan	A	2004-04-15
US6735216B2	United States of America	B2	2004-05-11
RU2260914C2	Russian Federation	C2	2005-09-20
AU2001296701B2	Australia	B2	2006-03-02
UA76122C2	Ukraine	C2	2006-07-17
KR100760436B1	Republic of Korea	B1	2007-09-20
JP4057417B2	Japan	B2	2008-03-05
EP1325577B1	European Patent Office (EPO)	B1	2008-10-29
AT413028TThis record	Austria	T	2008-11-15
ATE413028T1	Austria	T1	2008-11-15
DE60136375D1	Germany	D1	2008-12-11
CN1471767B	China	B	2010-11-24

1 legal event, as the office reported them to INPADOC

Legal events, newest first
	Event	Code
2009-04-15	Ceased as to paragraph 5 lit. 3 law introducing patent treatiesCeasedRER	RER

CPC, 3: H04W52/18
H04W52/26
H04B17/309
Filled: the office’s first classification
IPC, 3: H04B17 00
H04B7 005
H04B7 26

Simplified quality indicator bit test procedures