Semiconductor device, card, methods of initializing, checking the authenticity and the identity thereof
Abstract
Semiconductor device of this invention (11) comprises a circuit of the deactivated cover structure. Provided with a passivated structure local region; and first impedance first protective element (12). Optimized, comprising a protective element (12), methods impedance are different. Semiconductor device (11) further - comprising is used for measuring the first with leads of the measuring device (4) and a first storage element (7A) is the leads value of the first reference value both the first storage element (7A) memory (7). A initialize semiconductor device of this invention claims a method for (11), and a method of leads and first reference value storage. The first reference value a wherein authenticity by leads value of the comparison said multiple once.
Term
No projected expiry on record.
- Priority
- Filed
- Granted
- Today
16 members in 9 offices
Priority claims1
| Document | Office | Kind | Date |
|---|---|---|---|
| 01204589 | European Patent Office (EPO) | A |
Members16
| Document | Office | Kind | |
|---|---|---|---|
| WO03046802A2 | World Intellectual Property Organization (WIPO) | A2 | |
| AU2002365497A1 | Australia | A1 | |
| AU2002365497A8 | Australia | A8 | |
| WO03046802A3 | World Intellectual Property Organization (WIPO) | A3 | |
| KR20040060994A | Republic of Korea | A | |
| EP1451759A2 | European Patent Office (EPO) | A2 | |
| US2005021993A1 | United States of America | A1 | |
| CN1596470A | China | A | |
| JP2005510863A | Japan | A | |
| US7309907B2 | United States of America | B2 | |
| EP1451759B1 | European Patent Office (EPO) | B1 | |
| AT384304TThis record | Austria | T | |
| DE60224710D1 | Germany | D1 | |
| CN100382307C | China | C | |
| DE60224710T2 | Germany | T2 | |
| JP4511182B2 | Japan | B2 |
1 legal event, as the office reported them to INPADOC
Events
| Event | Code | |
|---|---|---|
| Ceased as to paragraph 5 lit. 3 law introducing patent treatiesCeasedRER | RER |
Numbers
- Application
- 2803892
Titles2
- German
- HALBLEITERBAUELEMENT, KARTE, VERFAHREN ZUR INITIALISIERUNG UND ZUR PRÜFUNG IHRER AUTHENTIZITÄT UND IHRER IDENTITÄT
- English
- SEMICONDUCTOR ELEMENT, CARD, METHOD FOR INITIALIZING AND VERIFYING YOUR AUTHENTICITY AND ITS IDENTITY
Classification
- CPC, 5
- H01L23/576
- G06K19/073
- G06K19/07372
- H01L2924/0002
- H01L2924/3011
- IPC, 9
- G06K19 073
- G06K19 10
- G06K7 08
- H01L21 3205
- H01L21 822
- H01L23 52
- H01L23 58
- H01L23 64
- H01L27 04