AT37105T
Device for testing a large scale integrated microprogramme-controlled electronic component
Abstract
This record has no abstract on file.
Term
No projected expiry on record.
- Priority
- Filed
- Granted
- Today
8 members in 5 offices
Priority claims1
| Document | Office | Kind | Date |
|---|---|---|---|
| 3241412 | Germany | A |
Members8
| Document | Office | Kind | |
|---|---|---|---|
| DE3241412A1 | Germany | A1 | |
| EP0108414A2 | European Patent Office (EPO) | A2 | |
| JPS5999369A | Japan | A | |
| US4607366A | United States of America | A | |
| EP0108414A3 | European Patent Office (EPO) | A3 | |
| EP0108414B1 | European Patent Office (EPO) | B1 | |
| AT37105TThis record | Austria | T | |
| DE3377947D1 | Germany | D1 |
1 legal event, as the office reported them to INPADOC
Events
| Event | Code | |
|---|---|---|
| Ceased due to non-payment of the annual feeCeasedREN | REN |
Numbers
- Application
- 83111099
Titles2
- German
- VORRICHTUNG ZUM TESTEN EINES HOCHINTEGRIERTEN MIKROPROGRAMMGESTEUERTEN ELEKTRONISCHEN BAUTEILES.
- English
- DEVICE FOR TESTING A HIGH-INTEGRATED MICROPROGRAM-CONTROLLED ELECTRONIC COMPONENT.
Classification
- CPC, 2
- G06F11/2236
- G06F11/2268
- IPC, 3
- G01R31 28
- G06F11 22
- G06F11 267