Nova Patents
AT376189T

Electronic circuit and method for testing

Abstract

A device capable for chip of the normal operation modes and detecting method and modes. Function circuit and testing chart converter is the electronic connected with the input contacts and an contacts of the integrated - circuit and a redefine. A test mode, test chart converter driving the output contacts are is welded by the contacts with the circuit is driving the can be redefine. The chart converter is arranged provided between the input signal contacts and an contacts of first and second relation, and contacts and can redefine is welded with the circuit configuration, further served an input is the input contacts and an contacts. The contacts of the relates chosen is as a to allow with a aid to serve an input to input and output contacts of redefine testing the manent error and connection clamping.

Term

No projected expiry on record.

  1. Priority
  2. Filed
  3. Granted
  4. Today

16 members in 9 offices

This recordMember, by publication datePriority claim

Priority claims1

Priority claims
DocumentOfficeKindDate
01203126European Patent Office (EPO)A

Members16

Family members, oldest first
DocumentOfficeKind
WO03016922A2World Intellectual Property Organization (WIPO)A2
US2003051198A1United States of AmericaA1
WO03016922A3World Intellectual Property Organization (WIPO)A3
KR20040027889ARepublic of KoreaA
EP1417502A2European Patent Office (EPO)A2
CN1541336AChinaA
TWI223094BTaiwan Province of ChinaB
JP2005500536AJapanA
US6883129B2United States of AmericaB2
EP1417502B1European Patent Office (EPO)B1
JP3992683B2JapanB2
AT376189TThis recordAustriaT
DE60223043D1GermanyD1
CN100371727CChinaC
DE60223043T2GermanyT2
KR100906513B1Republic of KoreaB1