Electronic circuit and method for testing
Abstract
A device capable for chip of the normal operation modes and detecting method and modes. Function circuit and testing chart converter is the electronic connected with the input contacts and an contacts of the integrated - circuit and a redefine. A test mode, test chart converter driving the output contacts are is welded by the contacts with the circuit is driving the can be redefine. The chart converter is arranged provided between the input signal contacts and an contacts of first and second relation, and contacts and can redefine is welded with the circuit configuration, further served an input is the input contacts and an contacts. The contacts of the relates chosen is as a to allow with a aid to serve an input to input and output contacts of redefine testing the manent error and connection clamping.
Term
No projected expiry on record.
- Priority
- Filed
- Granted
- Today
16 members in 9 offices
Priority claims1
| Document | Office | Kind | Date |
|---|---|---|---|
| 01203126 | European Patent Office (EPO) | A |
Members16
| Document | Office | Kind | |
|---|---|---|---|
| WO03016922A2 | World Intellectual Property Organization (WIPO) | A2 | |
| US2003051198A1 | United States of America | A1 | |
| WO03016922A3 | World Intellectual Property Organization (WIPO) | A3 | |
| KR20040027889A | Republic of Korea | A | |
| EP1417502A2 | European Patent Office (EPO) | A2 | |
| CN1541336A | China | A | |
| TWI223094B | Taiwan Province of China | B | |
| JP2005500536A | Japan | A | |
| US6883129B2 | United States of America | B2 | |
| EP1417502B1 | European Patent Office (EPO) | B1 | |
| JP3992683B2 | Japan | B2 | |
| AT376189TThis record | Austria | T | |
| DE60223043D1 | Germany | D1 | |
| CN100371727C | China | C | |
| DE60223043T2 | Germany | T2 | |
| KR100906513B1 | Republic of Korea | B1 |
1 legal event, as the office reported them to INPADOC
Events
| Event | Code | |
|---|---|---|
| Ceased as to paragraph 5 lit. 3 law introducing patent treatiesCeasedRER | RER |
Numbers
- Application
- 2749176
Titles2
- German
- ELEKTRONISCHER SCHALTKREIS UND TESTVERFAHREN
- English
- ELECTRONIC CIRCUIT AND TEST METHODS
Classification
- CPC, 4
- G11C29/025
- G01R31/318547
- G11C29/02
- G11C2029/3602
- IPC, 5
- G01R31 28
- G01R31 3185
- G11C29 02
- H01L21 822
- H01L27 04