Analysis of patterns

Method for comparing a first pattern (A) represented by a first ordered set of elements (xi), each having a value with a second pattern (B) represented by a second ordered set of elements (ui), each having one value, comprising iteratively performing the following steps: (i) selecting a plurality of elements of the first ordered set; (Ii) for each selected element of the first ordered set, selecting an element of the second ordered set, such that the selected elements of the second ordered set have, within the second ordered set, a set of relations of mutual positions which is equal to , or it is a transformation, set mates posing together the selected plurality of elements of the first ordered set; (Iii) comparing the value of each of the selected elements of the first ordered set the value of the selected element at a corresponding position of the second ordered set, in accordance with criteria coincidence default to decide whether the selected plurality of elements first ordered set matches or not with the selected plurality of elements of the second array; (Iv) if a match, updating at least one similarity score (SAB) occurs; wherein the step of selecting the elements of the second ordered set comprises selecting a value for at least one parameter (R, beta and alpha) that characterizes a transformation by reflection, rotation or scaling and selecting elements which present a set of positional relationships (di '' and say '') which it is transformed with respect to the set of relations of position (di) of the selected elements of the first ordered set, in accordance with the parameter or parameters.