AT397201T
Double pass etalon spectrometer
Abstract
This record has no abstract on file.
Term
No projected expiry on record.
- Priority
- Filed
- Granted
- Today
44 members in 9 offices
Priority claims1
| Document | Office | Kind | Date |
|---|---|---|---|
| 24513499 | United States of America | A |
Members44
| Document | Office | Kind | |
|---|---|---|---|
| US6061129A | United States of America | A | |
| EP1026487A2 | European Patent Office (EPO) | A2 | |
| KR20000057929A | Republic of Korea | A | |
| JP2000283847A | Japan | A | |
| EP1026487A3 | European Patent Office (EPO) | A3 | |
| US6243170B1 | United States of America | B1 | |
| US2001013933A1 | United States of America | A1 | |
| WO0163230A1 | World Intellectual Property Organization (WIPO) | A1 | |
| AU3499001A | Australia | A | |
| TW459125B | Taiwan Province of China | B | |
| US6320663B1 | United States of America | B1 | |
| JP2001349781A | Japan | A | |
| US6359693B2 | United States of America | B2 | |
| US2002101588A1 | United States of America | A1 | |
| US2002101589A1 | United States of America | A1 | |
| WO02061388A2 | World Intellectual Property Organization (WIPO) | A2 | |
| AU2002245334A1 | Australia | A1 | |
| US2002121608A1 | United States of America | A1 | |
| US2002122176A1 | United States of America | A1 | |
| KR100356108B1 | Republic of Korea | B1 | |
| US6480275B2 | United States of America | B2 | |
| WO02061388A3 | World Intellectual Property Organization (WIPO) | A3 | |
| WO03016841A1 | World Intellectual Property Organization (WIPO) | A1 | |
| US6538737B2 | United States of America | B2 | |
| US6603549B2 | United States of America | B2 | |
| WO03078940A2 | World Intellectual Property Organization (WIPO) | A2 | |
| AU2003225528A1 | Australia | A1 | |
| AU2003225528A8 | Australia | A8 | |
| WO03078940A3 | World Intellectual Property Organization (WIPO) | A3 | |
| US6713770B2 | United States of America | B2 | |
| EP1417462A1 | European Patent Office (EPO) | A1 | |
| JP2004518954A | Japan | A | |
| EP1485686A2 | European Patent Office (EPO) | A2 | |
| JP2005500527A | Japan | A | |
| JP3624783B2 | Japan | B2 | |
| JP2005521038A | Japan | A | |
| JP2006138874A | Japan | A | |
| JP3916876B2 | Japan | B2 | |
| JP4012504B2 | Japan | B2 | |
| EP1026487B1 | European Patent Office (EPO) | B1 | |
| AT397201TThis record | Austria | T | |
| DE60038994D1 | Germany | D1 | |
| EP1485686A4 | European Patent Office (EPO) | A4 | |
| EP1417462A4 | European Patent Office (EPO) | A4 |
1 legal event, as the office reported them to INPADOC
Events
| Event | Code | |
|---|---|---|
| Ceased as to paragraph 5 lit. 3 law introducing patent treatiesCeasedRER | RER |
Numbers
- Application
- 101694
Titles2
- German
- ETALON SPEKTROMETER MIT DOPPELTEM STRAHLDURCHGANG
- English
- ETALON SPECTROMETER WITH DOUBLE RADIATION
Classification
- CPC, 7
- G01J3/26
- G01J3/02
- G01J3/0205
- G01J3/021
- G01J3/0224
- G01J3/0229
- G01J3/027
- IPC, 7
- G01B9 02
- G01J1 00
- G01J3 00
- G01J3 02
- G01J3 12
- G01J3 26
- G01J3 28