Noise reduction technique for transistors and small devices utilizing an episodic agitation

The invention provides multiple for reducing a non-volatile storage's the internal noise measuring method, and other method by a digression driver (e.g., a time variation voltage) exert terminals one or multiple terminals of unit as the reading process part to reduce the noise. Aspects of the invention is connected with a non-volatile memory and device. According to the invention's surface, and exerted unit as the process of the normal voltage level part, further - exerting a time variation voltage on the unit. A group implements the is a t-shaped or more groups of alternating voltage of the single units flow of the reading process signal integrated or time during integrated time to the floating grid storage unit one or multiple terminals and. The other embodiments, and other renewable outsides or a data port; the driving of complex, wherein the average influence (of the time to the integrated time) and a to enable wherein with a reducing noise effect of constantly.