AT399331T

Method and apparatus for embedded built-in self-test (bist) of electronic circuits and systems

Abstract

This record has no abstract on file.

Term

No projected expiry on record.

  1. Priority
  2. Filed
  3. Granted
  4. Today

16 members in 9 offices

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Priority claims
DocumentOfficeKindDate
33658601United States of AmericaP
14255602United States of AmericaA

Members16

Family members, oldest first
DocumentOfficeKind
US2003106004A1United States of AmericaA1
CA2468860A1CanadaA1
WO03048794A1World Intellectual Property Organization (WIPO)A1
AU2002352644A1AustraliaA1
TW200301420ATaiwan Province of ChinaA
EP1451599A1European Patent Office (EPO)A1
TWI230329BTaiwan Province of ChinaB
HK1069207A1Hong Kong, ChinaA1
EP1451599A4European Patent Office (EPO)A4
US2005210352A1United States of AmericaA1
US6957371B2United States of AmericaB2
EP1451599B1European Patent Office (EPO)B1
AT399331TThis recordAustriaT
DE60227279D1GermanyD1
US7467342B2United States of AmericaB2
CA2468860CCanadaC