AT384304T

Semiconductor device, card, methods of initializing, checking the authenticity and the identity thereof

Abstract

Semiconductor device of this invention (11) comprises a circuit of the deactivated cover structure. Provided with a passivated structure local region; and first impedance first protective element (12). Optimized, comprising a protective element (12), methods impedance are different. Semiconductor device (11) further - comprising is used for measuring the first with leads of the measuring device (4) and a first storage element (7A) is the leads value of the first reference value both the first storage element (7A) memory (7). A initialize semiconductor device of this invention claims a method for (11), and a method of leads and first reference value storage. The first reference value a wherein authenticity by leads value of the comparison said multiple once.

Term

No projected expiry on record.

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16 members in 9 offices

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Priority claims
DocumentOfficeKindDate
01204589European Patent Office (EPO)A

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DocumentOfficeKind
WO03046802A2World Intellectual Property Organization (WIPO)A2
AU2002365497A1AustraliaA1
AU2002365497A8AustraliaA8
WO03046802A3World Intellectual Property Organization (WIPO)A3
KR20040060994ARepublic of KoreaA
EP1451759A2European Patent Office (EPO)A2
US2005021993A1United States of AmericaA1
CN1596470AChinaA
JP2005510863AJapanA
US7309907B2United States of AmericaB2
EP1451759B1European Patent Office (EPO)B1
AT384304TThis recordAustriaT
DE60224710D1GermanyD1
CN100382307CChinaC
DE60224710T2GermanyT2
JP4511182B2JapanB2